ACNP - Italian Periodicals Catalogue

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Results: 1-12 |

Results: 12

Characterization of organic low-dielectric-constant materials using optical spectroscopy

Authors: Postava, K Yamaguchi, T Nakano, T

Citation: K. Postava et al., Characterization of organic low-dielectric-constant materials using optical spectroscopy, OPT EXPRESS, 9(3), 2001, pp. 141-151

Magneto-optic polar Kerr and Faraday effects in periodic multilayers

Authors: Visnovksy, S Postava, K Yamaguchi, T

Citation: S. Visnovksy et al., Magneto-optic polar Kerr and Faraday effects in periodic multilayers, OPT EXPRESS, 9(3), 2001, pp. 158-171

Waveguiding in thin films with quadratic magneto-optical medium

Authors: Pistora, J Domanski, A Barta, O Stanek, F Postava, K Ciprian, D Kopriva, I

Citation: J. Pistora et al., Waveguiding in thin films with quadratic magneto-optical medium, ACT PHY P A, 99(1), 2001, pp. 17-23

Optical characterization of TiN/SiO2(1000 nm)/Si system by spectroscopic ellipsometry and reflectometry

Authors: Postava, K Aoyama, M Yamaguchi, T

Citation: K. Postava et al., Optical characterization of TiN/SiO2(1000 nm)/Si system by spectroscopic ellipsometry and reflectometry, APPL SURF S, 175, 2001, pp. 270-275

Spectroellipsometric characterization of materials for multilayer coatings

Authors: Postava, K Aoyama, M Yamaguchi, T Oda, H

Citation: K. Postava et al., Spectroellipsometric characterization of materials for multilayer coatings, APPL SURF S, 175, 2001, pp. 276-280

Doping effects on optical properties of epitaxial ZnO layers determined byspectroscopic ellipsometry

Authors: Postava, K Sueki, H Aoyama, M Yamaguchi, T Murakami, K Igasaki, Y

Citation: K. Postava et al., Doping effects on optical properties of epitaxial ZnO layers determined byspectroscopic ellipsometry, APPL SURF S, 175, 2001, pp. 543-548

Optical functions of low-k materials for interlayer dielectrics

Authors: Postava, K Yamaguchi, T

Citation: K. Postava et T. Yamaguchi, Optical functions of low-k materials for interlayer dielectrics, J APPL PHYS, 89(4), 2001, pp. 2189-2193

Magneto-optic polar Kerr and Faraday effects in magnetic superlattices

Authors: Visnovsky, S Postava, K Yamaguchi, T

Citation: S. Visnovsky et al., Magneto-optic polar Kerr and Faraday effects in magnetic superlattices, CZEC J PHYS, 51(9), 2001, pp. 917-949

Estimation of the dielectric properties of low-k materials using optical spectroscopy

Authors: Postava, K Yamaguchi, T Horie, M

Citation: K. Postava et al., Estimation of the dielectric properties of low-k materials using optical spectroscopy, APPL PHYS L, 79(14), 2001, pp. 2231-2233

Spectroscopic ellipsometry of epitaxial ZnO layer on sapphire substrate

Authors: Postava, K Sueki, H Aoyama, M Yamaguchi, T Ino, C Igasaki, Y Horie, M

Citation: K. Postava et al., Spectroscopic ellipsometry of epitaxial ZnO layer on sapphire substrate, J APPL PHYS, 87(11), 2000, pp. 7820-7824

Optical guided modes in sandwiches with ultrathin metallic films

Authors: Pistora, J Postava, K Sebesta, R

Citation: J. Pistora et al., Optical guided modes in sandwiches with ultrathin metallic films, J MAGN MAGN, 199, 1999, pp. 683-685

Magneto-optical effects in ultrathin structures at transversal magnetization

Authors: Postava, K Pistora, J Visnovsky, S

Citation: K. Postava et al., Magneto-optical effects in ultrathin structures at transversal magnetization, CZEC J PHYS, 49(8), 1999, pp. 1185-1204

Risultati: 1-12 |