Citation: Pm. Amirtharaj et Ib. Bhat, 1997 US WORKSHOP ON THE PHYSICS AND CHEMISTRY OF II-VI MATERIALS - FOREWORD, Journal of electronic materials, 27(6), 1998, pp. 489-489
Citation: We. Spicer, THE ORGANIZATION OF THE MCT WORKSHOP - AN INNOVATIVE APPROACH TO UNIVERSITIES, INDUSTRY, AND GOVERNMENT WORKING TOGETHER, Journal of electronic materials, 27(6), 1998, pp. 490-493
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JENSEN JE
ROTH JA
BREWER PD
OLSON GL
DUBRAY JJ
WU OK
RAJAVEL RD
DELYON TJ
Citation: Je. Jensen et al., INTEGRATED MULTISENSOR CONTROL OF II-VI MBE FOR GROWTH OF COMPLEX IR DETECTOR STRUCTURES, Journal of electronic materials, 27(6), 1998, pp. 494-499
Authors:
ALMEIDA LA
JOHNSON JN
BENSON JD
DINAN JH
JOHS B
Citation: La. Almeida et al., AUTOMATED COMPOSITIONAL CONTROL OF HG1-XCDXTE DURING MBE, USING IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Journal of electronic materials, 27(6), 1998, pp. 500-503
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VYDYANATH HR
AQARIDEN F
WIJEWARNASURIYA PS
SIVANATHAN S
CHAMBERS G
BECKER L
Citation: Hr. Vydyanath et al., ANALYSIS OF THE VARIATION IN THE COMPOSITION AS A FUNCTION OF GROWTH-PARAMETERS IN THE MBE GROWTH OF INDIUM-DOPED HG1-XCDXTE, Journal of electronic materials, 27(6), 1998, pp. 504-506
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VYDYANATH HR
AQARIDEN F
WIJEWARNASURIYA PS
SIVANANTHAN S
NATHAN V
Citation: Hr. Vydyanath et al., OBSERVATION OF PREVALENCE OF QUASI-EQUILIBRIUM IN THE MBE GROWTH OF HG1-XCDXTE, Journal of electronic materials, 27(6), 1998, pp. 507-509
Citation: S. Dakshinamurthy et I. Bhat, MONITORING OF CDTE ATOMIC LAYER EPITAXY USING IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Journal of electronic materials, 27(6), 1998, pp. 521-526
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KOJIMA K
MORI K
KUBOTA Y
NIMURA T
INUKAI F
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Citation: K. Yasuda et al., ELECTRICAL AND OPTICAL-PROPERTIES OF IODINE-DOPED CDZNTE LAYERS GROWNBY METALORGANIC VAPOR-PHASE EPITAXY, Journal of electronic materials, 27(6), 1998, pp. 527-531
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GERSCHUTZ J
PFEUFFERJESCHKE A
HELLMIG R
BECKER CR
LANDWEHR G
Citation: F. Goschenhofer et al., INVESTIGATION OF IODINE AS A DONOR IN MBE GROWN HG1-XCDXTE, Journal of electronic materials, 27(6), 1998, pp. 532-535
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DESTEFANIS G
Citation: Jp. Zanatta et al., HETEROEPITAXY OF HGCDTE (211)B ON GE SUBSTRATES BY MOLECULAR-BEAM EPITAXY FOR INFRARED DETECTORS, Journal of electronic materials, 27(6), 1998, pp. 542-545
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WIJEWARNASURIYA PS
ZANDIAN M
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MCLEVIGE WV
CHEN CA
PASKO JG
HILDEBRANDT G
CHEN AC
ARIAS JM
DSOUZA AI
RUJIRAWAT S
SIVANATHAN S
Citation: Ps. Wijewarnasuriya et al., MBE P-ON-N HG1-XCDXTE HETEROSTRUCTURE DETECTORS ON SILICON SUBSTRATES, Journal of electronic materials, 27(6), 1998, pp. 546-549
Authors:
DELYON TJ
RAJAVEL RD
VIGIL JA
JENSEN JE
WU OK
COCKRUM CA
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VENZOR GM
BAILEY SL
KASAI I
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SMITH MS
Citation: Tj. Delyon et al., MOLECULAR-BEAM EPITAXIAL-GROWTH OF HGCDTE INFRARED FOCAL-PLANE ARRAYSON SILICON SUBSTRATES FOR MIDWAVE INFRARED APPLICATIONS, Journal of electronic materials, 27(6), 1998, pp. 550-555
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RAGHOTHAMACHAR B
CHUNG H
DUDLEY M
LARSON DJ
Citation: B. Raghothamachar et al., EFFECT OF CONSTRAINED GROWTH ON DEFECT STRUCTURES IN MICROGRAVITY GROWN ON CDZNTE BOULES, Journal of electronic materials, 27(6), 1998, pp. 556-563
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PRICE SL
HETTICH HL
SEN S
CURRIE MC
RHIGER DR
MCLEAN EO
Citation: Sl. Price et al., PROGRESS IN CDZNTE SUBSTRATE PRODUCIBILITY AND CRITICAL DRIVERS OF IRFPA YIELD ORIGINATING WITH CDZNTE SUBSTRATES, Journal of electronic materials, 27(6), 1998, pp. 564-572
Citation: Ma. Berding et al., LITHIUM, SODIUM, AND COPPER IN HG0.78CD0.22TE AND CDTE-BASED SUBSTRATES, Journal of electronic materials, 27(6), 1998, pp. 573-578
Authors:
TANAKA N
OZAKI K
NISHINO H
EBE H
MIYAMOTO Y
Citation: N. Tanaka et al., ELECTRICAL-PROPERTIES OF HGCDTE EPILAYERS DOPED WITH SILVER USING AN AGNO3 SOLUTION, Journal of electronic materials, 27(6), 1998, pp. 579-582
Citation: Bl. Williams et al., MERCURY INTERSTITIAL GENERATION IN ION-IMPLANTED MERCURY CADMIUM TELLURIDE, Journal of electronic materials, 27(6), 1998, pp. 583-588