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Results: 1-20 |
Results: 20

Authors: Chakraborty, HS Hansen, DL Hemmers, O Deshmukh, PC Focke, P Sellin, IA Heske, C Lindle, DW Manson, ST
Citation: Hs. Chakraborty et al., Interchannel coupling in the photoionization of the M shell of Kr well above threshold: Experiment and theory - art. no. 042708, PHYS REV A, 6304(4), 2001, pp. 2708

Authors: Franco, N Klepeis, JE Bostedt, C Van Buuren, T Heske, C Pankratov, O Terminello, LJ
Citation: N. Franco et al., Valence band study of the PtSi by synchrotron radiation photoelectron spectroscopy, J ELEC SPEC, 114, 2001, pp. 1191-1196

Authors: Heske, C Groh, U Fuchs, O Umbach, E Franco, N Bostedt, C Terminello, LJ Perera, RCC Hallmeier, KH Preobrajenski, A Szargan, R Zweigart, S Riedl, W Karg, F
Citation: C. Heske et al., X-ray emission spectroscopy of Cu(In,Ga)(S,Se)(2)-based thin film solar cells: Electronic structure, surface oxidation, and buried interfaces, PHYS ST S-A, 187(1), 2001, pp. 13-24

Authors: Gleim, T Heske, C Umbach, E Schumacher, C Faschinger, W Ammon, C Probst, M Steinruck, HP
Citation: T. Gleim et al., Reduction of the ZnSe/GaAs(100) valence band offset by a Te interlayer, APPL PHYS L, 78(13), 2001, pp. 1867-1869

Authors: Arenholz, E Kay, AW Fadley, CS Grush, MM Callcott, TA Ederer, DL Heske, C Hussain, Z
Citation: E. Arenholz et al., Multiatom resonant photoemission observed via secondary processes: Auger decay and x-ray fluorescence, PHYS REV B, 61(11), 2000, pp. 7183-7186

Authors: Chkoda, L Heske, C Sokolowski, M Umbach, E Steuber, F Staudigel, J Stossel, M Simmerer, J
Citation: L. Chkoda et al., Work function of ITO substrates and band-offsets at the TPD/ITO interface determined by photoelectron spectroscopy, SYNTH METAL, 111, 2000, pp. 315-319

Authors: Kakar, S Nelson, AJ Treusch, R Heske, C van Buuren, T Jimenez, I Pagoria, P Terminello, LJ
Citation: S. Kakar et al., Electronic structure of the energetic material 1,3,5-triamino-2,4,6-trinitrobenzene, PHYS REV B, 62(23), 2000, pp. 15666-15672

Authors: Heske, C Eich, D Fink, R Umbach, E van Buuren, T Bostedt, C Kakar, S Terminello, LJ Grush, MM Callcott, TA Himpsel, FJ Ederer, DL Perera, RCC Riedl, W Karg, F
Citation: C. Heske et al., Semi-quantitative and non-destructive analysis of impurities at a buried interface: Na and the CdS/Cu(In,Ga)Se-2 heterojunction, SURF INT AN, 30(1), 2000, pp. 459-463

Authors: Eich, D Herber, U Groh, U Stahl, U Heske, C Marsi, M Kiskinova, M Riedl, W Fink, R Umbach, E
Citation: D. Eich et al., Lateral inhomogeneities of Cu(In,Ga)Se-2 absorber films, THIN SOL FI, 361, 2000, pp. 258-262

Authors: Heske, C Eich, D Groh, U Fink, R Umbach, E van Buuren, T Bostedt, C Franco, N Terminello, LJ Grush, MM Callcott, TA Himpsel, FJ Ederer, DL Perera, RCC Riedl, W Karg, F
Citation: C. Heske et al., Self-limitation of Na content at the CdS/Cu(In,Ga)Se-2 solar cell heterojunction, THIN SOL FI, 361, 2000, pp. 360-363

Authors: Stichler, M Keller, C Heske, C Staufer, M Birkenheuer, U Rosch, N Wurth, W Menzel, D
Citation: M. Stichler et al., X-ray emission spectroscopy of NO adsorbates on Ru(001), SURF SCI, 448(2-3), 2000, pp. 164-178

Authors: Chkoda, L Heske, C Sokolowski, M Umbach, E
Citation: L. Chkoda et al., Improved band alignment for hole injection by an interfacial layer in organic light emitting devices, APPL PHYS L, 77(8), 2000, pp. 1093-1095

Authors: Muramatsu, Y Tani, Y Aoi, Y Kamijo, E Kaneyoshi, T Motoyama, M Delaunay, JJ Hayashi, T Grush, MM Callcott, TA Ederer, DL Heske, C Underwood, JH Perera, RCC
Citation: Y. Muramatsu et al., High-resolution soft X-ray emission spectra of crystalline carbon nitride films deposited by electron cyclotron resonance sputtering, JPN J A P 1, 38(9A), 1999, pp. 5143-5147

Authors: Hansen, DL Hemmers, O Wang, H Lindle, DW Focke, P Sellin, IA Heske, C Chakraborty, HS Deshmukh, PC Manson, ST
Citation: Dl. Hansen et al., Validity of the independent-particle approximation in x-ray photoemission:The exception, not the rule, PHYS REV A, 60(4), 1999, pp. R2641-R2644

Authors: Heske, C Treusch, R Himpsel, FJ Kakar, S Terminello, LJ Weyer, HJ Shirley, EL
Citation: C. Heske et al., Band widening in graphite, PHYS REV B, 59(7), 1999, pp. 4680-4684

Authors: Treusch, R Himpsel, FJ Kakar, S Terminello, LJ Heske, C van Buuren, T Dinh, VV Lee, HW Pakbaz, K Fox, G Jimenez, I
Citation: R. Treusch et al., X-ray photoemission and photoabsorption of organic electroluminescent materials, J APPL PHYS, 86(1), 1999, pp. 88-93

Authors: Fohlisch, A Hasselstrom, J Karis, O Vaterlein, P Martensson, N Nilsson, A Heske, C Stichler, M Keller, C Wurth, W Menzel, D
Citation: A. Fohlisch et al., Franck-Condon breakdown in core-level photoelectron spectroscopy of chemisorbed CO, CHEM P LETT, 315(3-4), 1999, pp. 194-200

Authors: Heske, C Eich, D Fink, R Umbach, E Kakar, S van Buuren, T Bostedt, C Terminello, LJ Grush, MM Callcott, TA Himpsel, FJ Ederer, DL Perera, RCC Riedl, W Karg, F
Citation: C. Heske et al., Localization of Na impurities at the buried CdS/Cu(In, Ga)Se-2 heterojunction, APPL PHYS L, 75(14), 1999, pp. 2082-2084

Authors: Heske, C Eich, D Fink, R Umbach, E van Buuren, T Bostedt, C Terminello, LJ Kakar, S Grush, MM Callcott, TA Himpsel, FJ Ederer, DL Perera, RCC Riedl, W Karg, F
Citation: C. Heske et al., Observation of intermixing at the buried CdS/Cu(In,Ga)Se-2 thin film solarcell heterojunction, APPL PHYS L, 74(10), 1999, pp. 1451-1453

Authors: Ade, H Winesett, DA Smith, AP Anders, S Stammler, T Heske, C Slep, D Rafailovich, MH Sokolov, J Stohr, J
Citation: H. Ade et al., Bulk and surface characterization of a dewetting thin film polymer bilayer, APPL PHYS L, 73(25), 1998, pp. 3775-3777
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