Authors:
DEPUYDT A
MASLOVA NS
PANOV VI
RAKOV VV
SAVINOV SV
VANHAESENDONCK C
Citation: A. Depuydt et al., INFLUENCE OF RESONANT-TUNNELING ON THE IMAGING OF ATOMIC DEFECTS ON INAS(110) SURFACES BY LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 171-174
Authors:
AKTSIPETROV OA
DORFMAN VF
MISHINA ED
MOISEEV YN
MURZINA TV
PANOV VI
PYPKIN BN
SAVINOV SV
Citation: Oa. Aktsipetrov et al., 2ND-HARMONIC GENERATION AND SCANNING MICR OSCOPY STUDIES OF AMORPHOUS-CARBON FILMS, Doklady Akademii nauk. Rossijskaa akademia nauk, 359(4), 1998, pp. 472-474
Authors:
ORESHKIN AI
PANOV VI
VASILEV SI
KOROTEEV NI
MAGNITSKII SA
Citation: Ai. Oreshkin et al., DIRECT STM OBSERVATION OF ELECTRONIC-STRUCTURE MODIFICATION OF NAPHTHACENEQUINONE MOLECULES DUE TO PHOTOISOMERIZATION, JETP letters, 68(6), 1998, pp. 521-526
Authors:
MASLOVA NS
ORESHKIN SI
PANOV VI
SAVINOV SV
DEPUYDT A
VANHAESENDONCK C
Citation: Ns. Maslova et al., SCANNING TUNNELING SPECTROSCOPY OF CHARGE EFFECTS ON SEMICONDUCTOR SURFACES AND ATOMIC CLUSTERS, JETP letters, 67(2), 1998, pp. 146-152
Authors:
ARSEYEV PI
DEPUYDT A
MASLOVA NS
PANOV VI
SAVINOV SV
Citation: Pi. Arseyev et al., PROBLEMS OF LOW-TEMPERATURE STM APPLICATION TO THE HIGH-TEMPERATURE SUPERCONDUCTORS INVESTIGATION, PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 5-6, 1997, pp. 131-140
Citation: Vv. Kolesov et al., PRODUCTION AND STM STS STUDY OF A TUNNEL NANOSTRUCTURE CONTAINING A SINGLE FULLERENE MOLECULE/, RADIOTEK EL, 42(7), 1997, pp. 878-881
Authors:
MASLOVA NS
MOISEEV YN
PANOV VI
SAVINOV SV
Citation: Ns. Maslova et al., HOW LOCALIZED STATES AND TERM-PARTIAL INT ERACTIONS AFFECT DIAGNOSTICS OF NANOSTRUCTURES BY STM STC AND AFM METHODS/, Uspehi fiziceskih nauk, 165(2), 1995, pp. 236-238
Authors:
MASLOVA NS
ORESHKIN AI
PANOV VI
SAVINOV SV
KALACHEV AA
RABE JP
Citation: Ns. Maslova et al., STM EVIDENCE OF DIMENSIONAL QUANTIZATION ON THE NANOMETER-SIZE SURFACE-DEFECTS, Solid state communications, 95(8), 1995, pp. 507-510
Authors:
MOISEEV YN
PANOV VI
SAVINOV SV
PYAMINSKY IV
Citation: Yn. Moiseev et al., LOCAL PROBING INSTRUMENTATION AT ADVANCED TECHNOLOGIES CENTER - SURFACE AND FORCE DEVICES WITH TUNNELING SENSOR, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1690-1693
Authors:
BLAGOV EV
KLIMCHITSKAYA GL
MOSTEPANENKO VM
PANOV VI
SOKOLOV IY
Citation: Ev. Blagov et al., POSSIBILITIES OF DETERMINATION OF ENERGY OF POINT-DEFECT MIGRATION BYTHE ATOM-FORCE MICROSCOPY TECHNIQUE, Pis'ma v Zurnal tehniceskoj fiziki, 20(1), 1994, pp. 71-77
Authors:
BLAGOV EV
MOISEEV YN
MOSTEPANENKO VM
MUSATENKO AY
PANOV VI
SAVINOV SV
SOKOLOV IY
Citation: Ev. Blagov et al., THEORETICAL AND EXPERIMENTAL-STUDY OF MIC ROSTRUCTURE OF BISMUTH CERAMICS BY THE TUNNEL AND ATOM-FORCE MICROSCOPY METHODS, Zurnal tehniceskoj fiziki, 64(1), 1994, pp. 89-102
Authors:
ANTONENKO VI
ZNAMENSKII DA
KALUGIN SM
LEVANOVICH VN
MOISEEV YN
PANOV VI
TODUA PA
ULASYUK VN
YUSUPOV RG
Citation: Vi. Antonenko et al., ELECTRONIC-PROPERTIES OF SEMICONDUCTOR-INSULATOR INTERFACES IN A THIN-FILM SIO2 A-SI-H/LANGMUIR/BLODGETT FILM TRANSISTOR STRUCTURE/, Semiconductors, 27(2), 1993, pp. 124-127
Citation: Vm. Mostepanenko et al., PHENOMENON OF THE RUPTURE OF LINE CONTINU ITY OF CONSTANT FORCE WITH RELIEF DIFFERENCE AND ATOM-FORCE MICROSCOPE RESOLUTION, Pis'ma v Zurnal tehniceskoj fiziki, 19(8), 1993, pp. 65-72
Authors:
BLAGOV EV
KLIMCHITSKAYA GL
MOSTEPANENKO VM
PANOV VI
SOKOLOV IY
Citation: Ev. Blagov et al., DIAGNOSTICS OF POINT RADIATION DEFECTS TH ROUGH ATOM-FORCE MICROSCOPYTECHNIQUE, Pis'ma v Zurnal tehniceskoj fiziki, 19(8), 1993, pp. 73-78