AAAAAA

   
Results: 1-9 |
Results: 9

Authors: KEHOE L KELLY PV CREAN GM
Citation: L. Kehoe et al., APPLICATION OF THE LASER FLASH DIFFUSIVITY METHOD TO THIN HIGH THERMAL-CONDUCTIVITY MATERIALS, Microsystem technologies, 5(1), 1998, pp. 18-21

Authors: LAFFERTY EJ MACAULEY DJ MONGEY KF KELLY PV CREAN GM
Citation: Ej. Lafferty et al., PHOTO-ASSISTED METALLIZATION - LINE RESOLUTION STUDIES, Surface & coatings technology, 101(1-3), 1998, pp. 80-84

Authors: MACAULEY DJ MONGEY KF KELLY PV CREAN GM
Citation: Dj. Macauley et al., COMPARISON OF PROCESSES FOR SELECTIVE ELECTROLESS COPPER PLATING ON 96-PERCENT ALUMINA PHOTO-SELECTIVELY ACTIVATED USING CHLORINATED AND NONCHLORINATED PHOTOCHEMICAL COATINGS - PHOTOACTIVITY AND RELIABILITY STUDIES, Surface & coatings technology, 101(1-3), 1998, pp. 238-242

Authors: MURTAGH M LYNCH SM KELLY PV HILDEBRANT S HERBERT PAF JEYNES C CREAN GM
Citation: M. Murtagh et al., PHOTOREFLECTANCE CHARACTERIZATION OF AR+ ION ETCHED AND SICL4 REACTIVE ION ETCHED SILICON(100), Materials science and technology, 13(11), 1997, pp. 961-964

Authors: PAUL DJ RYAN JH KELLY PV CREAN GM FERNANDEZ JM PEPPER M BROERS AN JOYCE BA
Citation: Dj. Paul et al., INVESTIGATIONS OF ELECTRON-BEAM AND OPTICAL INDUCED DAMAGE IN HIGH-MOBILITY SIGE HETEROSTRUCTURES, Solid-state electronics, 41(10), 1997, pp. 1509-1513

Authors: FLANNERY CM KELLY PV BEECHINOR JT CREAN GM
Citation: Cm. Flannery et al., OBSERVATION OF WAVELENGTH-DEPENDENT GENERATION EFFICIENCY OF LASER-INDUCED ULTRASONIC SURFACE ACOUSTIC-WAVES ON CERAMIC MATERIALS, Applied physics letters, 71(26), 1997, pp. 3767-3769

Authors: KEHOE L KELLY PV OCONNOR GM OREILLY M CREAN GM
Citation: L. Kehoe et al., A METHODOLOGY FOR LASER-BASED THERMAL-DIFFUSIVITY MEASUREMENT OF ADVANCED MULTICHIP-MODULE CERAMIC MATERIALS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 18(4), 1995, pp. 773-780

Authors: HERBERT PAF MURTAGH M KELLY PV CREAN GM KELLY WM
Citation: Paf. Herbert et al., ONLINE DETECTION AND MONITORING OF PLASMA ETCH DAMAGE TO SEMIINSULATING GAAS, Microelectronic engineering, 21(1-4), 1993, pp. 315-320

Authors: LYNCH S MURTAGH M CREAN GM KELLY PV OCONNOR M JEYNES C
Citation: S. Lynch et al., NONDESTRUCTIVE DEPTH PROFILING OF SILICON ION-IMPLANTATION INDUCED DAMAGE IN SILICON (100) SUBSTRATES, Thin solid films, 233(1-2), 1993, pp. 199-202
Risultati: 1-9 |