AAAAAA

   
Results: 1-11 |
Results: 11
Comparison of pMOSFET total dose response for Co-60 gammas and high-energyprotons
Authors: Pease, RL Simons, M Marshall, P
Citation: Rl. Pease et al., Comparison of pMOSFET total dose response for Co-60 gammas and high-energyprotons, IEEE NUCL S, 48(3), 2001, pp. 908-912
Origins of total-dose response variability in linear bipolar microcircuits
Authors: Barnaby, HJ Cirba, CR Schrimpf, RD Fleetwood, DM Pease, RL Shaneyfelt, MR Turflinger, T Krieg, JF Maher, MC
Citation: Hj. Barnaby et al., Origins of total-dose response variability in linear bipolar microcircuits, IEEE NUCL S, 47(6), 2000, pp. 2342-2349
Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs
Authors: Shaneyfelt, MR Schwank, JR Witczak, SC Fleetwood, DM Pease, RL Winokur, PS Riewe, LC Hash, GL
Citation: Mr. Shaneyfelt et al., Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs, IEEE NUCL S, 47(6), 2000, pp. 2539-2545
Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment
Authors: Titus, JL Emily, D Krieg, JF Turflinger, T Pease, RL Campbell, A
Citation: Jl. Titus et al., Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment, IEEE NUCL S, 46(6), 1999, pp. 1608-1615
Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator
Authors: Krieg, J Turflinger, T Titus, J Cole, P Baker, P Gehlhausen, M Emily, D Yang, L Pease, RL Barnaby, H Schrimpf, R Maher, MC
Citation: J. Krieg et al., Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator, IEEE NUCL S, 46(6), 1999, pp. 1627-1632
Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response
Authors: Barnaby, HJ Schrimpf, RD Pease, RL Cole, P Turflinger, T Krieg, J Titus, J Emily, D Gehlhausen, M Witczak, SC Maher, MC Van Nort, D
Citation: Hj. Barnaby et al., Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response, IEEE NUCL S, 46(6), 1999, pp. 1666-1673
1998 IEEE Nuclear and Space Radiation Effects Conference - Awards chairman's comments
Authors: Pease, RL
Citation: Rl. Pease, 1998 IEEE Nuclear and Space Radiation Effects Conference - Awards chairman's comments, IEEE NUCL S, 45(6), 1998, pp. 2330-2330
Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator
Authors: Pease, RL McClure, S Gorelick, J Witczak, SC
Citation: Rl. Pease et al., Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator, IEEE NUCL S, 45(6), 1998, pp. 2571-2576
Moderated degradation enhancement of lateral pnp transistors due to measurement bias
Authors: Witczak, SC Schrimpf, RD Barnaby, HJ Lacoe, RC Mayer, DC Galloway, KF Pease, RL Fleetwood, DM
Citation: Sc. Witczak et al., Moderated degradation enhancement of lateral pnp transistors due to measurement bias, IEEE NUCL S, 45(6), 1998, pp. 2644-2648
Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)
Authors: Pease, RL Gehlhausen, M Krieg, J Titus, J Turflinger, T Emily, D Cohn, L
Citation: Rl. Pease et al., Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS), IEEE NUCL S, 45(6), 1998, pp. 2665-2672
First observations of enhanced low dose rate sensitivity (ELDRS) in space:One part of the MPTB experiment
Authors: Titus, JL Combs, WE Turflinger, TL Krieg, JF Tausch, HJ Brown, DB Pease, RL Campbell, AB
Citation: Jl. Titus et al., First observations of enhanced low dose rate sensitivity (ELDRS) in space:One part of the MPTB experiment, IEEE NUCL S, 45(6), 1998, pp. 2673-2680
Risultati: 1-11 |