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Results: 1-25 | 26-28
Results: 1-25/28
Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle X-ray scattering
Authors: Roch, T Holy, V Stangl, J Hoflinger, E Daniel, A Bauer, G Kegel, I Metzger, H Zhu, J Brunner, K Abstreiter, G
Citation: T. Roch et al., Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle X-ray scattering, PHYS ST S-B, 224(1), 2001, pp. 241-245
Diffusion enhanced carbon loss from SiGeC layers due to oxidation - art. no. 073308
Authors: Carroll, MS Sturm, JC Napolitani, E De Salvador, D Berti, M Stangl, J Bauer, G Tweet, DJ
Citation: Ms. Carroll et al., Diffusion enhanced carbon loss from SiGeC layers due to oxidation - art. no. 073308, PHYS REV B, 6407(7), 2001, pp. 3308
Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires - art. no. 205318
Authors: Holy, V Roch, T Stangl, J Daniel, A Bauer, G Metzger, TH Zhu, YH Brunner, K Abstreiter, G
Citation: V. Holy et al., Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires - art. no. 205318, PHYS REV B, 6320(20), 2001, pp. 5318
Local lattice distortion in Si1-x-yGexCy epitaxial layers from x-ray absorption fine structure - art. no. 045314
Authors: De Salvador, D Tormen, M Berti, M Drigo, AV Romanato, F Boscherini, F Stangl, J Zerlauth, S Bauer, G Colombo, L Mobilio, S
Citation: D. De Salvador et al., Local lattice distortion in Si1-x-yGexCy epitaxial layers from x-ray absorption fine structure - art. no. 045314, PHYS REV B, 6304(4), 2001, pp. 5314
Determination of strain fields and composition of self-organized quantum dots using x-ray diffraction - art. no. 035318
Authors: Kegel, R Metzger, TH Lorke, A Peisl, J Stangl, J Bauer, G Nordlund, K Schoenfeld, WV Petroff, PM
Citation: R. Kegel et al., Determination of strain fields and composition of self-organized quantum dots using x-ray diffraction - art. no. 035318, PHYS REV B, 6303(3), 2001, pp. 5318
High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices
Authors: Holy, V Stangl, J Springholz, G Pinczolits, M Bauer, G
Citation: V. Holy et al., High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices, J PHYS D, 34(10A), 2001, pp. A1-A5
X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy
Authors: Meduna, M Holy, V Roch, T Stangl, J Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: M. Meduna et al., X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy, J APPL PHYS, 89(9), 2001, pp. 4836-4842
Strain and composition distribution in uncapped SiGe islands from x-ray diffraction
Authors: Stangl, J Daniel, A Holy, V Roch, T Bauer, G Kegel, I Metzger, TH Wiebach, T Schmidt, OG Eberl, K
Citation: J. Stangl et al., Strain and composition distribution in uncapped SiGe islands from x-ray diffraction, APPL PHYS L, 79(10), 2001, pp. 1474-1476
Strain-induced self-organized growth of nanostructures: From step bunchingto ordering in quantum dot superlattices
Authors: Stangl, J Roch, T Holy, V Pinczolits, M Springholz, G Bauer, G Kegel, I Metzger, TH Zhu, J Brunner, K Abstreiter, G Smilgies, D
Citation: J. Stangl et al., Strain-induced self-organized growth of nanostructures: From step bunchingto ordering in quantum dot superlattices, J VAC SCI B, 18(4), 2000, pp. 2187-2192
Metastability of Si1-yCy epilayers under 2 MeV alpha-particle irradiation
Authors: Berti, M De Salvador, D Drigo, AV Petrovich, M Stangl, J Schaffler, F Zerlauth, S Bauer, G Armigliato, A
Citation: M. Berti et al., Metastability of Si1-yCy epilayers under 2 MeV alpha-particle irradiation, MICRON, 31(3), 2000, pp. 285-289
Strain relaxation of graded SiGe buffers grown at very high rates
Authors: Rosenblad, C Stangl, J Muller, E Bauer, G von Kanel, H
Citation: C. Rosenblad et al., Strain relaxation of graded SiGe buffers grown at very high rates, MAT SCI E B, 71, 2000, pp. 20-23
Lateral and vertical ordering of self-assembled PbSe quantum dots studied by high-resolution X-ray diffraction
Authors: Holy, V Stangl, J Springholz, G Pinczolits, M Bauer, G Kegel, I Metzger, TH
Citation: V. Holy et al., Lateral and vertical ordering of self-assembled PbSe quantum dots studied by high-resolution X-ray diffraction, PHYSICA B, 283(1-3), 2000, pp. 65-68
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
Authors: Zhuang, Y Pietsch, U Stangl, J Holy, V Darowski, N Grenzer, J Zerlauth, S Schaffler, F Bauer, G
Citation: Y. Zhuang et al., In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction, PHYSICA B, 283(1-3), 2000, pp. 130-134
Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice
Authors: Stangl, J Holy, V Roch, T Daniel, A Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: J. Stangl et al., Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice, PHYS REV B, 62(11), 2000, pp. 7229-7236
Lattice parameter of Si1-x-yGexCy alloys
Authors: De Salvador, D Petrovich, M Berti, M Romanato, F Napolitani, E Drigo, A Stangl, J Zerlauth, S Muhlberger, M Schaffler, F Bauer, G Kelires, PC
Citation: D. De Salvador et al., Lattice parameter of Si1-x-yGexCy alloys, PHYS REV B, 61(19), 2000, pp. 13005-13013
Structural and optical properties of Si/Si1-xGex wires
Authors: Zhuang, Y Schelling, C Stangl, J Penn, C Senz, S Schaffler, F Roch, T Daniel, A Grenzer, J Pietsch, U Bauer, G
Citation: Y. Zhuang et al., Structural and optical properties of Si/Si1-xGex wires, THIN SOL FI, 369(1-2), 2000, pp. 409-413
Nanometer-scale resolution of strain and interdiffusion in self-assembled InAs/GaAs quantum dots
Authors: Kegel, I Metzger, TH Lorke, A Peisl, J Stangl, J Bauer, G Garcia, JM Petroff, PM
Citation: I. Kegel et al., Nanometer-scale resolution of strain and interdiffusion in self-assembled InAs/GaAs quantum dots, PHYS REV L, 85(8), 2000, pp. 1694-1697
Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy
Authors: Stangl, J Roch, T Bauer, G Kegel, I Metzger, TH Schmidt, OG Eberl, K Kienzle, O Ernst, F
Citation: J. Stangl et al., Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy, APPL PHYS L, 77(24), 2000, pp. 3953-3955
Investigation of beta-SiC precipitation in Si1-yCy epilayers by x-ray scattering at grazing incidence
Authors: Kovats, Z Metzger, TH Peisl, J Stangl, J Muhlberger, M Zhuang, Y Schaffler, F Bauer, G
Citation: Z. Kovats et al., Investigation of beta-SiC precipitation in Si1-yCy epilayers by x-ray scattering at grazing incidence, APPL PHYS L, 76(23), 2000, pp. 3409-3411
X-ray diffraction from quantum wires and quantum dots
Authors: Zhuang, Y Stangl, J Darhuber, AA Bauer, G Mikulik, P Holy, V Darowski, N Pietsch, U
Citation: Y. Zhuang et al., X-ray diffraction from quantum wires and quantum dots, J MAT S-M E, 10(3), 1999, pp. 215-221
Vertical alignment of multilayered quantum dots studied by x-ray grazing-incidence diffraction
Authors: Kegel, I Metzger, TH Peisl, J Stangl, J Bauer, G Smilgies, D
Citation: I. Kegel et al., Vertical alignment of multilayered quantum dots studied by x-ray grazing-incidence diffraction, PHYS REV B, 60(4), 1999, pp. 2516-2521
Structural investigation of Si/SiGe superlattices on vicinal (113) oriented Si
Authors: Stangl, J Holy, V Grim, J Bauer, G Zhu, J Brunner, K Abstreiter, G Kienzle, O Ernst, F
Citation: J. Stangl et al., Structural investigation of Si/SiGe superlattices on vicinal (113) oriented Si, THIN SOL FI, 357(1), 1999, pp. 71-75
High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si
Authors: Stangl, J Holy, V Darhuber, AA Mikulik, P Bauer, G Zhu, J Brunner, K Abstreiter, G
Citation: J. Stangl et al., High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si, J PHYS D, 32(10A), 1999, pp. A71-A74
Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers
Authors: Grim, J Holy, V Kubena, J Stangl, J Darhuber, AA Zerlauth, S Schaffler, F Bauer, G
Citation: J. Grim et al., Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers, J PHYS D, 32(10A), 1999, pp. A216-A219
Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction
Authors: Zhuang, Y Holy, V Stangl, J Darhuber, AA Mikulik, P Zerlauth, S Schaffler, F Bauer, G Darowski, N Lubbert, D Pietsch, U
Citation: Y. Zhuang et al., Strain relaxation in periodic arrays of Si SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction, J PHYS D, 32(10A), 1999, pp. A224-A229
Risultati: 1-25 | 26-28