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Results: 1-9 |
Results: 9
X-RAY CHARACTERIZATION OF BURIED ALLOTAXIALLY GROWN COSI2 LAYERS IN SI(100)
Authors: ZIMMERMANN U SCHLOMKA JP TOLAN M STETTNER J PRESS W HACKE M MANTL S
Citation: U. Zimmermann et al., X-RAY CHARACTERIZATION OF BURIED ALLOTAXIALLY GROWN COSI2 LAYERS IN SI(100), Journal of applied physics, 83(11), 1998, pp. 5823-5830
KARDAR-PARISI-ZHANG GROWTH OF AMORPHOUS-SILICON ON SI SIO2/
Authors: LUTT M SCHLOMKA JP TOLAN M STETTNER J SEECK OH PRESS W
Citation: M. Lutt et al., KARDAR-PARISI-ZHANG GROWTH OF AMORPHOUS-SILICON ON SI SIO2/, Physical review. B, Condensed matter, 56(7), 1997, pp. 4085-4091
ROUGHNESS OF SURFACES AND INTERFACES
Authors: PRESS W TOLAN M STETTNER J SEECK OH SCHLOMKA JP NITZ V SCHWALOWSKY L MULLERBUSCHBAUM P BAHR D
Citation: W. Press et al., ROUGHNESS OF SURFACES AND INTERFACES, Physica. B, Condensed matter, 221(1-4), 1996, pp. 1-9
CHARACTERIZATION OF SI GE INTERFACES BY DIFFUSE-X-RAY SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/
Authors: SCHLOMKA JP FITZSIMMONS MR PYNN R STETTNER J SEECK OH TOLAN M PRESS W
Citation: Jp. Schlomka et al., CHARACTERIZATION OF SI GE INTERFACES BY DIFFUSE-X-RAY SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/, Physica. B, Condensed matter, 221(1-4), 1996, pp. 44-52
CORRELATIONS IN THE INTERFACE STRUCTURE OF LANGMUIR-BLODGETT-FILMS OBSERVED BY X-RAY-SCATTERING
Authors: NITZ V TOLAN M SCHLOMKA JP SEECK OH STETTNER J PRESS W STELZLE M SACKMANN E
Citation: V. Nitz et al., CORRELATIONS IN THE INTERFACE STRUCTURE OF LANGMUIR-BLODGETT-FILMS OBSERVED BY X-RAY-SCATTERING, Physical review. B, Condensed matter, 54(7), 1996, pp. 5038-5050
INTERFACE STRUCTURE OF MBE-GROWN COSI2 SI/COSI2 LAYERS ON SI(111) - PARTIALLY CORRELATED ROUGHNESS AND DIFFUSE-X-RAY SCATTERING/
Authors: STETTNER J SCHWALOWSKY L SEECK OH TOLAN M PRESS W SCHWARZ C VONKANEL H
Citation: J. Stettner et al., INTERFACE STRUCTURE OF MBE-GROWN COSI2 SI/COSI2 LAYERS ON SI(111) - PARTIALLY CORRELATED ROUGHNESS AND DIFFUSE-X-RAY SCATTERING/, Physical review. B, Condensed matter, 53(3), 1996, pp. 1398-1412
X-RAY-DIFFRACTION FROM SI GE LAYERS - DIFFUSE-SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/
Authors: SCHLOMKA JP TOLAN M SCHWALOWSKY L SEECK OH STETTNER J PRESS W
Citation: Jp. Schlomka et al., X-RAY-DIFFRACTION FROM SI GE LAYERS - DIFFUSE-SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/, Physical review. B, Condensed matter, 51(4), 1995, pp. 2311-2321
X-RAY-DIFFRACTION FROM MESOSCOPIC SYSTEMS
Authors: PRESS W BAHR D TOLAN M BURANDT B MULLER M MULLERBUSCHBAUM P NITZ V STETTNER J
Citation: W. Press et al., X-RAY-DIFFRACTION FROM MESOSCOPIC SYSTEMS, Physica. B, Condensed matter, 198(1-3), 1994, pp. 42-47
X-RAY GRAZING-INCIDENCE DIFFRACTION FROM POLYCRYSTALLINE SB FILMS ON SINGLE-CRYSTAL SUBSTRATES
Authors: FINDEISEN E BRUGEMANN L STETTNER J TOLAN M
Citation: E. Findeisen et al., X-RAY GRAZING-INCIDENCE DIFFRACTION FROM POLYCRYSTALLINE SB FILMS ON SINGLE-CRYSTAL SUBSTRATES, Journal of physics. Condensed matter, 5(44), 1993, pp. 8149-8158
Risultati: 1-9 |