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Results: 1-25/41
Authors:
Park, YG
Shindo, D
Kanekiyo, H
Hirosawa, S
Citation: Yg. Park et al., Analysis of microstructures and magnetic domain structures in Nd-Fe-B nanocomposite magnets by analytical electron microscopy and Lorentz microscopy, MATER TRANS, 42(9), 2001, pp. 1878-1881
Authors:
Lee, CW
Shindo, D
Kijiro, KN
Citation: Cw. Lee et al., Quantitative evaluation of charging on amorphous SiO2 particles by electron holography, MATER TRANS, 42(9), 2001, pp. 1882-1885
Authors:
Lim, SH
Shindo, D
Kang, HB
Nakamura, K
Citation: Sh. Lim et al., Defect structure of epitaxial ZnO films on (0001) sapphire studied by transmission electron microscopy, J VAC SCI B, 19(2), 2001, pp. 506-510
Authors:
Murakami, Y
Shindo, D
Citation: Y. Murakami et D. Shindo, Changes in microstructure near the R-phase transformation in Ti50Ni48Fe2 studied by in-situ electron microscopy, PHIL MAG L, 81(9), 2001, pp. 631-638
Authors:
Shindo, D
Murakami, Y
Ikematsu, Y
Citation: D. Shindo et al., Energy-filtered electron microscopy study on phase transformation of alloys, MAT SCI E A, 312(1-2), 2001, pp. 9-19
Authors:
Hata, S
Mitate, T
Kuwano, N
Matsumura, S
Shindo, D
Oki, K
Citation: S. Hata et al., Short range order structures in fcc-based Ni-Mo studied by high resolutiontransmission electron microscopy with image processing, MAT SCI E A, 312(1-2), 2001, pp. 160-167
Authors:
Yonenaga, I
Lim, SH
Lee, CW
Shindo, D
Citation: I. Yonenaga et al., Atomic arrangement of dislocation defects in GaAs by HREM, MAT SCI E A, 309, 2001, pp. 125-128
Authors:
Lim, SH
Washburn, J
Liliental-Weber, Z
Shindo, D
Citation: Sh. Lim et al., Transmission electron microscopy of threading dislocations in ZnO films grown on sapphire, J VAC SCI A, 19(5), 2001, pp. 2601-2603
Authors:
Lim, SH
Shindo, D
Citation: Sh. Lim et D. Shindo, New source of stacking faults in heteroepitaxial systems, PHYS REV L, 86(17), 2001, pp. 3795-3798
Authors:
Murakami, Y
Shibuya, H
Shindo, D
Citation: Y. Murakami et al., Precursor effects of martensitic transformations in Ti-based alloys studied by electron microscopy with energy filtering, J MICROSC O, 203, 2001, pp. 22-33
Authors:
Nakafuji, A
Murakami, Y
Shindo, D
Citation: A. Nakafuji et al., Effect of diffraction condition on mean free path determination by EELS, J ELEC MICR, 50(1), 2001, pp. 23-28
Authors:
Shibata, T
Ikematsu, Y
Shindo, D
Citation: T. Shibata et al., Elemental mapping using omega-type energy filter and imaging plate, J ELEC MICR, 50(1), 2001, pp. 29-31
Authors:
Lim, SH
Shindo, D
Kang, HB
Nakamura, K
Citation: Sh. Lim et al., Study of defects and interfaces in epitaxial ZnO films on (1 1 (2)over-bar0) Al2O3 grown by electron cyclotron resonance-assisted molecular beam epitaxy, J CRYST GR, 225(2-4), 2001, pp. 202-207
Authors:
Lim, SH
Shindo, D
Kang, HB
Nakamura, K
Citation: Sh. Lim et al., Structural characterization of epitaxial ZnO films grown on (0001) Al2O3 by electron cyclotron resonance-assisted molecular beam epitaxy, J CRYST GR, 225(2-4), 2001, pp. 208-213
Authors:
Shindo, D
Citation: D. Shindo, Materials characterization by analytical electron microscopy, J JPN METAL, 65(5), 2001, pp. 331-331
Authors:
Tachikawa, H
Murakami, Y
Ito, T
Iwasaki, Y
Shindo, D
Citation: H. Tachikawa et al., Microstructural analysis of obliquely evaporated Co-CoO tape using TEM andEELS, J JPN METAL, 65(5), 2001, pp. 349-355
Authors:
Yoshida, M
Yaegashi, T
Murakami, Y
Shindo, D
Takasugi, T
Citation: M. Yoshida et al., Evaluation of microstructures of Nb-Cr-Ti alloy system by means of analytical transmission electron microscopy, J JPN METAL, 65(5), 2001, pp. 389-396
Authors:
Uemichi, R
Ikematsu, Y
Shindo, D
Citation: R. Uemichi et al., Precise evaluation of specimen thickness by convergent-beam electron diffraction technique and electron energy-loss spectroscopy, J JPN METAL, 65(5), 2001, pp. 427-433
Authors:
Oikawa, T
Lee, CW
Kondo, Y
Shindo, D
Konno, K
Citation: T. Oikawa et al., Evaluation of electron beam broadening due to the specimen in analytical electron microscopy, J JPN METAL, 65(5), 2001, pp. 434-436
Authors:
Takagi, T
Ohkubo, T
Hirotsu, Y
Murty, BS
Hono, K
Shindo, D
Citation: T. Takagi et al., Local structure of amorphous Zr70Pd30 alloy studied by electron diffraction, APPL PHYS L, 79(4), 2001, pp. 485-487
Authors:
Shindo, D
Ikematsu, Y
Lim, SH
Yonenaga, I
Citation: D. Shindo et al., Digital electron microscopy on advanced materials, MATER CHAR, 44(4-5), 2000, pp. 375-384
Authors:
Hata, S
Shindo, D
Mitate, T
Kuwano, N
Matsumura, S
Oki, K
Citation: S. Hata et al., HRTEM image contrast of short range order in Ni4Mo, MICRON, 31(5), 2000, pp. 533-538
Authors:
Yonenaga, I
Lim, SH
Shindo, D
Citation: I. Yonenaga et al., Dislocation dissociation and stacking-fault energies in Ge1-xSix alloys, PHIL MAG L, 80(4), 2000, pp. 193-197
Authors:
Lee, CW
Ikematsu, Y
Shindo, D
Citation: Cw. Lee et al., Thickness measurement of amorphous SiO2 by EELS and electron holography, MATER T JIM, 41(9), 2000, pp. 1129-1131
Authors:
Park, YG
Shindo, D
Okada, M
Citation: Yg. Park et al., Magnetic domain structures of Nd-Fe-B based permanent magnets studied by electron holography and Lorentz microscopy, MATER T JIM, 41(9), 2000, pp. 1132-1135