AAAAAA

   
Results: 1-19 |
Results: 19

Authors: Kojima, A Koshida, N
Citation: A. Kojima et N. Koshida, Evidence of enlarged drift length in nanocrystalline porous silicon layersby time-of-flight measurements, JPN J A P 1, 40(4B), 2001, pp. 2779-2781

Authors: Sheng, X Kojima, A Komoda, T Koshida, N
Citation: X. Sheng et al., Efficient and ballistic cold electron emission from porous polycrystallinesilicon diodes with a porosity multilayer structure, J VAC SCI B, 19(1), 2001, pp. 64-67

Authors: Kumagai, A Kanegawa, Y Suda, Y Koshida, N
Citation: A. Kumagai et al., Improvement of porous Si luminescence intensity durability by nitrogen ionirradiation using an ECR ion source, J POROUS MA, 7(1-3), 2000, pp. 73-76

Authors: Gelloz, B Bsiesy, A Koshida, N
Citation: B. Gelloz et al., Conduction and luminescent properties of wet porous silicon, J POROUS MA, 7(1-3), 2000, pp. 103-106

Authors: Takahashi, M Toriumi, Y Koshida, N
Citation: M. Takahashi et al., Current-induced optical effect in porous silicon Fabry-Perot resonators, PHYS ST S-A, 182(1), 2000, pp. 567-571

Authors: Ueno, K Koshida, N
Citation: K. Ueno et N. Koshida, Optical accessibility of light-emissive nanosilicon memory, PHYS ST S-A, 182(1), 2000, pp. 579-583

Authors: Gelloz, B Koshida, N
Citation: B. Gelloz et N. Koshida, Electroluminescence with high and stable quantum efficiency and low threshold voltage from anodically oxidized thin porous silicon diode, J APPL PHYS, 88(7), 2000, pp. 4319-4324

Authors: Takahashi, M Toriumi, Y Matsumoto, T Masumoto, Y Koshida, N
Citation: M. Takahashi et al., Significant photoinduced refractive index change observed in porous silicon Fabry-Perot resonators, APPL PHYS L, 76(15), 2000, pp. 1990-1992

Authors: Matsumoto, T Mimura, H Koshida, N Masumoto, Y
Citation: T. Matsumoto et al., Deep-level energy states in nanostructural porous silicon, JPN J A P 1, 38(1B), 1999, pp. 539-541

Authors: Koshida, N Gelloz, B
Citation: N. Koshida et B. Gelloz, Wet and dry porous silicon, CURR OP COL, 4(4), 1999, pp. 309-313

Authors: Komoda, T Sheng, X Koshida, N
Citation: T. Komoda et al., Mechanism of efficient and stable surface-emitting cold cathode based on porous polycrystalline silicon films, J VAC SCI B, 17(3), 1999, pp. 1076-1079

Authors: Koshida, N Sheng, X Komoda, T
Citation: N. Koshida et al., Quasiballistic electron emission from porous silicon diodes, APPL SURF S, 146(1-4), 1999, pp. 371-376

Authors: Matsumoto, T Mimura, H Koshida, N Masumoto, Y
Citation: T. Matsumoto et al., Deep level energy states in porous silicon and porous silicon carbide determined by space-charge-limited current measurements, APPL SURF S, 142(1-4), 1999, pp. 569-573

Authors: Shinoda, H Nakajima, T Ueno, K Koshida, N
Citation: H. Shinoda et al., Thermally induced ultrasonic: emission from porous silicon, NATURE, 400(6747), 1999, pp. 853-855

Authors: Takahashi, M Koshida, N
Citation: M. Takahashi et N. Koshida, Fabrication and characteristics of three-dimensionally buried porous silicon optical waveguides, J APPL PHYS, 86(9), 1999, pp. 5274-5278

Authors: Ueno, K Koshida, N
Citation: K. Ueno et N. Koshida, Light-emissive nonvolatile memory effects in porous silicon diodes, APPL PHYS L, 74(1), 1999, pp. 93-95

Authors: Nakagawa, T Sugiyama, H Koshida, N
Citation: T. Nakagawa et al., Fabrication of periodic Si nanostructure by controlled anodization, JPN J A P 1, 37(12B), 1998, pp. 7186-7189

Authors: Koshida, N Ueno, K Sheng, X
Citation: N. Koshida et al., Field-induced functions of porous Si as a confined system, J LUMINESC, 80(1-4), 1998, pp. 37-42

Authors: Matsumoto, T Qi, JF Masumoto, Y Mimura, H Koshida, N
Citation: T. Matsumoto et al., Determination of localized states in porous silicon, J LUMINESC, 80(1-4), 1998, pp. 203-206
Risultati: 1-19 |