Authors:
Kunert, M
Kienzle, O
Baretzky, B
Baker, SP
Mittemeijer, EJ
Citation: M. Kunert et al., Hardness-depth profile of a carbon-implanted Ti-6Al-4V alloy and its relation to composition and microstructure, J MATER RES, 16(8), 2001, pp. 2321-2335
Authors:
Stenkamp, D
Kienzle, O
Orchowski, A
Rau, WD
Weickenmeier, A
Benner, G
Wetzke, M
Waskiewicz, W
Katsap, V
Zhu, X
Liu, H
Munro, E
Rouse, JA
Citation: D. Stenkamp et al., Progress on the realization of the electron column modules for SCALPEL high-throughput/alpha electron projection lithography tools, MICROEL ENG, 57-8, 2001, pp. 137-143
Authors:
Schmidt, OG
Eberl, K
Kienzle, O
Ernst, F
Christiansen, S
Strunk, HP
Citation: Og. Schmidt et al., Reduced critical thickness and photoluminescence line splitting in multiple layers of self-assembled Ge/Si islands, MAT SCI E B, 74(1-3), 2000, pp. 248-252
Citation: G. Mobus et O. Kienzle, Probability calculus for quantitative HREM. Part I: Monte-Carlo and point cloud techniques, ULTRAMICROS, 85(4), 2000, pp. 183-198
Authors:
Eberl, K
Schmidt, OG
Duschl, R
Kienzle, O
Ernst, E
Rau, Y
Citation: K. Eberl et al., Self-assembling SiGe and SiGeC nanostructures for light emitters and tunneling diodes, THIN SOL FI, 369(1-2), 2000, pp. 33-38
Authors:
Stangl, J
Roch, T
Bauer, G
Kegel, I
Metzger, TH
Schmidt, OG
Eberl, K
Kienzle, O
Ernst, F
Citation: J. Stangl et al., Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy, APPL PHYS L, 77(24), 2000, pp. 3953-3955
Authors:
Kienzle, O
Ernst, F
Ruhle, M
Schmidt, OG
Eberl, K
Citation: O. Kienzle et al., Germanium "quantum dots" embedded in silicon: Quantitative study of self-alignment and coarsening, APPL PHYS L, 74(2), 1999, pp. 269-271