Authors:
RUSS C
VERHAEGE K
BOCK K
ROUSSEL PJ
GROESENEKEN G
MAES HE
Citation: C. Russ et al., A COMPACT MODEL FOR THE GROUNDED-GATE NMOS TRANSISTOR BEHAVIOR UNDER CDM ESD STRESS, Journal of electrostatics, 42(4), 1998, pp. 351-381
Citation: S. Schacher et al., THE LABORATORY DIAGNOSIS OF GRANULOMATOUS ANTERIOR UVEITIS AND KERATOUVEITIS OF SUSPECTED VIRAL ORIGIN, Klinische Monatsblatter fur Augenheilkunde, 212(5), 1998, pp. 359-362
Authors:
HOLMES C
RUSS C
KIROV G
AITCHISON KJ
POWELL JF
COLLIER DA
LOVESTONE S
Citation: C. Holmes et al., APOLIPOPROTEIN-E - DEPRESSIVE-ILLNESS, DEPRESSIVE SYMPTOMS, AND ALZHEIMERS-DISEASE, Biological psychiatry, 43(3), 1998, pp. 159-164
Authors:
CERVILLA JA
RUSS C
HOLMES C
AITCHISON K
SMITH CAD
POWELL J
LOVESTONE S
Citation: Ja. Cervilla et al., CYP2D6 POLYMORPHISMS IN ALZHEIMERS-DISEASE WITH AND WITHOUT EXTRAPYRAMIDAL SIGNS SHOWING NO APOE EPSILON-4 EFFECT MODIFICATION, American journal of medical genetics, 74(6), 1997, pp. 634-634
Citation: A. Alchalabi et al., NOVEL MUTATIONS IN A HYPERVARIABLE SITE OF THE HEAVY NEUROFILAMENT SUBUNIT IN ALS, Neurology, 48(3), 1997, pp. 49004-49004
Authors:
VERHAEGE K
RUSS C
LUCHIES JM
GROESENEKEN G
KUPER FG
Citation: K. Verhaege et al., GROUNDED-GATE NMOS TRANSISTOR BEHAVIOR UNDER CDM ESD STRESS CONDITIONS, I.E.E.E. transactions on electron devices, 44(11), 1997, pp. 1972-1980
Authors:
ALCHALABI A
ENAYAT ZE
BAKKER M
SHAM PC
BALL DM
RUSS C
SHAW CE
POWELL JF
LEIGH PN
Citation: A. Alchalabi et al., APOLIPOPROTEIN-E AND CLINICAL PRESENTATION AND PROGNOSIS IN MOTOR-NEURON DISEASE, Quarterly Journal of Medicine, 89(11), 1996, pp. 871-871
Authors:
VERHAEGE K
ROBINSONHAHN D
RUSS C
FARRIS M
SCANLON J
LIN D
VELTRI J
GROESENEKEN G
Citation: K. Verhaege et al., JUSTIFICATIONS FOR REDUCING HBM AND MM ESD QUALIFICATION TEST TIME, Microelectronics and reliability, 36(11-12), 1996, pp. 1715-1718
Authors:
RUSS C
VERHAEGE K
BOCK K
GROESENEKEN G
MAES HE
Citation: C. Russ et al., SIMULATION STUDY FOR THE CDM ESD BEHAVIOR OF THE GROUNDED-GATE NMOS, Microelectronics and reliability, 36(11-12), 1996, pp. 1739-1742
Citation: C. Russ et al., ESD PROTECTION ELEMENTS DURING HBM STRESS TESTS - FURTHER NUMERICAL AND EXPERIMENTAL RESULTS, Quality and reliability engineering international, 11(4), 1995, pp. 285-294
Citation: U. Schubert et al., TRANSITION-METAL SILYL COMPLEXES, .52. FO RMATION OF COPPER SILYL ANDSTANNYL COMPLEXES BY REACTION OF [PH3PCUH]6 WITH HER3 (E=SI, SN), Chemische Berichte, 127(11), 1994, pp. 2189-2190
Authors:
REICHENSPURNER H
RUSS C
UBERFUHR P
NOLLERT G
SCHLUTER A
REICHART B
KLOVEKORN WP
SCHULER S
HETZER R
BRETT W
POSIVAL M
KORNER MM
KORFER R
Citation: H. Reichenspurner et al., MYOCARDIAL PRESERVATION USING HTK SOLUTION FOR HEART-TRANSPLANTATION - A MULTICENTER STUDY, European journal of cardio-thoracic surgery, 7(8), 1993, pp. 414-419
Authors:
REICHENSPURNER H
RUSS C
MEISER BM
UBERFUHR P
NOLLERT G
WEINHOLD C
REICHART B
Citation: H. Reichenspurner et al., UNIVERSITY-OF-WISCONSIN SOLUTION FOR MYOCARDIAL PROTECTION IN HEART-TRANSPLANTATION - A COMPARISON WITH HTK, Transplantation proceedings, 25(6), 1993, pp. 3042-3043