Citation: C. Tian et al., MONTE-CARLO SIMULATION OF CLUSTERING OF ALUMINA PARTICLES IN TURBULENT LIQUID ALUMINUM, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 29(4), 1998, pp. 785-791
Citation: C. Tian et W. Vandervorst, EFFECTS OF OXYGEN FLOODING ON SPUTTERING AND IONIZATION PROCESSES DURING ION-BOMBARDMENT, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 452-459
Citation: Xf. Cao et C. Tian, BACKLUND-TRANSFORMATIONS ON SURFACES WITH (K(1)-M)(K(2)-M)=+ -L(2) INR-2,R-1/, Journal of physics. A, mathematical and general, 30(17), 1997, pp. 6009-6020
Authors:
HOBLER G
SIMIONESCU A
PALMETSHOFER L
JAHNEL F
VONCRIEGERN R
TIAN C
STINGEDER G
Citation: G. Hobler et al., VERIFICATION OF MODELS FOR THE SIMULATION OF BORON IMPLANTATION INTO CRYSTALLINE SILICON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 272-277
Citation: M. Costa et al., AFM NANOSCOPY - IN-SITU CHARACTERIZATION OF THE STRUCTURAL EVOLUTION OF POLY(3-METHYL-THIOPHENE) DURING DOPING, Journal de chimie physique et de physico-chimie biologique, 92(4), 1995, pp. 939-942
Citation: F. Chao et al., MODIFICATION OF POLY(3-METHYLTHIOPHENE) (PMET) STRUCTURE DURING ELECTROCHEMICAL DOPING-UNDOPING, STUDIED BY IN-SITU ATOMIC-FORCE MICROSCOPY(ECAFM), Synthetic metals, 75(2), 1995, pp. 85-94
Authors:
SIMIONESCU A
HERZOG S
HOBLER G
SCHORK R
LORENZ J
TIAN C
STINGEDER G
Citation: A. Simionescu et al., MODELING OF ELECTRONIC STOPPING AND DAMAGE ACCUMULATION DURING ARSENIC IMPLANTATION IN SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 100(4), 1995, pp. 483-489
Authors:
HOBLER G
SIMIONESCU A
PALMETSHOFER L
TIAN C
STINGEDER G
Citation: G. Hobler et al., BORON CHANNELING IMPLANTATIONS IN SILICON - MODELING OF ELECTRONIC STOPPING AND DAMAGE ACCUMULATION, Journal of applied physics, 77(8), 1995, pp. 3697-3703
Citation: Lt. Gutman et al., TUBERCULOSIS IN HUMAN IMMUNODEFICIENCY VIRUS-EXPOSED OR VIRUS-INFECTED UNITED-STATES CHILDREN, The Pediatric infectious disease journal, 13(11), 1994, pp. 963-968
Citation: F. Chao et al., AFM CHARACTERIZATION OF STRUCTURAL-CHANGE S IN POLYMETHYLTHIOPHENE DURING ELECTROCHEMICAL DEPOSITION AND DOPING, Analusis, 22(8), 1994, pp. 130000032-130000034
Citation: L. Gutman et al., TUBERCULOSIS (TBC) IN HIV-EXPOSED OR INFECTED UNITED-STATES CHILDREN, Pediatric research, 35(4), 1994, pp. 10000181-10000181
Citation: F. Chao et al., ROLE OF POLY-3-METHYLTHIOPHENE STRUCTURE DETERMINED BY AFM ON THE DIELECTRIC-CONSTANT SPECTRA, Electrochimica acta, 39(2), 1994, pp. 197-209
Citation: C. Tian et al., OPTICAL-SPECTRA OF A CONDUCTING POLYMER (POLYMETHYL-3-THIOPHENE) AT SEVERAL STAGES OF THE ELECTRODEPOSITION PROCESS, Thin solid films, 233(1-2), 1993, pp. 91-95