Authors:
Abouelsaood, AA
Ghannam, MY
Stalmans, L
Poortmans, J
Nijs, JF
Citation: Aa. Abouelsaood et al., Experimental testing of a random medium optical model of porous silicon for photovoltaic applications, PROG PHOTOV, 9(1), 2001, pp. 15-26
Authors:
Bourdais, S
Beaucarne, G
Slaoui, A
Poortmans, J
Semmache, B
Dubois, C
Citation: S. Bourdais et al., Comparative study of rapid and classical thermal phosphorus diffusion on polycrystalline silicon thin films, SOL EN MAT, 65(1-4), 2001, pp. 487-493
Authors:
Sedky, S
Witvrouw, A
Saerens, A
Van Houtte, P
Poortmans, J
Baert, K
Citation: S. Sedky et al., Effect of in situ boron doping on properties of silicon germanium films deposited by chemical vapor deposition at 400 degrees C, J MATER RES, 16(9), 2001, pp. 2607-2612
Authors:
Aernouts, T
Geens, W
Poortmans, J
Nijs, J
Mertens, R
Citation: T. Aernouts et al., Analysis and simulation of the IV-characteristics of PPV-oligomer based Schottky diodes, SYNTH METAL, 122(1), 2001, pp. 153-155
Authors:
Beaucarne, G
Bourdais, S
Slaoui, A
Poortmans, J
Citation: G. Beaucarne et al., Impurity diffusion from uncoated foreign substrates during high temperature CVD for thin-film Si solar cells, SOL EN MAT, 61(3), 2000, pp. 301-309
Authors:
Geens, W
Poortmans, J
Jain, SC
Nijs, J
Mertens, R
Veenstra, SC
Krasnikov, VV
Hadziioannou, G
Citation: W. Geens et al., Analytical study of PPV-oligomer- and C-60-based devices for optimising organic solar cells, SOL EN MAT, 61(1), 2000, pp. 43-51
Authors:
Agnihotri, OP
Jain, SC
Poortmans, J
Szlufcik, J
Beaucarne, G
Nijs, J
Mertens, R
Citation: Op. Agnihotri et al., Advances in low temperature processing of silicon nitride based dielectrics and their applications in surface passivation and integrated optical devices, SEMIC SCI T, 15(7), 2000, pp. R29-R40
Authors:
Jin, S
Bender, H
Stalmans, L
Bilyalov, R
Poortmans, J
Loo, R
Caymax, M
Citation: S. Jin et al., Transmission electron microscopy investigation of the crystallographic quality of silicon films grown epitaxially on porous silicon, J CRYST GR, 212(1-2), 2000, pp. 119-127
Authors:
Beaucarne, G
Poortmans, J
Caymax, M
Nijs, J
Mertens, R
Citation: G. Beaucarne et al., On the behavior of p-n junction solar cells made in fine-grained silicon layers, IEEE DEVICE, 47(5), 2000, pp. 1118-1120
Authors:
Ohyama, H
Hayama, K
Hakata, T
Simoen, E
Claeys, C
Poortmans, J
Caymax, M
Takami, Y
Sunaga, H
Citation: H. Ohyama et al., Impact of high energy particle irradiation on the electrical performance of Si1-xGex epitaxial diodes, J MAT S-M E, 10(5-6), 1999, pp. 335-337
Authors:
Stalmans, L
Poortmans, J
Bender, H
Conard, T
Jin, S
Nijs, J
Mertens, R
Strehlke, S
Levy-Clement, C
Debarge, L
Slaoui, A
Citation: L. Stalmans et al., Low-thermal-budget treatments of porous silicon surface layers on crystalline Si solar cells: A way to go for improved surface passivation?, SOL EN MAT, 58(3), 1999, pp. 237-252
Authors:
Vazsonyi, E
De Clercq, K
Einhaus, R
Van Kerschaver, E
Said, K
Poortmans, J
Szlufcik, J
Nijs, J
Citation: E. Vazsonyi et al., Improved anisotropic etching process for industrial texturing of silicon solar cells, SOL EN MAT, 57(2), 1999, pp. 179-188
Authors:
Bourdais, S
Beaucarne, G
Poortmans, J
Slaoui, A
Citation: S. Bourdais et al., Electronic transport properties of polycrystalline silicon films depositedon ceramic substrates, PHYSICA B, 274, 1999, pp. 544-548