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Results: 1-25 | 26-34
Results: 1-25/34
XPS COMPARATIVE-STUDY OF CERIA ZIRCONIA MIXED OXIDES - POWDERS AND THIN-FILM CHARACTERIZATION/
Authors: GALTAYRIES A SPORKEN R RIGA J BLANCHARD G CAUDANO R
Citation: A. Galtayries et al., XPS COMPARATIVE-STUDY OF CERIA ZIRCONIA MIXED OXIDES - POWDERS AND THIN-FILM CHARACTERIZATION/, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 951-956
ZNSE ZNSXSE1-X HETEROJUNCTION VALENCE-BAND DISCONTINUITY MEASURED BY X-RAY PHOTOELECTRON-SPECTROSCOPY/
Authors: SPORKEN R ABUELRUB KM CHEN YP SIVANANTHAN S
Citation: R. Sporken et al., ZNSE ZNSXSE1-X HETEROJUNCTION VALENCE-BAND DISCONTINUITY MEASURED BY X-RAY PHOTOELECTRON-SPECTROSCOPY/, Journal of electronic materials, 27(6), 1998, pp. 776-781
SI 2P CORE-LEVEL SHIFTS AT THE CDTE SI(100) INTERFACE/
Authors: SPORKEN R MALENGREAU F GHIJSEN J CAUDANO R SIVANANTHAN S FAURIE JP VANGEMMEREN T JOHNSON RL
Citation: R. Sporken et al., SI 2P CORE-LEVEL SHIFTS AT THE CDTE SI(100) INTERFACE/, Applied surface science, 123, 1998, pp. 462-466
SYNTHESIS AND CHARACTERIZATION OF CONDUCTIVE TITANIUM MONOXIDE FILMS - DIFFUSION OF SILICON IN TITANIUM MONOXIDE FILMS
Authors: GRIGOROV KG GRIGOROV GI DRAJEVA L BOUCHIER D SPORKEN R CAUDANO R
Citation: Kg. Grigorov et al., SYNTHESIS AND CHARACTERIZATION OF CONDUCTIVE TITANIUM MONOXIDE FILMS - DIFFUSION OF SILICON IN TITANIUM MONOXIDE FILMS, Vacuum, 51(2), 1998, pp. 153-155
ATOMIC MOTION AT GERMANIUM SURFACES - SCANNING-TUNNELING-MICROSCOPY AND MONTE-CARLO SIMULATIONS
Authors: VIGNERON JP BENAISSA A DERYCKE I WIAME A SPORKEN R
Citation: Jp. Vigneron et al., ATOMIC MOTION AT GERMANIUM SURFACES - SCANNING-TUNNELING-MICROSCOPY AND MONTE-CARLO SIMULATIONS, International journal of quantum chemistry, 70(4-5), 1998, pp. 1093-1097
UHV REACTIVE SPUTTERING OF ALN(0001) SINGLE-CRYSTALS ON SI(111) AT HIGH-TEMPERATURE BY A 2-STEP GROWTH METHOD
Authors: MALENGREAU F HAGEGE S SPORKEN R VERMEERSCH M CAUDANO R
Citation: F. Malengreau et al., UHV REACTIVE SPUTTERING OF ALN(0001) SINGLE-CRYSTALS ON SI(111) AT HIGH-TEMPERATURE BY A 2-STEP GROWTH METHOD, Journal of the European Ceramic Society, 17(15-16), 1997, pp. 1807-1811
EPITAXIAL-GROWTH OF ALUMINUM NITRIDE LAYERS ON SI(111) AT HIGH-TEMPERATURE AND FOR DIFFERENT THICKNESSES
Authors: MALENGREAU F VERMEERSCH M HAGEGE S SPORKEN R LANGE MD CAUDANO R
Citation: F. Malengreau et al., EPITAXIAL-GROWTH OF ALUMINUM NITRIDE LAYERS ON SI(111) AT HIGH-TEMPERATURE AND FOR DIFFERENT THICKNESSES, Journal of materials research, 12(1), 1997, pp. 175-188
LATERALLY RESOLVED MEASUREMENTS OF POLYCRYSTALLINE CESIUM IODIDE SURFACES
Authors: RUDOLF P MARCHAL F SPORKEN R CAUDANO R DELLORTO T ALMEIDA J BRAEM A PIUZ F SGOBBA S PAIC G NAPPI E VALENTINI A SARTORI P COLUZZA C
Citation: P. Rudolf et al., LATERALLY RESOLVED MEASUREMENTS OF POLYCRYSTALLINE CESIUM IODIDE SURFACES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 387(1-2), 1997, pp. 163-170
PHOTOEMISSION-STUDY OF CDTE GROWTH ON GASB(111)A
Authors: VANGEMMEREN T JOHNSON RL SPORKEN R THIRY PA
Citation: T. Vangemmeren et al., PHOTOEMISSION-STUDY OF CDTE GROWTH ON GASB(111)A, Surface science, 377(1-3), 1997, pp. 882-886
BINARY THIN-FILMS DEPOSITED BY ION-BEAMS - SIMPLE ESTIMATE OF THE NEAR-SURFACE AND BULK COMPOSITION
Authors: GRIGOROV GI GRIGOROV KG VIGNES JL LANGERON JP SPORKEN R
Citation: Gi. Grigorov et al., BINARY THIN-FILMS DEPOSITED BY ION-BEAMS - SIMPLE ESTIMATE OF THE NEAR-SURFACE AND BULK COMPOSITION, Le Vide, 52(280), 1996, pp. 244
FACTOR-ANALYSIS IN AES - MINUTES OF THE N FWO MEETING, IN ZELLIK, BELGIUM
Authors: SPORKEN R
Citation: R. Sporken, FACTOR-ANALYSIS IN AES - MINUTES OF THE N FWO MEETING, IN ZELLIK, BELGIUM, Le Vide, 52(279), 1996, pp. 92
UPDATING OF THE CONTROL-SYSTEM OF A SCANN ING AUGER MICROPROBE PHI-595
Authors: MARCHAL F LOUETTE P SPORKEN R VELDEKENS JF CAUDANO R
Citation: F. Marchal et al., UPDATING OF THE CONTROL-SYSTEM OF A SCANN ING AUGER MICROPROBE PHI-595, Le Vide, 52(279), 1996, pp. 103-104
AUGER AND XPS ANALYSIS OF THE TIO SI INTE RFACE/
Authors: GRIGOROV K SPORKEN R RIGA J CAUDANO R BOUCHIER D GRIGOROV GI
Citation: K. Grigorov et al., AUGER AND XPS ANALYSIS OF THE TIO SI INTE RFACE/, Le Vide, 52(279), 1996, pp. 121-124
ION-INDUCED DENSIFICATION OF PVD FILMS - A CHOICE OF THE OPTIMUM DENSITY OF ION-BOMBARDMENT
Authors: GRIGOROV GI GRIGOROV KG SPORKEN R CAUDANO R
Citation: Gi. Grigorov et al., ION-INDUCED DENSIFICATION OF PVD FILMS - A CHOICE OF THE OPTIMUM DENSITY OF ION-BOMBARDMENT, Applied physics A: Materials science & processing, 63(4), 1996, pp. 399-401
ULTRA-THIN ALAS FILMS ON GAAS(001) INVESTIGATED BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
Authors: GUYAUX JL LAMBIN P LANGE MD SPORKEN R THIRY PA CAUDANO R
Citation: Jl. Guyaux et al., ULTRA-THIN ALAS FILMS ON GAAS(001) INVESTIGATED BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Applied surface science, 104, 1996, pp. 601-607
RBF GE(111) INTERFACE FORMATION STUDIED BY LEED, XPS, AND UPS/
Authors: WIAME F YU LM SPORKEN R THIRY PA CAUDANO R LANGLAIS V BELKHIR H DEBEVER JM
Citation: F. Wiame et al., RBF GE(111) INTERFACE FORMATION STUDIED BY LEED, XPS, AND UPS/, Physical review. B, Condensed matter, 54(7), 1996, pp. 4480-4483
INTERFACE PROPERTIES AND VALENCE-BAND DISCONTINUITY OF MNS ZNSE HETEROSTRUCTURES/
Authors: WANG L SIVANANTHAN S SPORKEN R CAUDANO R
Citation: L. Wang et al., INTERFACE PROPERTIES AND VALENCE-BAND DISCONTINUITY OF MNS ZNSE HETEROSTRUCTURES/, Physical review. B, Condensed matter, 54(4), 1996, pp. 2718-2722
PHOTOEMISSION-STUDY OF THE BI CUO INTERFACE
Authors: CONARD T SPORKEN R GHIJSEN J YU LM CAUDANO R SEEMANN R JOHNSON RL
Citation: T. Conard et al., PHOTOEMISSION-STUDY OF THE BI CUO INTERFACE, Surface science, 369(1-3), 1996, pp. 177-184
ELECTRON-SPECTROSCOPY STUDY OF THE CU SRTIO3(100) INTERFACE/
Authors: CONARD T ROUSSEAU AC YU LM GHIJSEN J SPORKEN R CAUDANO R JOHNSON RL
Citation: T. Conard et al., ELECTRON-SPECTROSCOPY STUDY OF THE CU SRTIO3(100) INTERFACE/, Surface science, 359(1-3), 1996, pp. 82-92
MNS ZNSE ON GAAS GROWN BY MOLECULAR-BEAM EPITAXY/
Authors: SIVANANTHAN S WANG L SPORKEN R CHEN J SKROMME BJ SMITH DJ
Citation: S. Sivananthan et al., MNS ZNSE ON GAAS GROWN BY MOLECULAR-BEAM EPITAXY/, Journal of crystal growth, 159(1-4), 1996, pp. 94-98
AFM AND XPS CHARACTERIZATION OF THE SI(111) SURFACE AFTER THERMAL-TREATMENT
Authors: LAMONTAGNE B GUAY D ROY D SPORKEN R CAUDANO R
Citation: B. Lamontagne et al., AFM AND XPS CHARACTERIZATION OF THE SI(111) SURFACE AFTER THERMAL-TREATMENT, Applied surface science, 90(4), 1995, pp. 481-487
IDENTIFICATION OF THE ADSORPTION SITES OF MOLECULAR-OXYGEN ON SI(111)USING XPS
Authors: LAMONTAGNE B ROY D SPORKEN R CAUDANO R
Citation: B. Lamontagne et al., IDENTIFICATION OF THE ADSORPTION SITES OF MOLECULAR-OXYGEN ON SI(111)USING XPS, Progress in Surface Science, 50(1-4), 1995, pp. 315-324
EPITAXIAL-GROWTH OF GASB(111) ON SB(111) BY INTERDIFFUSION ASSISTED MOLECULAR-BEAM EPITAXY
Authors: GUYAUX JL SPORKEN R CAUDANO R WAGNER V GEURTS J ESSER N RICHTER W
Citation: Jl. Guyaux et al., EPITAXIAL-GROWTH OF GASB(111) ON SB(111) BY INTERDIFFUSION ASSISTED MOLECULAR-BEAM EPITAXY, Surface science, 338(1-3), 1995, pp. 204-210
CHEMICAL INTERACTIONS AT THE INTERFACE BETWEEN ALUMINUM NITRIDE AND IRON-OXIDE DETERMINED BY XPS
Authors: MALENGREAU F HAUTIER V VERMEERSCH M SPORKEN R CAUDANO R
Citation: F. Malengreau et al., CHEMICAL INTERACTIONS AT THE INTERFACE BETWEEN ALUMINUM NITRIDE AND IRON-OXIDE DETERMINED BY XPS, Surface science, 330(1), 1995, pp. 75-85
INFLUENCE OF INTERFACIAL DISORDER ON THE ELECTRON-ENERGY-LOSS SPECTRUM OF ULTRA-THIN ALAS FILMS ON GAAS(001)
Authors: GUYAUX JL LANGE MD SPORKEN R THIRY PA CAUDANO R SENET P LAMBIN P
Citation: Jl. Guyaux et al., INFLUENCE OF INTERFACIAL DISORDER ON THE ELECTRON-ENERGY-LOSS SPECTRUM OF ULTRA-THIN ALAS FILMS ON GAAS(001), Surface science, 328(3), 1995, pp. 566-570
Risultati: 1-25 | 26-34