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Results: 1-25/54
Authors:
Balashov, D
Khabipov, M
Buchholz, FI
Niemeyer, J
Citation: D. Balashov et al., SINIS process development for integrated circuits with characteristic voltages exceeding 250 mu V, IEEE APPL S, 11(1), 2001, pp. 1070-1073
Authors:
Khabipov, M
Balashov, D
Buchholz, FI
Niemeyer, J
Citation: M. Khabipov et al., High-frequency performance of RSFQ circuits realized in SINIS technology, IEEE APPL S, 11(1), 2001, pp. 1074-1077
Authors:
Hagedorn, D
Dolata, R
Popel, R
Buchholz, FI
Niemeyer, J
Citation: D. Hagedorn et al., Development of sub-micron SNS ramp-type Josephson junctions, IEEE APPL S, 11(1), 2001, pp. 1134-1137
Authors:
Gotz, M
Khanin, VV
Schulze, H
Zorin, AB
Niemeyer, J
Grajcar, M
Il'ichev, E
Heonig, HE
Meyer, HG
Citation: M. Gotz et al., Current-phase relation in Nb-Al based SINIS-type Josephson junctions, IEEE APPL S, 11(1), 2001, pp. 1142-1145
Authors:
Muller, F
Schulze, H
Behr, R
Kohlmann, J
Niemeyer, J
Citation: F. Muller et al., The Nb-Al technology at PTB - a common base for different types of Josephson voltage standards, PHYSICA C, 354(1-4), 2001, pp. 66-70
Authors:
Il'ichev, E
Hoenig, HE
Meyer, HG
Zorin, AB
Khanin, VV
Gotz, M
Pavolotsky, AB
Niemeyer, J
Citation: E. Il'Ichev et al., Measurement of small supercurrents in niobium SQUID circuits, PHYSICA C, 352(1-4), 2001, pp. 141-143
Authors:
Buchholz, FI
Balashov, D
Khabipov, MI
Hagedorn, D
Dolata, R
Popel, R
Niemeyer, J
Citation: Fi. Buchholz et al., Development of highly integrated RSFQ circuits on the basis of intrinsically shunted Josephson junctions, PHYSICA C, 350(3-4), 2001, pp. 291-301
Authors:
Il'ichev, E
Zakosarenko, V
Fritzsch, L
Stolz, R
Hoenig, HE
Meyer, HG
Gotz, M
Zorin, AB
Khanin, VV
Pavolotsky, AB
Niemeyer, J
Citation: E. Il'Ichev et al., Radio-frequency based monitoring of small supercurrents, REV SCI INS, 72(3), 2001, pp. 1882-1887
Authors:
Gotz, M
Khanin, VV
Zorin, AB
Niemeyer, J
Citation: M. Gotz et al., Microfabrication and characterization of superconducting radio-frequency oscillators, REV SCI INS, 72(11), 2001, pp. 4302-4304
Authors:
Heinsohn, JK
Dittmann, R
Contreras, JR
Goldobin, E
Klushin, AM
Siegel, M
Hagedorn, D
Popel, R
Dolata, R
Buchholz, FI
Niemeyer, J
Citation: Jk. Heinsohn et al., Effect of the magnetic-field orientation on the modulation period of the critical current of ramp-type Josephson junctions, J APPL PHYS, 90(9), 2001, pp. 4623-4631
Authors:
Cirillo, M
Rotoli, G
Mueller, F
Niemeyer, J
Poepel, R
Citation: M. Cirillo et al., Phase-locking Josephson junctions arrays, J APPL PHYS, 90(7), 2001, pp. 3570-3577
Authors:
Krupenin, VA
Zorin, AB
Savvateev, MN
Presnov, DE
Niemeyer, J
Citation: Va. Krupenin et al., Single-electron transistor with metallic microstrips instead of tunnel junctions, J APPL PHYS, 90(5), 2001, pp. 2411-2415
Authors:
Scherer, H
Weimann, T
Zorin, AB
Niemeyer, J
Citation: H. Scherer et al., The effect of thermal annealing on the properties of Al-AlOx-Al single electron tunneling transistors, J APPL PHYS, 90(5), 2001, pp. 2528-2532
Authors:
Karpov, OV
Kutovoi, VD
Sherstobitov, SV
Niemeyer, J
Citation: Ov. Karpov et al., Measurement of a SINIS-type Josephson junction array voltage with respect to the voltage standard based on a SIS-type Josephson junction array, INSTR EXP R, 44(5), 2001, pp. 655-661
Authors:
Hermann, A
Niemeyer, J
Mack, HG
Kopitzky, R
Beuleke, M
Willner, H
Christen, D
Schafer, M
Bauder, A
Oberhammer, H
Citation: A. Hermann et al., Gas-phase structures of acetyl peroxynitrate and trifluoroacetyl peroxynitrate, INORG CHEM, 40(7), 2001, pp. 1672-1676
Authors:
Behr, R
Grimm, L
Funck, T
Kohlmann, J
Schulze, H
Muller, F
Schumacher, B
Warnecke, P
Niemeyer, J
Citation: R. Behr et al., Application of Josephson series arrays to a DC quantum voltmeter, IEEE INSTR, 50(2), 2001, pp. 185-187
Authors:
Kohlmann, J
Schulze, H
Behr, R
Muller, F
Niemeyer, J
Citation: J. Kohlmann et al., 10 VSINIS Josephson junction series arrays for programmable voltage standards, IEEE INSTR, 50(2), 2001, pp. 192-194
Authors:
Behr, R
Niemeyer, J
Katkov, AS
Citation: R. Behr et al., Comparison of the Josephson voltage standards of VNIIM and PTB, IEEE INSTR, 50(2), 2001, pp. 203-205
Authors:
Dathe, A
Eins, S
Niemeyer, J
Gerold, G
Citation: A. Dathe et al., The surface fractal dimension of the soil-pore interface as measured by image analysis, GEODERMA, 103(1-2), 2001, pp. 203-229
Authors:
Lotkhov, SV
Bogoslovsky, SA
Zorin, AB
Niemeyer, J
Citation: Sv. Lotkhov et al., Operation of a three-junction single-electron pump with on-chip resistors, APPL PHYS L, 78(7), 2001, pp. 946-948
Authors:
Schulze, H
Behr, R
Kohlmann, J
Muller, F
Niemeyer, J
Citation: H. Schulze et al., Design and fabrication of 10 VSINIS Josephson arrays for programmable voltage standards, SUPERCOND S, 13(9), 2000, pp. 1293-1295
Authors:
Niemeyer, J
Citation: J. Niemeyer, Josephson arrays for dc and ac metrology, SUPERCOND S, 13(5), 2000, pp. 546-550
Authors:
Popel, R
Hagedorn, D
Weimann, T
Buchholz, FI
Niemeyer, J
Citation: R. Popel et al., Superconductor-normal metal-superconductor process development for the fabrication of small Josephson junctions in ramp type configuration, SUPERCOND S, 13(2), 2000, pp. 148-153
Authors:
Balashov, D
Buchholz, FI
Schulze, H
Khabipov, MI
Dolata, R
Kupriyanov, MY
Niemeyer, J
Citation: D. Balashov et al., Stationary properties of SINIS double-barrier Josephson junctions, SUPERCOND S, 13(2), 2000, pp. 244-250
Authors:
Karger, B
Niemeyer, J
Brinkmann, B
Citation: B. Karger et al., Suicides by sharp force: typical and atypical features, INT J LEGAL, 113(5), 2000, pp. 259-262