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Results: 1-25 | 26-34
Results: 1-25/34
REFLECTION SHADOW IMAGING OF CRYSTAL-SURFACE BY LOW-VOLTAGE POINT-REFLECTION ELECTRON-MICROSCOPY
Authors: ZHANG X WEIERSTALL U SPENCE JCH
Citation: X. Zhang et al., REFLECTION SHADOW IMAGING OF CRYSTAL-SURFACE BY LOW-VOLTAGE POINT-REFLECTION ELECTRON-MICROSCOPY, Ultramicroscopy, 72(1-2), 1998, pp. 67-81
DIRECT INVERSION OF DYNAMICAL ELECTRON-DIFFRACTION PATTERNS TO STRUCTURE FACTORS
Authors: SPENCE JCH
Citation: Jch. Spence, DIRECT INVERSION OF DYNAMICAL ELECTRON-DIFFRACTION PATTERNS TO STRUCTURE FACTORS, Acta crystallographica. Section A, Foundations of crystallography, 54, 1998, pp. 7-18
ATOMIC SPECIES IDENTIFICATION IN STM USING AN IMAGING ATOM-PROBE TECHNIQUE
Authors: WEIERSTALL U SPENCE JCH
Citation: U. Weierstall et Jch. Spence, ATOMIC SPECIES IDENTIFICATION IN STM USING AN IMAGING ATOM-PROBE TECHNIQUE, Surface science, 398(1-2), 1998, pp. 267-279
AB-INITIO LDA CALCULATIONS OF THE MEAN COULOMB POTENTIAL V-0 IN SLABSOF CRYSTALLINE SI, GE AND MGO
Authors: KIM MY ZUO JM SPENCE JCH
Citation: My. Kim et al., AB-INITIO LDA CALCULATIONS OF THE MEAN COULOMB POTENTIAL V-0 IN SLABSOF CRYSTALLINE SI, GE AND MGO, Physica status solidi. a, Applied research, 166(1), 1998, pp. 445-451
CRYSTAL-STRUCTURE DETERMINATION BY DIRECT INVERSION OF DYNAMICAL MICRODIFFRACTION PATTERNS
Authors: SPENCE JCH
Citation: Jch. Spence, CRYSTAL-STRUCTURE DETERMINATION BY DIRECT INVERSION OF DYNAMICAL MICRODIFFRACTION PATTERNS, Journal of Microscopy, 190, 1998, pp. 214-221
TEM IMAGING OF DISLOCATION KINKS, THEIR MOTION AND PINNING
Authors: SPENCE JCH KOLAR HR ALEXANDER H
Citation: Jch. Spence et al., TEM IMAGING OF DISLOCATION KINKS, THEIR MOTION AND PINNING, Journal de physique. III, 7(12), 1997, pp. 2325-2338
STEM AND SHADOW-IMAGING OF BIOMOLECULES AT 6-EV BEAM ENERGY
Authors: SPENCE JCH
Citation: Jch. Spence, STEM AND SHADOW-IMAGING OF BIOMOLECULES AT 6-EV BEAM ENERGY, Micron, 28(2), 1997, pp. 101-116
DOES ELECTRON HOLOGRAPHY ENERGY-FILTER
Authors: SPENCE JCH ZUO JM
Citation: Jch. Spence et Jm. Zuo, DOES ELECTRON HOLOGRAPHY ENERGY-FILTER, Ultramicroscopy, 69(3), 1997, pp. 185-190
THE ENHANCEMENT OF ELECTRON-MICROSCOPE RESOLUTION BY USE OF ATOMIC FOCUSERS
Authors: COWLEY JM SPENCE JCH SMIRNOV VV
Citation: Jm. Cowley et al., THE ENHANCEMENT OF ELECTRON-MICROSCOPE RESOLUTION BY USE OF ATOMIC FOCUSERS, Ultramicroscopy, 68(2), 1997, pp. 135-148
IMAGING MOVING DISLOCATION KINKS AND BURIED INTERFACES BY HREM
Authors: SPENCE JCH
Citation: Jch. Spence, IMAGING MOVING DISLOCATION KINKS AND BURIED INTERFACES BY HREM, Ultramicroscopy, 67(1-4), 1997, pp. 171-180
LOW-ENERGY POINT REFLECTION ELECTRON-MICROSCOPY
Authors: SPENCE JCH ZHANG X WEIERSTALL U ZUO JM MUNRO E ROUSE J
Citation: Jch. Spence et al., LOW-ENERGY POINT REFLECTION ELECTRON-MICROSCOPY, Surface review and letters, 4(3), 1997, pp. 577-587
CHARGE-DENSITY OF MGO - IMPLICATIONS OF PRECISE NEW MEASUREMENTS FOR THEORY
Authors: ZUO JM OKEEFFE M REZ P SPENCE JCH
Citation: Jm. Zuo et al., CHARGE-DENSITY OF MGO - IMPLICATIONS OF PRECISE NEW MEASUREMENTS FOR THEORY, Physical review letters, 78(25), 1997, pp. 4777-4780
ATOMIC SPECIES IDENTIFICATION IN SCANNING-TUNNELING-MICROSCOPY BY TIME-OF-FLIGHT SPECTROSCOPY
Authors: SPENCE JCH WEIERSTALL U LO W
Citation: Jch. Spence et al., ATOMIC SPECIES IDENTIFICATION IN SCANNING-TUNNELING-MICROSCOPY BY TIME-OF-FLIGHT SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1587-1590
PERFORMANCE OF IMAGING PLATES FOR ELECTRON RECORDING
Authors: ZUO JM MCCARTNEY MR SPENCE JCH
Citation: Jm. Zuo et al., PERFORMANCE OF IMAGING PLATES FOR ELECTRON RECORDING, Ultramicroscopy, 66(1-2), 1996, pp. 35-47
OBSERVATION OF MOVING DISLOCATION KINKS AND UNPINNING
Authors: KOLAR HR SPENCE JCH ALEXANDER H
Citation: Hr. Kolar et al., OBSERVATION OF MOVING DISLOCATION KINKS AND UNPINNING, Physical review letters, 77(19), 1996, pp. 4031-4034
QUANTITATIVE ELECTRON MICRODIFFRACTION
Authors: SPENCE JCH
Citation: Jch. Spence, QUANTITATIVE ELECTRON MICRODIFFRACTION, Journal of Electron Microscopy, 45(1), 1996, pp. 19-26
SHORT-RANGE ORDERED STRUCTURE OF GA0.47IN0.53AS STUDIED BY ENERGY-FILTERED ELECTRON-DIFFRACTION AND HREM
Authors: SHINDO D GOMYO A ZUO JM SPENCE JCH
Citation: D. Shindo et al., SHORT-RANGE ORDERED STRUCTURE OF GA0.47IN0.53AS STUDIED BY ENERGY-FILTERED ELECTRON-DIFFRACTION AND HREM, Journal of Electron Microscopy, 45(1), 1996, pp. 99-104
EFFECT OF MN DOPING ON CHARGE-DENSITY IN GAMMA-TIAL BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: HOLMESTAD R ZUO JM SPENCE JCH HOIER R HORITA Z
Citation: R. Holmestad et al., EFFECT OF MN DOPING ON CHARGE-DENSITY IN GAMMA-TIAL BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 72(3), 1995, pp. 579-601
DISLOCATION KINK MOTION IN SILICON
Authors: HUANG YM SPENCE JCH SANKEY OF
Citation: Ym. Huang et al., DISLOCATION KINK MOTION IN SILICON, Physical review letters, 74(17), 1995, pp. 3392-3395
THE BRIGHTEST BEAM IN SCIENCE - NEW DIRECTIONS IN ELECTRON-MICROSCOPYAND INTERFEROMETRY
Authors: SILVERMAN MP STRANGE W SPENCE JCH
Citation: Mp. Silverman et al., THE BRIGHTEST BEAM IN SCIENCE - NEW DIRECTIONS IN ELECTRON-MICROSCOPYAND INTERFEROMETRY, American journal of physics, 63(9), 1995, pp. 800-813
ELECTRON SOURCE BRIGHTNESS AND DEGENERACY FROM FRESNEL FRINGES IN-FIELD EMISSION POINT PROJECTION MICROSCOPY
Authors: SPENCE JCH QIAN W SILVERMAN MP
Citation: Jch. Spence et al., ELECTRON SOURCE BRIGHTNESS AND DEGENERACY FROM FRESNEL FRINGES IN-FIELD EMISSION POINT PROJECTION MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 542-547
ON THE MEAN INNER POTENTIAL IN HIGH-ENERGY AND LOW-ENERGY ELECTRON DIFFRACTION
Authors: SALDIN DK SPENCE JCH
Citation: Dk. Saldin et Jch. Spence, ON THE MEAN INNER POTENTIAL IN HIGH-ENERGY AND LOW-ENERGY ELECTRON DIFFRACTION, Ultramicroscopy, 55(4), 1994, pp. 397-406
REFLECTION ELECTRON-MICROSCOPY OF BURIED INTERFACES IN THE TRANSMISSION GEOMETRY
Authors: SPENCE JCH
Citation: Jch. Spence, REFLECTION ELECTRON-MICROSCOPY OF BURIED INTERFACES IN THE TRANSMISSION GEOMETRY, Ultramicroscopy, 55(3), 1994, pp. 293-301
THE EFFECTS OF IMPURITIES ON THE IDEAL TENSILE-STRENGTH OF SILICON
Authors: HUANG YM SPENCE JCH SANKEY OF
Citation: Ym. Huang et al., THE EFFECTS OF IMPURITIES ON THE IDEAL TENSILE-STRENGTH OF SILICON, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 70(1), 1994, pp. 53-62
ON THE MINIMUM NUMBER OF BEAMS NEEDED TO DISTINGUISH ENANTIOMORPHS INX-RAY AND ELECTRON-DIFFRACTION
Authors: SPENCE JCH ZUO JM OKEEFFE M MARTHINSEN K HOIER R
Citation: Jch. Spence et al., ON THE MINIMUM NUMBER OF BEAMS NEEDED TO DISTINGUISH ENANTIOMORPHS INX-RAY AND ELECTRON-DIFFRACTION, Acta crystallographica. Section A, Foundations of crystallography, 50, 1994, pp. 647-650
Risultati: 1-25 | 26-34