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Results: 1-17 |
Results: 17
Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data
Authors: Hingerl, K Balderas-Navarro, RE Bonanni, A Stifter, D
Citation: K. Hingerl et al., Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data, J VAC SCI B, 19(4), 2001, pp. 1650-1657
On the origin of resonance features in reflectance difference data of silicon
Authors: Hingerl, K Balderas-Navarro, RE Bonanni, A Tichopadek, P Schmidt, WG
Citation: K. Hingerl et al., On the origin of resonance features in reflectance difference data of silicon, APPL SURF S, 175, 2001, pp. 769-776
In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy
Authors: Balderas-Navarro, RE Hingerl, K Bonanni, A Sitter, H Stifter, D
Citation: Re. Balderas-navarro et al., In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy, APPL PHYS L, 78(23), 2001, pp. 3615-3617
In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy
Authors: Balderas-Navarro, RE Hingerl, K Hilber, W Stifter, D Bonanni, A Sitter, H
Citation: Re. Balderas-navarro et al., In situ reflectance-difference spectroscopy of doped CdTe and ZnTe grown by molecular beam epitaxy, J VAC SCI B, 18(4), 2000, pp. 2224-2228
Surface-stress-induced optical bulk anisotropy
Authors: Hingerl, K Balderas-Navarro, RE Hilber, W Bonanni, A Stifter, D
Citation: K. Hingerl et al., Surface-stress-induced optical bulk anisotropy, PHYS REV B, 62(19), 2000, pp. 13048-13052
In situ reflectance difference spectroscopy of p-type ZnTe : N grown by MBE
Authors: Stifter, D Bonanni, A Garcia-Rocha, M Schmid, M Hingerl, K Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy of p-type ZnTe : N grown by MBE, THIN SOL FI, 373(1-2), 2000, pp. 41-45
Reflectance difference spectroscopy: a powerful tool for in situ investigations of II-VI compounds with Mn
Authors: Bonanni, A Hingerl, K Sitter, H Stifter, D
Citation: A. Bonanni et al., Reflectance difference spectroscopy: a powerful tool for in situ investigations of II-VI compounds with Mn, THIN SOL FI, 367(1-2), 2000, pp. 216-219
In situ reflectance difference spectroscopy of intra-Mn transitions in highly N-doped II-VI diluted magnetic semiconductors
Authors: Bonanni, A Hingerl, K Hilber, W Stifter, D Sitter, H
Citation: A. Bonanni et al., In situ reflectance difference spectroscopy of intra-Mn transitions in highly N-doped II-VI diluted magnetic semiconductors, J CRYST GR, 214, 2000, pp. 163-166
Reflectance anisotropy spectroscopy of oriented films of semiconducting polymers
Authors: Miller, EK Hingerl, K Brabec, CJ Heeger, AJ Sariciftci, NS
Citation: Ek. Miller et al., Reflectance anisotropy spectroscopy of oriented films of semiconducting polymers, J CHEM PHYS, 113(2), 2000, pp. 789-792
In situ reflectance difference spectroscopy of II-VI compounds: A real time study of N plasma doping during molecular beam epitaxy
Authors: Stifter, D Schmid, M Hingerl, K Bonanni, A Garcia-Rocha, M Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy of II-VI compounds: A real time study of N plasma doping during molecular beam epitaxy, J VAC SCI B, 17(4), 1999, pp. 1697-1701
Reflectance difference spectroscopy and magneto-optical analysis of digital magnetic heterostructures
Authors: Bonanni, A Prechtl, G Heiss, W Schinagl, F Holl, S Krenn, H Sitter, H Stifter, D Hingerl, K
Citation: A. Bonanni et al., Reflectance difference spectroscopy and magneto-optical analysis of digital magnetic heterostructures, J VAC SCI B, 17(4), 1999, pp. 1722-1727
Reflectance difference spectroscopy of Mn intra-ion transitions in p-dopeddiluted magnetic semiconductors
Authors: Bonanni, A Hingerl, K Sitter, H Stifter, D
Citation: A. Bonanni et al., Reflectance difference spectroscopy of Mn intra-ion transitions in p-dopeddiluted magnetic semiconductors, PHYS ST S-B, 215(1), 1999, pp. 47-52
In situ observation of strain-induced optical anisotropy of ZnSxSe1-x/GaAs(110) during molecular-beam epitaxy
Authors: Hanada, T Yasuda, T Ohtake, A Hingerl, K Miwa, S Arai, K Yao, T
Citation: T. Hanada et al., In situ observation of strain-induced optical anisotropy of ZnSxSe1-x/GaAs(110) during molecular-beam epitaxy, PHYS REV B, 60(12), 1999, pp. 8909-8914
In situ reflectance difference spectroscopy: nitrogen-plasma doping of MBEgrown ZnTe layers
Authors: Stifter, D Bonanni, A Garcia-Rocha, M Schmid, M Hingerl, K Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy: nitrogen-plasma doping of MBEgrown ZnTe layers, J CRYST GR, 202, 1999, pp. 132-136
In situ characterization of the growth dynamics in molecular beam epitaxy (MBE) of Mn-based II-VI compounds: self-organized Mn structures on CdTe
Authors: Bonanni, A Stifter, D Hingerl, K Seyringer, H Sitter, H
Citation: A. Bonanni et al., In situ characterization of the growth dynamics in molecular beam epitaxy (MBE) of Mn-based II-VI compounds: self-organized Mn structures on CdTe, J CRYST GR, 202, 1999, pp. 707-710
Control of morphology changes in self-assembled Mn-based nanostructures overgrown with mismatched material
Authors: Bonanni, A Seyringer, H Sitter, H Stifter, D Hingerl, K
Citation: A. Bonanni et al., Control of morphology changes in self-assembled Mn-based nanostructures overgrown with mismatched material, APPL PHYS L, 74(24), 1999, pp. 3732-3734
In situ reflectance difference spectroscopy of N-plasma doped ZnTe grown by molecular beam epitaxy
Authors: Stifter, D Schmid, M Hingerl, K Bonanni, A Garcia-Rocha, M Sitter, H
Citation: D. Stifter et al., In situ reflectance difference spectroscopy of N-plasma doped ZnTe grown by molecular beam epitaxy, APPL PHYS L, 73(26), 1998, pp. 3857-3859
Risultati: 1-17 |