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Results:
1-21
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Results: 21
Authors:
DIECKHOFF S
HOPER R
SCHLETT V
GESANG T
POSSART W
HENNEMANN OD
GUNSTER J
KEMPTER V
Citation: S. Dieckhoff et al., CHARACTERIZATION OF VAPOR-PHASE DEPOSITED ORGANIC-MOLECULES ON SILICON SURFACES, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 258-262
Authors:
GESANG T
HOPER R
POSSART W
PETERMANN J
HENNEMANN OD
Citation: T. Gesang et al., ADSORPTION AND GROWTH OF DIP-COATING PREPOLYMER FILMS ON SILICON-WAFERS - AN ATOMIC-FORCE MICROSCOPE STUDY, Applied surface science, 115(1), 1997, pp. 10-22
Authors:
GESANG T
HOPER R
POSSART W
PETERMANN J
HENNEMANN OD
Citation: T. Gesang et al., AFM STUDIES OF THE INITIAL-STAGES OF SPIN-COATED PREPOLYMER FILM GROWTH ON SILICON-WAFERS, Advanced materials, 8(10), 1996, pp. 829
Authors:
GESANG T
POSSART W
HENNEMANN OD
PETERMANN J
Citation: T. Gesang et al., INVESTIGATIONS ON THE INFLUENCE OF ADHESION, COHESION, AND EXTERNAL FORCES ON THE FORMATION OF ULTRATHIN POLYMERIC FILMS, Langmuir, 12(13), 1996, pp. 3341-3350
Authors:
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
GUNSTER J
KEMPTER V
Citation: S. Dieckhoff et al., CHARACTERIZATION OF TRIAZINE DERIVATIVES ON SILICON-WAFERS STUDIED BYPHOTOELECTRON-SPECTROSCOPY (XPS, UPS) AND METASTABLE IMPACT ELECTRON-SPECTROSCOPY (MIES), Applied surface science, 103(3), 1996, pp. 221-229
Authors:
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
Citation: S. Dieckhoff et al., XPS STUDIES OF THIN POLYCYANURATE FILMS ON SILICON-WAFERS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 278-281
Authors:
GESANG T
HOPER R
DIECKHOFF S
HARTWIG A
POSSART W
HENNEMANN OD
Citation: T. Gesang et al., PREPOLYMER FILM GROWTH BY ADSORPTION OUT OF SOLUTION ON SILICON AND ALUMINUM - AN ATOMIC-FORCE MICROSCOPIC STUDY, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 419-426
Authors:
HOPER R
GESANG T
POSSART W
HENNEMANN OD
BOSECK S
Citation: R. Hoper et al., IMAGING ELASTIC SAMPLE PROPERTIES WITH AN ATOMIC-FORCE MICROSCOPE OPERATING IN THE TAPPING MODE, Ultramicroscopy, 60(1), 1995, pp. 17-24
Authors:
GESANG T
HOPER R
DIECKHOFF S
FANTER D
HARTWIG A
POSSART W
HENNEMANN OD
Citation: T. Gesang et al., AFM INVESTIGATIONS OF THE INITIAL-STAGES OF PREPOLYMER FILM GROWTH ONALUMINUM, Applied surface science, 84(3), 1995, pp. 273-283
Authors:
GESANG T
FANTER D
HOPER R
POSSART W
HENNEMANN OD
Citation: T. Gesang et al., COMPARATIVE FILM THICKNESS DETERMINATION BY ATOMIC-FORCE MICROSCOPY AND ELLIPSOMETRY FOR ULTRATHIN POLYMER-FILMS, Surface and interface analysis, 23(12), 1995, pp. 797-808
Authors:
GESANG T
HOPER R
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
Citation: T. Gesang et al., ORGANIC FILM FORMATION INVESTIGATED BY ATOMIC-FORCE MICROSCOPY ON THENANOMETER-SCALE, Thin solid films, 264(2), 1995, pp. 194-204
Authors:
POSSART W
SCHLETT V
Citation: W. Possart et V. Schlett, XPS OF THE INTERPHASE BETWEEN PMMA AND METALS - A STUDY OF DEGRADATION AND INTERACTION, The Journal of adhesion, 48(1-4), 1995, pp. 25-46
Authors:
POSSART W
Citation: W. Possart, THIN POLYMER LAYERS ON SOLIDS - A MODEL SYSTEM FOR THE ADHESIVE INTERPHASE, Le Vide, les couches minces, 50(274), 1994, pp. 461-466
Authors:
POSSART W
Citation: W. Possart, THIN POLYMER LAYERS ON SOLIDS - A MODEL SYSTEM FOR THE ADHESIVE INTERPHASE, Le Vide, les couches minces, (272), 1994, pp. 57-62
Authors:
GESANG T
FANTER D
HOPER R
POSSART W
HENNEMANN OD
Citation: T. Gesang et al., ULTRATHIN POLYMER-COATINGS INVESTIGATED BY ATOMIC-FORCE MICROSCOPY AND ELLIPSOMETRY, Le Vide, les couches minces, (272), 1994, pp. 350-353
Authors:
POSSART W
FANTER D
HARTWIG A
HENNEMAN OD
BAUER M
Citation: W. Possart et al., IR SPECTROSCOPIC STUDY OF VERY THIN PREPOLYMER FILMS ON SILICON AND ON ALUMINUM, Le Vide, les couches minces, (272), 1994, pp. 354-357
Authors:
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
Citation: S. Dieckhoff et al., ADSORPTION AND GROWTH OF POLYCYANURTATE FILMS ON SILICON-WAFERS AND ALUMINUM SUBSTRATES, Le Vide, les couches minces, (272), 1994, pp. 430-433
Authors:
HARTWIG A
ZHU Z
POSSART W
HENNEMANN OD
Citation: A. Hartwig et al., ADSORPTION BEHAVIOR OF A PREPOLYMER ON ALUMINUM AND SILICON, Le Vide, les couches minces, (272), 1994, pp. 548-551
Authors:
KAMUSEWITZ H
POSSART W
PAUL D
Citation: H. Kamusewitz et al., MEASUREMENTS OF SOLID-WATER CONTACT ANGLES IN THE PRESENCE OF DIFFERENT VAPORS, International journal of adhesion and adhesives, 13(4), 1993, pp. 243-249
Authors:
POSSART W
KAMUSEWITZ H
Citation: W. Possart et H. Kamusewitz, THE THERMODYNAMICS AND WETTING OF REAL SURFACES AND THEIR RELATIONSHIP TO ADHESION, International journal of adhesion and adhesives, 13(2), 1993, pp. 77-84
Authors:
POSSART W
KAMUSEWITZ H
Citation: W. Possart et H. Kamusewitz, SOME THERMODYNAMIC CONSIDERATIONS CONCERNING THE USUAL INTERPRETATIONOF WETTING ON SOLIDS, International journal of adhesion and adhesives, 12(1), 1992, pp. 49-54
Risultati:
1-21
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