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Results: 1-21 |
Results: 21
INVERSION IN X-RAY-DIFFRACTION - ZEROS OF THE COMPLEX DIFFRACTION AMPLITUDE
Authors: NIKULIN AY
Citation: Ay. Nikulin, INVERSION IN X-RAY-DIFFRACTION - ZEROS OF THE COMPLEX DIFFRACTION AMPLITUDE, Physica. B, Condensed matter, 252(4), 1998, pp. 319-329
UNIQUENESS OF THE COMPLEX DIFFRACTION AMPLITUDE IN X-RAY BRAGG-DIFFRACTION
Authors: NIKULIN AY
Citation: Ay. Nikulin, UNIQUENESS OF THE COMPLEX DIFFRACTION AMPLITUDE IN X-RAY BRAGG-DIFFRACTION, Physical review. B, Condensed matter, 57(18), 1998, pp. 11178-11183
3-DIMENSIONAL DIFFRACTION PHENOMENON AT A 90-DEGREES BRAGG REFLECTION
Authors: NIKULIN AY DAVIS JR COOKSON DJ
Citation: Ay. Nikulin et al., 3-DIMENSIONAL DIFFRACTION PHENOMENON AT A 90-DEGREES BRAGG REFLECTION, Physica status solidi. a, Applied research, 169(1), 1998, pp. 3-8
REFRACTION PHENOMENA IN X-RAY-SCATTERING EXPERIMENTS PERFORMED WITH ANARROW COLLIMATOR APERTURE
Authors: NIKULIN AY DAVIS JR
Citation: Ay. Nikulin et Jr. Davis, REFRACTION PHENOMENA IN X-RAY-SCATTERING EXPERIMENTS PERFORMED WITH ANARROW COLLIMATOR APERTURE, Optics communications, 155(4-6), 1998, pp. 231-235
UNAMBIGUOUS PHASE DETERMINATION USING A NEW X-RAY INTERFEROMETER ON SEPARATED CRYSTALS
Authors: NIKULIN AY
Citation: Ay. Nikulin, UNAMBIGUOUS PHASE DETERMINATION USING A NEW X-RAY INTERFEROMETER ON SEPARATED CRYSTALS, Physics letters. A, 229(6), 1997, pp. 387-391
MODEL-INDEPENDENT DETERMINATION OF 2D STRAIN DISTRIBUTION IN ION-IMPLANTED SILICON-CRYSTALS FROM X-RAY-DIFFRACTION DATA
Authors: NIKULIN AY STEVENSON AW HASHIZUME H COOKSON D HOBLER G WILKINS SW
Citation: Ay. Nikulin et al., MODEL-INDEPENDENT DETERMINATION OF 2D STRAIN DISTRIBUTION IN ION-IMPLANTED SILICON-CRYSTALS FROM X-RAY-DIFFRACTION DATA, Semiconductor science and technology, 12(3), 1997, pp. 350-354
MODEL-INDEPENDENT DETERMINATION OF CRYSTAL-LATTICE STRAINS IN EPITAXIALLY GROWN LAYERS IN THE CASE OF INCOMPLETE EXPERIMENTAL-DATA
Authors: NIKULIN AY ZAUMSEIL P
Citation: Ay. Nikulin et P. Zaumseil, MODEL-INDEPENDENT DETERMINATION OF CRYSTAL-LATTICE STRAINS IN EPITAXIALLY GROWN LAYERS IN THE CASE OF INCOMPLETE EXPERIMENTAL-DATA, Physica status solidi. a, Applied research, 163(2), 1997, pp. 305-312
THE CHARACTERIZATION OF SIGE SI MULTILAYERS VIA AN UNAMBIGUOUS SOLUTION OF THE INVERSE PROBLEM IN X-RAY BRAGG-DIFFRACTION/
Authors: NIKULIN AY ZAUMSEIL P PETRASHEN PV
Citation: Ay. Nikulin et al., THE CHARACTERIZATION OF SIGE SI MULTILAYERS VIA AN UNAMBIGUOUS SOLUTION OF THE INVERSE PROBLEM IN X-RAY BRAGG-DIFFRACTION/, Journal of physics. D, Applied physics, 30(17), 1997, pp. 2373-2378
INVERSION IN X-RAY BRAGG-DIFFRACTION - A PRACTICAL TECHNIQUE TO COMPENSATE FOR DYNAMICAL SCATTERING FEATURES
Authors: NIKULIN AY PETRASHEN PV
Citation: Ay. Nikulin et Pv. Petrashen, INVERSION IN X-RAY BRAGG-DIFFRACTION - A PRACTICAL TECHNIQUE TO COMPENSATE FOR DYNAMICAL SCATTERING FEATURES, Journal of applied physics, 82(3), 1997, pp. 989-993
NEW METHOD FOR COMPREHENSIVE PHASE-AMPLITUDE CONTRAST IMAGING OF THE INTERNAL STRUCTURE OF MATTER USING HIGH-ENERGY RADIATION
Authors: NIKULIN AY
Citation: Ay. Nikulin, NEW METHOD FOR COMPREHENSIVE PHASE-AMPLITUDE CONTRAST IMAGING OF THE INTERNAL STRUCTURE OF MATTER USING HIGH-ENERGY RADIATION, Applied physics letters, 70(12), 1997, pp. 1545-1547
MODEL-INDEPENDENT DETERMINATION OF THE STRAIN DISTRIBUTION FOR A SI0.9GE0.1 SI SUPERLATTICE USING X-RAY-DIFFRACTOMETRY DATA/
Authors: NIKULIN AY STEVENSON AW HASHIZUME H
Citation: Ay. Nikulin et al., MODEL-INDEPENDENT DETERMINATION OF THE STRAIN DISTRIBUTION FOR A SI0.9GE0.1 SI SUPERLATTICE USING X-RAY-DIFFRACTOMETRY DATA/, Physical review. B, Condensed matter, 53(13), 1996, pp. 8277-8282
NEW PHASE-SENSITIVE METHOD OF SINGLE-CRYSTAL CHARACTERIZATION UNDER X-RAY-DIFFRACTION CONDITIONS
Authors: NIKULIN AY IGNATIEV AY
Citation: Ay. Nikulin et Ay. Ignatiev, NEW PHASE-SENSITIVE METHOD OF SINGLE-CRYSTAL CHARACTERIZATION UNDER X-RAY-DIFFRACTION CONDITIONS, Physical review letters, 76(20), 1996, pp. 3731-3734
AN ENHANCED TECHNIQUE FOR THE CHARACTERIZATION OF CRYSTAL-LATTICE STRAINS IN EPITAXIALLY GROWN LAYERS FROM X-RAY-DIFFRACTION PROFILES
Authors: NIKULIN AY ZAUMSEIL P
Citation: Ay. Nikulin et P. Zaumseil, AN ENHANCED TECHNIQUE FOR THE CHARACTERIZATION OF CRYSTAL-LATTICE STRAINS IN EPITAXIALLY GROWN LAYERS FROM X-RAY-DIFFRACTION PROFILES, Physica status solidi. a, Applied research, 158(2), 1996, pp. 523-527
UNAMBIGUOUS DETERMINATION OF CRYSTAL-LATTICE STRAINS IN EPITAXIALLY GROWN SIGE SI MULTILAYERS/
Authors: NIKULIN AY ZAUMSEIL P PETRASHEN PV
Citation: Ay. Nikulin et al., UNAMBIGUOUS DETERMINATION OF CRYSTAL-LATTICE STRAINS IN EPITAXIALLY GROWN SIGE SI MULTILAYERS/, Journal of applied physics, 80(12), 1996, pp. 6683-6688
HIGH-RESOLUTION MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN ION-IMPLANTED CRYSTALS FROM X-RAY-DIFFRACTOMETRY DATA
Authors: NIKULIN AY GUREYEV TE STEVENSON AW WILKINS SW HASHIZUME H COOKSON D
Citation: Ay. Nikulin et al., HIGH-RESOLUTION MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN ION-IMPLANTED CRYSTALS FROM X-RAY-DIFFRACTOMETRY DATA, Journal of applied crystallography, 28, 1995, pp. 803-811
HIGH-RESOLUTION TRIPLE-CRYSTAL X-RAY-DIFFRACTION EXPERIMENTS PERFORMED AT THE AUSTRALIAN NATIONAL BEAMLINE FACILITY ON A SILICON SAMPLE WITH LATERAL PERIODIC SUPERSTRUCTURE
Authors: NIKULIN AY STEVENSON AW HASHIZUME H WILKINS SW COOKSON D FORAN G GARRETT RF
Citation: Ay. Nikulin et al., HIGH-RESOLUTION TRIPLE-CRYSTAL X-RAY-DIFFRACTION EXPERIMENTS PERFORMED AT THE AUSTRALIAN NATIONAL BEAMLINE FACILITY ON A SILICON SAMPLE WITH LATERAL PERIODIC SUPERSTRUCTURE, Journal of applied crystallography, 28, 1995, pp. 57-60
MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN SILICON-CRYSTALS AT SUBMICROMETER RESOLUTION FROM X-RAY ROCKING-CURVE DATA (VOL 27, PG 33881994)
Authors: NIKULIN AY SAKATA O HASHIZUME H PETRASHEN PV
Citation: Ay. Nikulin et al., MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN SILICON-CRYSTALS AT SUBMICROMETER RESOLUTION FROM X-RAY ROCKING-CURVE DATA (VOL 27, PG 33881994), Journal of applied crystallography, 27, 1994, pp. 647-649
MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN SILICON-CRYSTALS AT SUBMICROMETER RESOLUTION FROM X-RAY ROCKING-CURVE DATA
Authors: NIKULIN AY SAKATA O HASHIZUME H PETRASHEN PV
Citation: Ay. Nikulin et al., MAPPING OF 2-DIMENSIONAL LATTICE-DISTORTIONS IN SILICON-CRYSTALS AT SUBMICROMETER RESOLUTION FROM X-RAY ROCKING-CURVE DATA, Journal of applied crystallography, 27, 1994, pp. 338-344
X-RAY EVALUATION OF MICROROUGHNESS OF MECHANOCHEMICALLY POLISHED SILICON SURFACES
Authors: SAKATA O NIKULIN AY HASHIZUME H
Citation: O. Sakata et al., X-RAY EVALUATION OF MICROROUGHNESS OF MECHANOCHEMICALLY POLISHED SILICON SURFACES, JPN J A P 2, 32(4B), 1993, pp. 616-619
LADLE TREATMENT OF HOT METAL WITH MAGNESIUM REAGENTS
Authors: NIKULIN AY NIKIFOROV BA SARYCHEV VF FERSHUREN P NOSOV SK NISTROI I
Citation: Ay. Nikulin et al., LADLE TREATMENT OF HOT METAL WITH MAGNESIUM REAGENTS, Steel in translation, 23(9), 1993, pp. 7-9
POSSIBILITIES OF X-RAY INTERFERENCE DIFFRACTOMETRY FOR THE RECONSTRUCTION OF 2-DIMENSIONAL LATTICE DEFORMATION PROFILES IN CRYSTALS
Authors: ARISTOV VV GOUREEV TE NIKULIN AY PETRASHEN PV SNIGIREV AA
Citation: Vv. Aristov et al., POSSIBILITIES OF X-RAY INTERFERENCE DIFFRACTOMETRY FOR THE RECONSTRUCTION OF 2-DIMENSIONAL LATTICE DEFORMATION PROFILES IN CRYSTALS, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 29-31
Risultati: 1-21 |