Authors:
Kruger, JK
Baller, J
le Coutre, A
Manglkammer, W
Britz, T
Hartmann, U
Alnot, P
Remy, M
Henkel, M
Citation: Jk. Kruger et al., A versatile method to characterize the mechanical and opticla properties of nano-and micro-structured CVD-diamond : Brillouin microscopy, VIDE, 56(300), 2001, pp. 375
Citation: P. Damman et al., Oriented growth of n-alkanes crystals on nanostructured poly(tetrafluoroethylene) substrates, J CHEM PHYS, 114(18), 2001, pp. 8196-8204
Authors:
Durand, O
Olivier, J
Bisaro, R
Galtier, P
Kruger, JK
Citation: O. Durand et al., X-ray diffraction analysis of the residual stresses in self-supported CVD diamond films, J PHYS IV, 10(P10), 2000, pp. 171-183
Authors:
Ziebert, C
Sternberg, A
Schmitt, H
Ehses, KH
Kruger, JK
Citation: C. Ziebert et al., Processing and properties of nanocrystalline Pb(Sc0.5Ta0.5)O-3, Pb(Sc0.5Nb0.5)O-3 and Pb(Mg1/3Nb2/3)O-3 films produced by RF-sputtering from ceramic targets, INTEGR FERR, 31(1-4), 2000, pp. 183-193
Authors:
Baller, J
Kruger, JK
Birringer, R
Proust, C
Citation: J. Baller et al., Elastic properties of single-crystalline and consolidated nano-structured yttrium oxide at room temperature, J PHYS-COND, 12(25), 2000, pp. 5403-5409
Citation: Jk. Kruger et al., The mono-crystalline state of polyvinylidene fluoride/trifluoroethylene onnano-structured teflon, APPL PHYS A, 70(3), 2000, pp. 297-305
Authors:
Durand, O
Bisaro, R
Brierley, CJ
Galtier, P
Kennedy, GR
Kruger, JK
Olivier, J
Citation: O. Durand et al., Residual stresses in chemical vapor deposition free-standing diamond filmsby X-ray diffraction analyses, MAT SCI E A, 288(2), 2000, pp. 217-222
Authors:
Kruger, JK
Embs, JP
Lukas, S
Hartmann, U
Brierley, CJ
Beck, CM
Jimenez, R
Alnot, P
Durand, O
Citation: Jk. Kruger et al., Spatial and angle distribution of internal stresses in nano- and microstructured chemical vapor deposited diamond as revealed by Brillouin spectroscopy, J APPL PHYS, 87(1), 2000, pp. 74-77
Authors:
Ziebert, C
Schmitt, H
Kruger, JK
Britz, T
Bruch, C
Citation: C. Ziebert et al., Diffuse phase transition and relaxor properties of nanocrystalline lead calcium titanate, FERROELECTR, 240(1-4), 2000, pp. 1637-1644
Citation: Jk. Kruger et al., Existence of an intrinsic glass transition in a silicon rubber: Hypersonicversus calorimetric properties, PHYS REV B, 60(14), 1999, pp. 10037-10041
Authors:
Ziebert, C
Schmitt, H
Birringer, R
Kruger, JK
Mendiola, J
Citation: C. Ziebert et al., Size effects in nanocrystalline Pb0.76Ca0.24TiO3-films produced by RF-sputtering, FERROELECTR, 223(1-4), 1999, pp. 227-234
Authors:
Durand, O
Olivier, J
Bisaro, R
Galtier, P
Kruger, JK
Brierley, CJ
Kennedy, GR
Citation: O. Durand et al., Macroscopic residual stress in chemical-vapor-deposition free-standing diamond films by x-ray diffraction analyses, APPL PHYS L, 75(13), 1999, pp. 1881-1883
Authors:
Ziebert, C
Kruger, JK
Birringer, R
Schmitt, H
Jimenez, B
Citation: C. Ziebert et al., Anomalous elastic and dielectric behavior in nanocrystalline Ca-modified lead titanate (PTC) films, J PHYS IV, 8(P9), 1998, pp. 105-108
Authors:
Kirby, PB
Wright, RV
Gaucher, P
Galtier, P
Kofoed, L
Gullov, JO
Von Munch, W
Eichner, D
Ploss, B
Kruger, JK
Citation: Pb. Kirby et al., Report on Brite-EuRam project sensors and mechatronic devices using ferroelectric thin films SEMDEFT, J PHYS IV, 8(P9), 1998, pp. 161-169