ACNP - Italian Periodicals Catalogue

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Results: 1-18 |

Results: 18

DEPENDENCE OF READ WRITE OPERATIONS ON UNIAXIAL ANISOTROPY CONSTANT IN BLOCH LINE MEMORIES/

Authors: FUJIMOTO K MARUYAMA Y IMURA R

Citation: K. Fujimoto et al., DEPENDENCE OF READ WRITE OPERATIONS ON UNIAXIAL ANISOTROPY CONSTANT IN BLOCH LINE MEMORIES/, IEEE transactions on magnetics, 33(6), 1997, pp. 4469-4474

THERMAL SIMULATION ANALYSIS OF SCANNING NEAR-FIELD OPTICAL MICROSCOPEPOINT HEATING MECHANISMS

Authors: MIYAMOTO M SHINTANI T HOSAKA S IMURA R

Citation: M. Miyamoto et al., THERMAL SIMULATION ANALYSIS OF SCANNING NEAR-FIELD OPTICAL MICROSCOPEPOINT HEATING MECHANISMS, JPN J A P 2, 35(5A), 1996, pp. 584-586

NANOSCALE MODIFICATION OF PHASE-CHANGE MATERIALS WITH NEAR-FIELD LIGHT

Authors: IMURA R SHINTANI T NAKAMURA K HOSAKA S

Citation: R. Imura et al., NANOSCALE MODIFICATION OF PHASE-CHANGE MATERIALS WITH NEAR-FIELD LIGHT, Microelectronic engineering, 30(1-4), 1996, pp. 387-390

VACUUM COMPATIBLE HIGH-SENSITIVE KELVIN PROBE FORCE MICROSCOPY

Authors: KIKUKAWA A HOSAKA S IMURA R

Citation: A. Kikukawa et al., VACUUM COMPATIBLE HIGH-SENSITIVE KELVIN PROBE FORCE MICROSCOPY, Review of scientific instruments, 67(4), 1996, pp. 1463-1467

MAGNETIC AND ELECTRICAL-PROPERTIES OF SINGLE-PHASE, SINGLE-CRYSTAL FE16N2 FILMS EPITAXIALLLY GROWN BY MOLECULAR-BEAM EPITAXY

Authors: SUGITA Y TAKAHASHI H KOMURO M IGARASHI M IMURA R KAMBE T

Citation: Y. Sugita et al., MAGNETIC AND ELECTRICAL-PROPERTIES OF SINGLE-PHASE, SINGLE-CRYSTAL FE16N2 FILMS EPITAXIALLLY GROWN BY MOLECULAR-BEAM EPITAXY, Journal of applied physics, 79(8), 1996, pp. 5576-5581

DEPTH AND STATE ANALYSES OF DEUTERIUM AND HELIUM IN D-2-ANNEALED HE-IMPLANTED YTTRIUM-IRON-GARNET()

Authors: FURUYA K MATSUSHITA K ARATANI M YANOKURA M IMURA R UEMATSU K

Citation: K. Furuya et al., DEPTH AND STATE ANALYSES OF DEUTERIUM AND HELIUM IN D-2-ANNEALED HE-IMPLANTED YTTRIUM-IRON-GARNET(), JPN J A P 1, 34(11), 1995, pp. 6260-6267

FABRICATION OF NANOMETER-SCALE STRUCTURES ON INSULATORS AND IN MAGNETIC-MATERIALS USING A SCANNING PROBE MICROSCOPE

Authors: HOSAKA S KOYANAGI H KIKUKAWA A MIYAMOTO M IMURA R USHIYAMA J

Citation: S. Hosaka et al., FABRICATION OF NANOMETER-SCALE STRUCTURES ON INSULATORS AND IN MAGNETIC-MATERIALS USING A SCANNING PROBE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1307-1311

PHASE-CHANGE WRITING IN A GESBTE FILM WITH SCANNING NEAR-FIELD OPTICAL MICROSCOPE

Authors: SHINTANI T NAKAMURA K HOSAKA S HIROTSUNE A TERAO M IMURA R FUJITA K YOSHIDA M KAMMER S

Citation: T. Shintani et al., PHASE-CHANGE WRITING IN A GESBTE FILM WITH SCANNING NEAR-FIELD OPTICAL MICROSCOPE, Ultramicroscopy, 61(1-4), 1995, pp. 285-289

DEMONSTRATION OF NANOMETER RECORDING WITH A SCANNING PROBE MICROSCOPE

Authors: IMURA R KOYANAGI H MIYAMOTO M KIKUKAWA A SHINTANI T HOSAKA S

Citation: R. Imura et al., DEMONSTRATION OF NANOMETER RECORDING WITH A SCANNING PROBE MICROSCOPE, Microelectronic engineering, 27(1-4), 1995, pp. 105-108

PHASE-LOCKED NONCONTACT SCANNING FORCE MICROSCOPE

Authors: KIKUKAWA A HOSAKA S HONDA Y IMURA R

Citation: A. Kikukawa et al., PHASE-LOCKED NONCONTACT SCANNING FORCE MICROSCOPE, Review of scientific instruments, 66(1), 1995, pp. 101-105

FIELD EVAPORATION OF GOLD ATOMS ONTO A SILICON DIOXIDE FILM BY USING AN ATOMIC-FORCE MICROSCOPE

Authors: KOYANAGI H HOSAKA S IMURA R SHIRAI M

Citation: H. Koyanagi et al., FIELD EVAPORATION OF GOLD ATOMS ONTO A SILICON DIOXIDE FILM BY USING AN ATOMIC-FORCE MICROSCOPE, Applied physics letters, 67(18), 1995, pp. 2609-2611

DOMAIN OBSERVATIONS OF A DURABILITY TESTED TBFECO MAGNETOOPTICAL DISKUSING MAGNETIC FORCE MICROSCOPY

Authors: KIKUKAWA A AWANO H HOSAKA S HONDA Y IMURA R

Citation: A. Kikukawa et al., DOMAIN OBSERVATIONS OF A DURABILITY TESTED TBFECO MAGNETOOPTICAL DISKUSING MAGNETIC FORCE MICROSCOPY, Applied physics letters, 67(10), 1995, pp. 1480-1482

SILICON PN JUNCTION IMAGING AND CHARACTERIZATIONS USING SENSITIVITY ENHANCED KELVIN PROBE FORCE MICROSCOPY

Authors: KIKUKAWA A HOSAKA S IMURA R

Citation: A. Kikukawa et al., SILICON PN JUNCTION IMAGING AND CHARACTERIZATIONS USING SENSITIVITY ENHANCED KELVIN PROBE FORCE MICROSCOPY, Applied physics letters, 66(25), 1995, pp. 3510-3512

PHASE-CONTROLLED SCANNING FORCE MICROSCOPE

Authors: KIKUKAWA A HOSAKA S HONDA Y IMURA R

Citation: A. Kikukawa et al., PHASE-CONTROLLED SCANNING FORCE MICROSCOPE, JPN J A P 2, 33(9A), 1994, pp. 120001286-120001288

FORMATION OF NANOMETER-SIZED AU DOTS ON SI SUBSTRATE IN AIR

Authors: HOSAKA S KOYANAGI H KIKUKAWA A MARUYAMA Y IMURA R

Citation: S. Hosaka et al., FORMATION OF NANOMETER-SIZED AU DOTS ON SI SUBSTRATE IN AIR, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1872-1878

INTERPRETATION OF MAGNETIC FORCE MICROSCOPIC IMAGES

Authors: KIKUKAWA A AWANO H HOSAKA S HONDA Y IMURA R

Citation: A. Kikukawa et al., INTERPRETATION OF MAGNETIC FORCE MICROSCOPIC IMAGES, Journal of applied physics, 75(10), 1994, pp. 6893-6893

THERMAL EXTRACTION BEHAVIOR OF HE AND D FROM HE-IMPLANTED YTTRIUM-IRON-GARNET ANNEALED IN D(2)()

Authors: HIROTSUNE A MASUDA K KIKUCHI T FURUYA K UEMATSU K IMURA R

Citation: A. Hirotsune et al., THERMAL EXTRACTION BEHAVIOR OF HE AND D FROM HE-IMPLANTED YTTRIUM-IRON-GARNET ANNEALED IN D(2)(), JPN J A P 1, 32(4), 1993, pp. 1636-1641

STOICHIOMETRY MEASUREMENT AND ELECTRIC CHARACTERISTICS OF THIN-FILM TA2O5 INSULATOR FOR ULTRA-LARGE-SCALE INTEGRATION

Authors: SHIMIZU K KATAYAMA M FUNAKI H ARAI E NAKATA M OHJI Y IMURA R

Citation: K. Shimizu et al., STOICHIOMETRY MEASUREMENT AND ELECTRIC CHARACTERISTICS OF THIN-FILM TA2O5 INSULATOR FOR ULTRA-LARGE-SCALE INTEGRATION, Journal of applied physics, 74(1), 1993, pp. 375-380

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