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Results: 1-9 |
Results: 9

Authors: Protopapa, ML De Tomasi, F Perrone, MR Piegari, A Masetti, E Ristau, D Quesnel, E Duparre, A
Citation: Ml. Protopapa et al., Laser damage studies on MgF2 thin films, J VAC SCI A, 19(2), 2001, pp. 681-688

Authors: Tikhonravov, AV Trubetskov, MK Krasilnikova, AV Masetti, E Duparre, A Quesnel, E Ristau, D
Citation: Av. Tikhonravov et al., Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry, THIN SOL FI, 397(1-2), 2001, pp. 229-237

Authors: Dumas, L Quesnel, E Robic, JY Pauleau, Y
Citation: L. Dumas et al., Characterization of magnesium fluoride thin films produced by argon ion beam-assisted deposition, THIN SOL FI, 382(1-2), 2001, pp. 61-68

Authors: Dumas, L Chatillon, C Quesnel, E
Citation: L. Dumas et al., Thermodynamic calculations of congruent vaporization and interactions withresidual water during magnesium fluoride vacuum deposition, J CRYST GR, 222(1-2), 2001, pp. 215-234

Authors: Ferre-Borrull, J Duparre, A Quesnel, E
Citation: J. Ferre-borrull et al., Procedure to characterize microroughness of optical thin films: application to ion-beam-sputtered vacuum-ultraviolet coatings, APPL OPTICS, 40(13), 2001, pp. 2190-2199

Authors: Quesnel, E Dumas, L Jacob, D Peiro, F
Citation: E. Quesnel et al., Optical and microstructural properties of MgF2UV coatings grown by ion beam sputtering process, J VAC SCI A, 18(6), 2000, pp. 2869-2876

Authors: Dumas, L Quesnel, E Robic, JY Pauleau, Y
Citation: L. Dumas et al., Characterization of magnesium fluoride thin films deposited by direct electron beam evaporation, J VAC SCI A, 18(2), 2000, pp. 465-469

Authors: Jacob, D Peiro, F Quesnel, E Ristau, D
Citation: D. Jacob et al., Microstructure and composition of MgF2 optical coatings grown on Si substrate by PVD and IBS processes, THIN SOL FI, 360(1-2), 2000, pp. 133-138

Authors: Ferre-Borrull, J Duparre, A Quesnel, E
Citation: J. Ferre-borrull et al., Roughness and light scattering of ion-beam-sputtered fluoride coatings for193 nm, APPL OPTICS, 39(31), 2000, pp. 5854-5864
Risultati: 1-9 |