AAAAAA
Results:
1-14
|
Results: 14
Authors:
Tawara, H
Okuno, K
Fehrenbach, CW
Verzani, C
Stockli, MP
Depaola, BD
Richard, P
Stancil, PC
Citation: H. Tawara et al., Electron-capture processes of low-energy Si3+, Si4+, and Si5+ ions in collisions with helium atoms - art. no. 062701, PHYS REV A, 6306(6), 2001, pp. 2701
Authors:
Sekioka, T
Terasawa, M
Mitamura, T
Stockli, MP
Lehnert, U
Fehrenbach, C
Citation: T. Sekioka et al., Electronic excitation effects on secondary ion emission in highly charged ion-solid interaction, NUCL INST B, 182, 2001, pp. 121-126
Authors:
Krasa, J
Laska, L
Stockli, MP
Fry, D
Citation: J. Krasa et al., Secondary-electron yield from Au induced by highly charged Ta ions, NUCL INST B, 173(3), 2001, pp. 281-286
Authors:
Laska, L
Krasa, J
Stockli, MP
Fehrenbach, CW
Citation: L. Laska et al., Total electron emission from metals due to the impact of highly-charged Xeions with energies up to MeV, CZEC J PHYS, 51(8), 2001, pp. 791-798
Authors:
Mroz, W
Norek, P
Prokopiuk, A
Parys, P
Pfeifer, M
Laska, L
Stockli, MP
Fry, D
Kasuya, K
Citation: W. Mroz et al., Method of processing ion energy distributions using a Thomson parabola ionspectrograph with a microchannelplate image converter camera, REV SCI INS, 71(3), 2000, pp. 1417-1420
Authors:
Mroz, W
Prokopiuk, A
Kozlov, B
Czujko, T
Jozwiak, S
Krzywinski, J
Stockli, MP
Fehrenbach, C
Citation: W. Mroz et al., Quantitative measurements of the chemical composition of unprepared samples, using a reflectron mass analyzer with a microchannelplate detector assembly, REV SCI INS, 71(3), 2000, pp. 1425-1428
Authors:
Stockli, MP
Carnes, K
Cocke, CL
DePaola, BD
Ehrenreich, T
Fehrenbach, C
Fry, D
Gibson, PE
Kelly, S
Lehnert, U
Needham, V
Reiser, I
Richard, P
Tipping, TN
Walch, B
Cuquemelle, A
Doudna, C
Eastman, B
Kentsch, U
Schedler, R
Kobayashi, N
Matsumoto, J
Madzunkov, S
Citation: Mp. Stockli et al., New improvements on the Kansas State University cryogenic electron beam ion source, a user facility for low energy, highly charged ions, REV SCI INS, 71(2), 2000, pp. 902-905
Authors:
Stockli, MP
Lehnert, U
Becker, R
Delferriere, O
Gebel, T
Ullmann, F
Kobayashi, N
Matsumoto, J
Citation: Mp. Stockli et al., Effects of indirect ionization on the charge state distributions observed with highly charged ion sources, REV SCI INS, 71(2), 2000, pp. 1052-1055
Authors:
Mroz, W
Stockli, MP
Fry, D
Prokopiuk, A
Walch, B
Citation: W. Mroz et al., Calibration of the Galileo microchannel plates with the Xe2+-Xe13+ and C2+-C6+ ions in the energy range from 0.5 to 150 keV/q (abstract), REV SCI INS, 71(2), 2000, pp. 1100-1100
Authors:
Krasa, J
Laska, L
Stockli, MP
Fry, D
Citation: J. Krasa et al., Electron yield per ion charge-state correction for an ion collector with unsuppressed secondary electron emission, CZEC J PHYS, 50(7), 2000, pp. 797-802
Authors:
Mroz, W
Fry, D
Stockli, MP
Winecki, S
Citation: W. Mroz et al., Micro channel plate gains for Ta10+-Ta44+ ions, measured in the energy range from 3.7 keV/q up to 150.7 keV/q, NUCL INST A, 437(2-3), 1999, pp. 335-345
Authors:
Krasa, J
Pfeifer, M
Stockli, MP
Lehnert, U
Fry, D
Citation: J. Krasa et al., The effect of the first dynode's geometry on the detection efficiency of a119EM electron multiplier used as a highly charged ion detector, NUCL INST B, 152(2-3), 1999, pp. 397-402
Authors:
Lehnert, U
Stockli, MP
Cocke, CL
Citation: U. Lehnert et al., X-ray emission for Ar ions impacting on SiO2, J PHYS B, 31(23), 1998, pp. 5117-5122
Authors:
Sekioka, T
Terasawa, M
Mitamura, T
Stockli, MP
Lehnert, U
Cocke, CL
Citation: T. Sekioka et al., Electronic excitation effect in the sputtering of conductive materials bombarded by highly charged heavy ions, NUCL INST B, 146(1-4), 1998, pp. 172-177
Risultati:
1-14
|