Authors:
Shi, Y
Xie, ZY
Liu, LH
Liu, B
Edgar, JH
Kuball, M
Citation: Y. Shi et al., Influence of buffer layer and 6H-SiC substrate polarity on the nucleation of AIN grown by the sublimation sandwich technique, J CRYST GR, 233(1-2), 2001, pp. 177-186
Authors:
Kuball, M
Hayes, JM
Shi, Y
Edgar, JH
Prins, AD
van Uden, NWA
Dunstan, DJ
Citation: M. Kuball et al., Raman scattering studies on single-crystalline bulk AlN: temperature and pressure dependence of the AlN phonon modes, J CRYST GR, 231(3), 2001, pp. 391-396
Authors:
Kuball, M
Benyoucef, M
Beaumont, B
Gibart, P
Citation: M. Kuball et al., Raman mapping of epitaxial lateral overgrown GaN: Stress at the coalescence boundary, J APPL PHYS, 90(7), 2001, pp. 3656-3658
Authors:
Kuball, M
Hayes, JM
Suski, T
Jun, J
Tan, HH
Williams, JS
Jagadish, C
Citation: M. Kuball et al., The use of micro-Raman spectroscopy to monitor high-pressure high-temperature annealing of ion-implanted GaN films, MRS I J N S, 5, 2000, pp. NIL_635-NIL_640
Authors:
Bell, A
Harrison, I
Korakakis, D
Larkins, EC
Hayes, JM
Kuball, M
Citation: A. Bell et al., A study of annealed GaN grown by molecular beam epitaxy using photoluminescence spectroscopy., MRS I J N S, 5, 2000, pp. NIL_655-NIL_660
Authors:
Kuball, M
Benyoucef, M
Morrissey, FH
Foxon, CT
Citation: M. Kuball et al., Focused ion beam etching of nanometer-size GaN/AlGaN device structures andtheir optical characterization by micro-photoluminescence/Raman mapping, MRS I J N S, 5, 2000, pp. NIL_816-NIL_821
Authors:
Kuball, M
Hayes, JM
Suski, T
Jun, J
Leszczynski, M
Domagala, J
Tan, HH
Williams, JS
Jagadish, C
Citation: M. Kuball et al., High-pressure high-temperature annealing of ion-implanted GaN films monitored by visible and ultraviolet micro-Raman scattering, J APPL PHYS, 87(6), 2000, pp. 2736-2741
Authors:
Kuball, M
Demangeot, F
Frandon, J
Renucci, MA
Batchelder, DN
Briot, O
Citation: M. Kuball et al., Deep ultraviolet Raman scattering for the monitoring of high-temperature processing of AlGaN, PHYS ST S-B, 215(1), 1999, pp. 105-108