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Authors:
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Citation: A. Strittmatter et al., LP-MOCVD growth of GaN on silicon substrates - comparison between AlAs andZnO nucleation layers, MAT SCI E B, 59(1-3), 1999, pp. 29-32
Authors:
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Citation: F. Borner et al., Defects in CuIn(Ga)Se-2 solar cell material characterized by positron annihilation: post-growth annealing effects, PHYSICA B, 274, 1999, pp. 930-933
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Authors:
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Citation: I. Dirnstorfer et al., Postgrowth thermal treatment of CuIn(Ga)Se-2: Characterization of doping levels in In-rich thin films, J APPL PHYS, 85(3), 1999, pp. 1423-1428
Citation: Bk. Meyer et Gh. Perdew, Characterization of the AhR-hsp90-XAP2 core complex and the role of the immunophilin-related protein XAP2 in AhR stabilization, BIOCHEM, 38(28), 1999, pp. 8907-8917
Authors:
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Citation: H. Witte et al., Interface and bulk defects in SiC/GaN heterostructures characterized usingthermal admittance spectroscopy, APPL PHYS L, 74(10), 1999, pp. 1424-1426