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Authors:
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Authors:
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Authors:
Weimann, T
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Authors:
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Authors:
Scherer, H
Weimann, T
Hinze, P
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Zorin, AB
Niemeyer, J
Citation: H. Scherer et al., Characterization of all-chromium tunnel junctions and single-electron tunneling devices fabricated by direct-writing multilayer technique, J APPL PHYS, 86(12), 1999, pp. 6956-6964