ACNP - Italian Periodicals Catalogue

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Results: 1-13 |

Results: 13

Scanning probe microscopy characterisation of masked low energy implanted nanometer structures

Authors: Winzell, T Anand, S Maximov, I Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ

Citation: T. Winzell et al., Scanning probe microscopy characterisation of masked low energy implanted nanometer structures, NUCL INST B, 173(4), 2001, pp. 447-454

Nanoimprint lithography at the 6 in. wafer scale

Authors: Heidari, B Maximov, I Montelius, L

Citation: B. Heidari et al., Nanoimprint lithography at the 6 in. wafer scale, J VAC SCI B, 18(6), 2000, pp. 3557-3560

Metal silicides as a novel electrode material in electrochemical sensors

Authors: Ling, TGI Montelius, L

Citation: Tgi. Ling et L. Montelius, Metal silicides as a novel electrode material in electrochemical sensors, SENS ACTU-B, 70(1-3), 2000, pp. 83-86

Nanoimprint- and UV-lithography: Mix&Match process for fabrication of interdigitated nanobiosensors

Authors: Montelius, L Heidari, B Graczyk, M Maximov, I Sarwe, EL Ling, TGI

Citation: L. Montelius et al., Nanoimprint- and UV-lithography: Mix&Match process for fabrication of interdigitated nanobiosensors, MICROEL ENG, 53(1-4), 2000, pp. 521-524

Scanning nanoscale multiprobes for conductivity measurements

Authors: Boggild, P Hansen, TM Kuhn, O Grey, F Junno, T Montelius, L

Citation: P. Boggild et al., Scanning nanoscale multiprobes for conductivity measurements, REV SCI INS, 71(7), 2000, pp. 2781-2783

Large scale nanolithography using nanoimprint lithography

Authors: Heidari, B Maximov, I Sarwe, EL Montelius, L

Citation: B. Heidari et al., Large scale nanolithography using nanoimprint lithography, J VAC SCI B, 17(6), 1999, pp. 2961-2964

High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part II: sputtering yield transients, the approach to high-fluence equilibrium

Authors: Zhang, YW Winzell, T Zhang, TH Maximov, IA Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ

Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part II: sputtering yield transients, the approach to high-fluence equilibrium, NUCL INST B, 159(3), 1999, pp. 133-141

High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part I: formationof thin silicide surface films

Authors: Zhang, YW Winzell, T Zhang, TH Andersson, M Maximov, IA Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ

Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part I: formationof thin silicide surface films, NUCL INST B, 159(3), 1999, pp. 142-157

High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part III: heavy-fluence Co bombardment induced surface topography development

Authors: Zhang, YW Winzell, T Zhang, TH Maximov, IA Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ

Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part III: heavy-fluence Co bombardment induced surface topography development, NUCL INST B, 159(3), 1999, pp. 158-165

Single-electron devices via controlled assembly of designed nanoparticles

Authors: Junno, T Magnusson, MH Carlsson, SB Deppert, K Malm, JO Montelius, L Samuelson, L

Citation: T. Junno et al., Single-electron devices via controlled assembly of designed nanoparticles, MICROEL ENG, 47(1-4), 1999, pp. 179-183

Perforated silicon nerve chips with doped registration electrodes: in vitro performance and in vivo operation

Authors: Wallman, L Levinsson, A Schouenborg, J Holmberg, H Montelius, L Danielsen, N Laurell, T

Citation: L. Wallman et al., Perforated silicon nerve chips with doped registration electrodes: in vitro performance and in vivo operation, IEEE BIOMED, 46(9), 1999, pp. 1065-1073

Mechanical tuning of tunnel gaps for the assembly of single-electron transistors

Authors: Carlsson, SB Junno, T Montelius, L Samuelson, L

Citation: Sb. Carlsson et al., Mechanical tuning of tunnel gaps for the assembly of single-electron transistors, APPL PHYS L, 75(10), 1999, pp. 1461-1463

Easy and reproducible method for making sharp tips of Pt/Ir

Authors: Lindahl, J Takanen, T Montelius, L

Citation: J. Lindahl et al., Easy and reproducible method for making sharp tips of Pt/Ir, J VAC SCI B, 16(6), 1998, pp. 3077-3081

Risultati: 1-13 |