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SOYAMA N
KAGEYAMA K
OGI K
SCOTT MC
CUCHIARO JD
MCMILLAN LD
DEARAUJO CAP
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Authors:
UCHIDA H
SOYAMA N
KAGEYAMA K
OGI K
SCOTT MC
CUCHIARO JD
DERBENWICK GF
MCMILLAN LD
DEARAUJO CAP
Citation: H. Uchida et al., CHARACTERIZATION OF SELF-PATTERNED SRBI2TA2O9 THIN-FILMS FROM PHOTO-SENSITIVE SOLUTIONS, Integrated ferroelectrics, 16(1-4), 1997, pp. 41-52
Authors:
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KRISHNAN KM
THANGARAJ N
FARROW RFC
MARKS RF
CEBOLLADA A
PARKIN SSP
TONEY MF
HUFFMAN M
DEARAUJO CAP
MCMILLAN LD
CUCHIARO J
SCOTT MC
ECHER C
PONCE F
OKEEFE MA
NELSON EC
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Authors:
SUMI T
MORIWAKI N
NAKANE G
NAKAKUMA T
JUDAI Y
UEMOTO Y
NAGANO Y
HAYASHI S
AZUMA M
OTSUKI T
KANO G
CUCHIARO JD
SCOTT MC
MCMILLAN LD
DEARAUJO CAP
Citation: T. Sumi et al., 256KB FERROELECTRIC NONVOLATILE MEMORY TECHNOLOGY FOR 1T 1C CELL WITH100NS READ/WRITE TIME AT 3V/, Integrated ferroelectrics, 6(1-4), 1995, pp. 1-13
Authors:
SCOTT JF
GALT D
PRICE JC
BEALL JA
ONO RH
DEARAUJO CAP
MCMILLAN LD
Citation: Jf. Scott et al., A MODEL OF VOLTAGE-DEPENDENT DIELECTRIC LOSSES FOR FERROELECTRIC MMICDEVICES, Integrated ferroelectrics, 6(1-4), 1995, pp. 189-203
Authors:
SHIMADA Y
NAGANO Y
FUJII E
AZUMA M
UEMOTO Y
SUMI T
JUDAI Y
HAYASHI S
MORIWAKI N
NAKANE J
OTSUKI T
DEARAUJO CAP
MCMILLAN LD
Citation: Y. Shimada et al., INTEGRATION TECHNOLOGY OF FERROELECTRICS AND THE PERFORMANCE OF THE INTEGRATED FERROELECTRICS, Integrated ferroelectrics, 11(1-4), 1995, pp. 229-245