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Results: 1-25 | 26-37
Results: 1-25/37
Vertical and lateral ordering in self-organized quantum dot superlattices
Authors: Springholz, G Pinczolits, M Holy, V Zerlauth, S Vavra, I Bauer, G
Citation: G. Springholz et al., Vertical and lateral ordering in self-organized quantum dot superlattices, PHYSICA E, 9(1), 2001, pp. 149-163
TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature
Authors: Kang, HH Salamanca-Riba, L Pinczolits, M Springholz, G Holy, V Bauer, G
Citation: Hh. Kang et al., TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature, MAT SCI E B, 80(1-3), 2001, pp. 104-107
Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers - X-ray comparative study
Authors: Anopchenko, A Jergel, M Majkova, E Luby, S Holy, V Aschentrup, A Kolina, I Lim, YC Haindl, G Kleineberg, U Heinzmann, U
Citation: A. Anopchenko et al., Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers - X-ray comparative study, PHYSICA B, 305(1), 2001, pp. 14-20
Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle X-ray scattering
Authors: Roch, T Holy, V Stangl, J Hoflinger, E Daniel, A Bauer, G Kegel, I Metzger, H Zhu, J Brunner, K Abstreiter, G
Citation: T. Roch et al., Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle X-ray scattering, PHYS ST S-B, 224(1), 2001, pp. 241-245
C-N/MeN nanocomposite coatings, deposition and testing of performance
Authors: Sobota, J Sorensen, G Jensen, H Bochnicek, Z Holy, V
Citation: J. Sobota et al., C-N/MeN nanocomposite coatings, deposition and testing of performance, SURF COAT, 142, 2001, pp. 590-595
Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires - art. no. 205318
Authors: Holy, V Roch, T Stangl, J Daniel, A Bauer, G Metzger, TH Zhu, YH Brunner, K Abstreiter, G
Citation: V. Holy et al., Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires - art. no. 205318, PHYS REV B, 6320(20), 2001, pp. 5318
X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films - art. no. 155310
Authors: Li, JH Kulik, J Holy, V Zhong, Z Moss, SC Zhang, Y Ahrenkiel, SP Mascarenhas, A Bai, JM
Citation: Jh. Li et al., X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films - art. no. 155310, PHYS REV B, 6315(15), 2001, pp. 5310
High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices
Authors: Holy, V Stangl, J Springholz, G Pinczolits, M Bauer, G
Citation: V. Holy et al., High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices, J PHYS D, 34(10A), 2001, pp. A1-A5
X-ray studies on self-organized wires in SiGe/Si multilayers
Authors: Roch, T Holy, V Daniel, A Hofflinger, E Meduna, M Metzger, TH Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: T. Roch et al., X-ray studies on self-organized wires in SiGe/Si multilayers, J PHYS D, 34(10A), 2001, pp. A6-A10
X-ray reflectivity from self-assembled structures in Ge/Si superlattices
Authors: Meduna, M Holy, V Roch, T Bauer, G Schmidt, OG Eberl, K
Citation: M. Meduna et al., X-ray reflectivity from self-assembled structures in Ge/Si superlattices, J PHYS D, 34(10A), 2001, pp. A193-A196
GID study of strains in Si due to patterned SiO2
Authors: Daniel, A Holy, V Zhuang, Y Roch, T Grenzer, J Bochnicek, Z Bauer, G
Citation: A. Daniel et al., GID study of strains in Si due to patterned SiO2, J PHYS D, 34(10A), 2001, pp. A197-A202
X-ray study of antiphase boundaries in the quadruple-period ordered GaAs0.87Sb0.13 alloy
Authors: Zhong, ZY Holy, V Li, JH Kulik, J Bai, J Golding, TD Moss, SC
Citation: Zy. Zhong et al., X-ray study of antiphase boundaries in the quadruple-period ordered GaAs0.87Sb0.13 alloy, J APPL PHYS, 90(2), 2001, pp. 644-649
X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy
Authors: Meduna, M Holy, V Roch, T Stangl, J Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: M. Meduna et al., X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy, J APPL PHYS, 89(9), 2001, pp. 4836-4842
Strain and composition distribution in uncapped SiGe islands from x-ray diffraction
Authors: Stangl, J Daniel, A Holy, V Roch, T Bauer, G Kegel, I Metzger, TH Wiebach, T Schmidt, OG Eberl, K
Citation: J. Stangl et al., Strain and composition distribution in uncapped SiGe islands from x-ray diffraction, APPL PHYS L, 79(10), 2001, pp. 1474-1476
X-ray analysis of spontaneous lateral modulation in (InAs)(n)/(AlAs)(m) short-period superlattices
Authors: Li, JH Holy, V Zhong, Z Kulik, J Moss, SC Norman, AG Mascarenhas, A Reno, JL Follstaedt, DM
Citation: Jh. Li et al., X-ray analysis of spontaneous lateral modulation in (InAs)(n)/(AlAs)(m) short-period superlattices, APPL PHYS L, 78(2), 2001, pp. 219-221
Strain-induced self-organized growth of nanostructures: From step bunchingto ordering in quantum dot superlattices
Authors: Stangl, J Roch, T Holy, V Pinczolits, M Springholz, G Bauer, G Kegel, I Metzger, TH Zhu, J Brunner, K Abstreiter, G Smilgies, D
Citation: J. Stangl et al., Strain-induced self-organized growth of nanostructures: From step bunchingto ordering in quantum dot superlattices, J VAC SCI B, 18(4), 2000, pp. 2187-2192
ZnSe/CdTe/ZnSe heterostructures
Authors: Rubini, S Bonanni, B Pelucchi, E Franciosi, A Garulli, A Parisini, A Zhuang, Y Bauer, G Holy, V
Citation: S. Rubini et al., ZnSe/CdTe/ZnSe heterostructures, J VAC SCI B, 18(4), 2000, pp. 2263-2270
Temperature stability of C-N/NbN nanocomposite multilayers
Authors: Sobota, J Sorensen, G Jensen, H Kubena, J Holy, V
Citation: J. Sobota et al., Temperature stability of C-N/NbN nanocomposite multilayers, DIAM RELAT, 9(3-6), 2000, pp. 587-591
Lateral and vertical ordering of self-assembled PbSe quantum dots studied by high-resolution X-ray diffraction
Authors: Holy, V Stangl, J Springholz, G Pinczolits, M Bauer, G Kegel, I Metzger, TH
Citation: V. Holy et al., Lateral and vertical ordering of self-assembled PbSe quantum dots studied by high-resolution X-ray diffraction, PHYSICA B, 283(1-3), 2000, pp. 65-68
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
Authors: Zhuang, Y Pietsch, U Stangl, J Holy, V Darowski, N Grenzer, J Zerlauth, S Schaffler, F Bauer, G
Citation: Y. Zhuang et al., In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction, PHYSICA B, 283(1-3), 2000, pp. 130-134
Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice
Authors: Stangl, J Holy, V Roch, T Daniel, A Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: J. Stangl et al., Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice, PHYS REV B, 62(11), 2000, pp. 7229-7236
Structure of Ag/Co multilayers on excimer laser irradiation
Authors: Jergel, M Anopchenko, A Majkova, E Spasova, M Luby, S Holy, V Brunel, M Luches, A Martino, M
Citation: M. Jergel et al., Structure of Ag/Co multilayers on excimer laser irradiation, THIN SOL FI, 373(1-2), 2000, pp. 216-221
Self-organized growth of three-dimensional IV-VI semiconductor quantum dotcrystals with fcc-like vertical stacking and tunable lattice constant
Authors: Springholz, G Pinczolits, M Holy, V Mayer, P Wiesauer, K Roch, T Bauer, G
Citation: G. Springholz et al., Self-organized growth of three-dimensional IV-VI semiconductor quantum dotcrystals with fcc-like vertical stacking and tunable lattice constant, SURF SCI, 454, 2000, pp. 657-670
Tuning of vertical and lateral correlations in self-organized PbSe/Pb1-xEuxTe quantum dot superlattices
Authors: Springholz, G Pinczolits, M Mayer, P Holy, V Bauer, G Kang, HH Salamanca-Riba, L
Citation: G. Springholz et al., Tuning of vertical and lateral correlations in self-organized PbSe/Pb1-xEuxTe quantum dot superlattices, PHYS REV L, 84(20), 2000, pp. 4669-4672
Interface study of a Co/Si/W/Si multilayer with enhanced thermal stability
Authors: Jergel, M Anopchenko, A Holy, V Majkova, E Luby, S Senderak, R
Citation: M. Jergel et al., Interface study of a Co/Si/W/Si multilayer with enhanced thermal stability, J APPL CRYS, 33(1), 2000, pp. 753-757
Risultati: 1-25 | 26-37