Authors:
Pretet, J
Subba, N
Ioannou, D
Cristoloveanu, S
Maszara, W
Raynaud, C
Citation: J. Pretet et al., Channel-width dependence of floating body effects in STI- and LOCOS-isolated MOSFETS, MICROEL ENG, 59(1-4), 2001, pp. 483-488
Authors:
Dieudonne, F
Dauge, F
Jomaah, J
Raynaud, C
Balestra, F
Citation: F. Dieudonne et al., An overview of hot-carrier induced degradation in 0.25 mu m Partially and Fully Depleted SOIN-MOSFET's, MICROEL REL, 41(9-10), 2001, pp. 1417-1420
Citation: C. Raynaud, Silica films on silicon carbide: a review of electrical properties and device applications, J NON-CRYST, 280(1-3), 2001, pp. 1-31
Authors:
Croci, S
Plossu, C
Balland, B
Raynaud, C
Boivin, P
Citation: S. Croci et al., Effect of some technological parameters on Fowler-Nordheim injection through tunnel oxides for non-volatile memories, J NON-CRYST, 280(1-3), 2001, pp. 202-210
Authors:
Camacho, LR
Constant, P
Raynaud, C
Laneelle, MA
Triccas, JA
Gicquel, B
Daffe, M
Guilhot, C
Citation: Lr. Camacho et al., Analysis of the phthiocerol dimycocerosate locus of Mycobacterium tuberculosis - Evidence that this lipid is involved in the cell wall permeability barrier, J BIOL CHEM, 276(23), 2001, pp. 19845-19854
Authors:
Haendler, S
Jomaah, J
Balestra, F
Pelloie, JL
Raynaud, C
Citation: S. Haendler et al., Kink-related excess noise in deep submicron partially and moderately fullydepleted unibond N-metal oxide semiconductor field effect transistor (MOSFET), JPN J A P 1, 39(4B), 2000, pp. 2261-2263
Authors:
Dubnau, E
Chan, J
Raynaud, C
Mohan, VP
Laneelle, MA
Yu, KM
Quemard, A
Smith, I
Daffe, M
Citation: E. Dubnau et al., Oxygenated mycolic acids are necessary for virulence of Mycobacterium tuberculosis in mice, MOL MICROB, 36(3), 2000, pp. 630-637
Authors:
Savkina, NS
Lebedev, AA
Davydov, DV
Strel'chuk, AM
Tregubova, AS
Raynaud, C
Chante, JP
Locatelli, ML
Planson, D
Milan, J
Godignon, P
Campos, FJ
Mestres, N
Pascual, J
Brezeanu, G
Badila, M
Citation: Ns. Savkina et al., Low-doped 6H-SiC n-type epilayers grown by sublimation epitaxy, MAT SCI E B, 77(1), 2000, pp. 50-54
Citation: C. Raynaud, Calculation of theoretical capacitance-voltage characteristics of 6H-SiC metal-oxide-semiconductor structures, J APPL PHYS, 88(1), 2000, pp. 424-428
Authors:
Ferlet-Cavrois, V
Paillet, P
Musseau, O
Leray, JL
Faynot, O
Raynaud, C
Pelloie, JL
Citation: V. Ferlet-cavrois et al., Total dose behavior of partially depleted SOI dynamic threshold voltage MOS (DTMOS) for very low supply voltage applications (0.6-1V), IEEE NUCL S, 47(3), 2000, pp. 613-619
Authors:
Raynaud, C
Laneelle, MA
Senaratne, RH
Draper, P
Laneelle, G
Daffe, M
Citation: C. Raynaud et al., Mechanisms of pyrazinamide resistance in mycobacteria: importance of lack of uptake in addition to lack of pyrazinamidase activity, MICROBIO-UK, 145, 1999, pp. 1359-1367
Authors:
Jackson, M
Raynaud, C
Laneelle, MA
Guilhot, C
Laurent-Winter, C
Ensergueix, D
Gicquel, B
Daffe, M
Citation: M. Jackson et al., Inactivation of the antigen 85C gene profoundly affects the mycolate content and alters the permeability of the Mycobacterium tuberculosis cell envelope, MOL MICROB, 31(5), 1999, pp. 1573-1587
Authors:
David, JL
Dusautoir, JC
Raynaud, C
Roumet, P
Citation: Jl. David et al., Heritable variation in the ability to produce haploid embryos via pollination with maize and embryo rescue in durum wheat, GENOME, 42(2), 1999, pp. 338-342
Authors:
Ferlet-Cavrois, V
Bracale, A
Marcandella, C
Musseau, O
Pelloie, JL
Raynaud, C
Faynot, O
Citation: V. Ferlet-cavrois et al., Designing MOS/SOI transistors for high frequency and low voltage applications, MICROEL ENG, 48(1-4), 1999, pp. 351-354
Citation: C. Raynaud, "Mask to mask, the 'real' joke": Surfiction/autofiction, or the tale of the purloined watermelon, CALLALOO, 22(3), 1999, pp. 695-712
Authors:
Rauly, E
Potavin, O
Balestra, F
Raynaud, C
Citation: E. Rauly et al., On the subthreshold swing and short channel effects in single and double gate deep submicron SOI-MOSFETs, SOL ST ELEC, 43(11), 1999, pp. 2033-2037
Authors:
Croci, S
Voisin, JM
Plossu, C
Raynaud, C
Autran, JL
Boivin, P
Mirabel, JM
Citation: S. Croci et al., Extraction and evolution of Fowler-Nordheim tunneling parameters of thin gate oxides under EEPROM-like dynamic degradation, MICROEL REL, 39(6-7), 1999, pp. 879-884
Authors:
Plossu, C
Voisin, JM
Bos, B
Raynaud, C
Bouchakour, R
Boivin, P
Balland, B
Citation: C. Plossu et al., Dynamic stressing of thin tunnel oxides: a way to emulate a single EEPROM cell programming function, J NON-CRYST, 245, 1999, pp. 85-91
Citation: C. Raynaud et Jl. Autran, Theoretical investigation of incomplete ionization of dopants in 6H-SiC metal-oxide-semiconductor capacitors, J APPL PHYS, 86(4), 1999, pp. 2232-2236