AAAAAA

   
Results: 1-9 |
Results: 9
Charge separation technique for metal-oxide-silicon capacitors in the presence of hydrogen deactivated dopants
Authors: Witczak, SC Winokur, PS Lacoe, RC Mayer, DC
Citation: Sc. Witczak et al., Charge separation technique for metal-oxide-silicon capacitors in the presence of hydrogen deactivated dopants, J APPL PHYS, 87(11), 2000, pp. 8206-8208
Correlation between Co-60 and X-ray radiation-induced charge buildup in silicon-on-insulator buried oxides
Authors: Schwank, JR Shaneyfelt, MR Dodd, PE Ferlet-Cavrois, V Loemker, RA Winokur, PS Fleetwood, DM Paillet, P Leray, JL Draper, BL Witczak, SC Riewe, LC
Citation: Jr. Schwank et al., Correlation between Co-60 and X-ray radiation-induced charge buildup in silicon-on-insulator buried oxides, IEEE NUCL S, 47(6), 2000, pp. 2175-2182
Implications of radiation-induced dopant deactivation for npn bipolar junction transistors
Authors: Witczak, SC Lacoe, RC Shaneyfelt, MR Mayer, DC Schwank, JR Winokur, PS
Citation: Sc. Witczak et al., Implications of radiation-induced dopant deactivation for npn bipolar junction transistors, IEEE NUCL S, 47(6), 2000, pp. 2281-2288
Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs
Authors: Shaneyfelt, MR Schwank, JR Witczak, SC Fleetwood, DM Pease, RL Winokur, PS Riewe, LC Hash, GL
Citation: Mr. Shaneyfelt et al., Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs, IEEE NUCL S, 47(6), 2000, pp. 2539-2545
Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response
Authors: Barnaby, HJ Schrimpf, RD Pease, RL Cole, P Turflinger, T Krieg, J Titus, J Emily, D Gehlhausen, M Witczak, SC Maher, MC Van Nort, D
Citation: Hj. Barnaby et al., Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response, IEEE NUCL S, 46(6), 1999, pp. 1666-1673
Space charge limited degradation of bipolar oxides at low electric fields
Authors: Witczak, SC Lacoe, RC Mayer, DC Fleetwood, DM Schrimpf, RD Galloway, KF
Citation: Sc. Witczak et al., Space charge limited degradation of bipolar oxides at low electric fields, IEEE NUCL S, 45(6), 1998, pp. 2339-2351
Modeling low-dose-rate effects in irradiated bipolar-base oxides
Authors: Graves, RJ Cirba, CR Schrimpf, RD Milanowski, RJ Michez, A Fleetwood, DM Witczak, SC Saigne, F
Citation: Rj. Graves et al., Modeling low-dose-rate effects in irradiated bipolar-base oxides, IEEE NUCL S, 45(6), 1998, pp. 2352-2360
Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator
Authors: Pease, RL McClure, S Gorelick, J Witczak, SC
Citation: Rl. Pease et al., Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator, IEEE NUCL S, 45(6), 1998, pp. 2571-2576
Moderated degradation enhancement of lateral pnp transistors due to measurement bias
Authors: Witczak, SC Schrimpf, RD Barnaby, HJ Lacoe, RC Mayer, DC Galloway, KF Pease, RL Fleetwood, DM
Citation: Sc. Witczak et al., Moderated degradation enhancement of lateral pnp transistors due to measurement bias, IEEE NUCL S, 45(6), 1998, pp. 2644-2648
Risultati: 1-9 |