AAAAAA

   
Results: 1-10 |
Results: 10
A noncontact electron-probe method for measuring the diffusion length and the lifetime of minority charge carriers in semiconductors
Authors: Rau, EI Zhu, SQ
Citation: Ei. Rau et Sq. Zhu, A noncontact electron-probe method for measuring the diffusion length and the lifetime of minority charge carriers in semiconductors, SEMICONDUCT, 35(6), 2001, pp. 718-722
Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods
Authors: Belhaj, M Jbara, O Filippov, MN Rau, EI Andrianov, MV
Citation: M. Belhaj et al., Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods, APPL SURF S, 177(1-2), 2001, pp. 58-65
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopy
Authors: Filippov, MN Rau, EI Sennov, RA Boyde, A Howell, PGTH
Citation: Mn. Filippov et al., Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopy, SCANNING, 23(5), 2001, pp. 305-312
Fundamental problems of imaging subsurface structures in the backscatteredelectron mode in scanning electron microscopy
Authors: Rau, EI Reimer, L
Citation: Ei. Rau et L. Reimer, Fundamental problems of imaging subsurface structures in the backscatteredelectron mode in scanning electron microscopy, SCANNING, 23(4), 2001, pp. 235-240
Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications
Authors: Jbara, O Belhaj, M Odof, S Msellak, K Rau, EI Andrianov, MV
Citation: O. Jbara et al., Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications, REV SCI INS, 72(3), 2001, pp. 1788-1795
The possibility of measurement of local characteristics of semiconductor materials by electron-beam-induced electromotive force technique
Authors: Gostev, AV Rau, EI Zhu, SC Yakimov, EB
Citation: Av. Gostev et al., The possibility of measurement of local characteristics of semiconductor materials by electron-beam-induced electromotive force technique, IAN FIZ, 64(8), 2000, pp. 1568-1573
The investigation of electron-optical characteristics of toroidal spectrometer
Authors: Rau, EI Savin, VO Sennov, RA Freinkman, BG Hoffmeister, H
Citation: Ei. Rau et al., The investigation of electron-optical characteristics of toroidal spectrometer, IAN FIZ, 64(8), 2000, pp. 1574-1578
An anomalous contrast in scanning electron microscopy of insulators: The pseudo-mirror effect
Authors: Belhaj, M Jbara, O Odof, S Msellak, K Rau, EI Andrianov, MV
Citation: M. Belhaj et al., An anomalous contrast in scanning electron microscopy of insulators: The pseudo-mirror effect, SCANNING, 22(6), 2000, pp. 352-356
Experimental determination of energy resolution and transmission characteristics of an electrostatic toroidal spectrometer adapted to a standard scanning electron microscope
Authors: Berger, D Filippov, M Niedrig, H Rau, EI Schlichting, F
Citation: D. Berger et al., Experimental determination of energy resolution and transmission characteristics of an electrostatic toroidal spectrometer adapted to a standard scanning electron microscope, J ELEC SPEC, 105(2-3), 1999, pp. 119-127
Estimation of the resolution limits in SEM for IC innternal voltage due toretarding microfields on the specimen surface
Authors: Pakhomova, IY Rau, EI Ryabova, GV Souvorinov, AV
Citation: Iy. Pakhomova et al., Estimation of the resolution limits in SEM for IC innternal voltage due toretarding microfields on the specimen surface, IAN FIZ, 63(7), 1999, pp. 1318-1324
Risultati: 1-10 |