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Authors: BLACKBURN DL COURTOIS B
Citation: Dl. Blackburn et B. Courtois, FOREWORD - THERMAL INVESTIGATIONS OF ICS AND MICROSTRUCTURES (THERMINIC), IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 397-398

Authors: SZEKELY V MARTA C RENCZ M VEGH G BENEDEK Z TOROK S
Citation: V. Szekely et al., A THERMAL BENCHMARK CHIP - DESIGN AND APPLICATIONS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 399-405

Authors: RZEPKA S BANERJEE K MEUSEL E HU CM
Citation: S. Rzepka et al., CHARACTERIZATION OF SELF-HEATING IN ADVANCED VLSI INTERCONNECT LINES BASED ON THERMAL FINITE-ELEMENT SIMULATION, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 406-411

Authors: RAAD PE WILSON JS PRICE DC
Citation: Pe. Raad et al., ADAPTIVE MODELING OF THE TRANSIENTS OF SUBMICRON INTEGRATED-CIRCUITS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 412-417

Authors: DECOGAN D
Citation: D. Decogan, PROPAGATION ANALYSIS FOR THERMAL MODELING, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 418-423

Authors: SUSZYNSKI Z MALINSKI M BYCHTO L
Citation: Z. Suszynski et al., THERMAL PARAMETERS MEASUREMENT METHOD OF ELECTRONICS MATERIALS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 424-433

Authors: SUSZYNSKI Z
Citation: Z. Suszynski, PHOTOTHERMAL EXAMINATION OF ADHESION IN SEMICONDUCTOR-DEVICES, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 434-440

Authors: RAVINDRA NM ABEDRABBO S GOKCE OH TONG FM PATEL A VELAGAPUDI R WILLIAMSON GD MASZARA WP
Citation: Nm. Ravindra et al., RADIATIVE PROPERTIES OF SIMOX, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 441-449

Authors: WONG CP SHI SHH JEFFERSON G
Citation: Cp. Wong et al., HIGH-PERFORMANCE NO-FLOW UNDERFILLS FOR LOW-COST FLIP-CHIP APPLICATIONS - MATERIAL CHARACTERIZATION, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 450-458

Authors: EVANS J EVANS JY
Citation: J. Evans et Jy. Evans, PACKAGING FACTORS AFFECTING THE FATIGUE LIFE OF POWER TRANSISTOR DIE BONDS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 459-468

Authors: SIHLBOM R DERNEVIK M LAI ZH STARSKI JP LIU JH
Citation: R. Sihlbom et al., CONDUCTIVE ADHESIVES FOR HIGH-FREQUENCY APPLICATIONS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 469-477

Authors: SIHLBOM R DERNEVIK M LINDGREN M STARSKI JP LAI ZH LIU JH
Citation: R. Sihlbom et al., HIGH-FREQUENCY MEASUREMENTS AND SIMULATIONS ON WIRE-BONDED MODULES ONTHE SEQUENTIAL BUILDUP BOARDS (SBUS), IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 478-491

Authors: CAMPBELL CK VANWYK JD HOLM MFK
Citation: Ck. Campbell et al., DEVELOPMENT OF LARGE-AREA BATIO3 CERAMICS WITH OPTIMIZED DEPLETION REGIONS AS DIELECTRICS FOR PLANAR POWER ELECTRONICS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 492-499

Authors: TIMSIT RS BOCK EM CORMAN NE
Citation: Rs. Timsit et al., EFFECT OF SURFACE REACTIVITY OF LUBRICANTS ON THE PROPERTIES OF ALUMINUM ELECTRICAL CONTACTS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 500-505

Authors: KURABAYASHI K GOODSON KE
Citation: K. Kurabayashi et Ke. Goodson, PRECISION-MEASUREMENT AND MAPPING OF DIE-ATTACH THERMAL-RESISTANCE, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 506-514

Authors: JACOBSON DM SANGHA SPS
Citation: Dm. Jacobson et Sps. Sangha, A NOVEL LIGHTWEIGHT MICROWAVE PACKAGING TECHNOLOGY, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 515-520

Authors: LEE SB KATZ A HILLMAN C
Citation: Sb. Lee et al., GETTING THE QUALITY AND RELIABILITY TERMINOLOGY STRAIGHT, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(3), 1998, pp. 521-523

Authors: MORRIS JE LIU J
Citation: Je. Morris et J. Liu, POLYMERIC ELECTRONICS PACKAGING - FOREWORD, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 206-207

Authors: KRISTIANSEN H LIU J
Citation: H. Kristiansen et J. Liu, OVERVIEW OF CONDUCTIVE ADHESIVE INTERCONNECTION TECHNOLOGIES FOR LCDS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 208-214

Authors: JAGT JC
Citation: Jc. Jagt, RELIABILITY OF ELECTRICALLY CONDUCTIVE ADHESIVE JOINTS FOR SURFACE-MOUNT APPLICATIONS - A SUMMARY OF THE STATE-OF-THE-ART, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 215-225

Authors: YIM MJ PAIK KW
Citation: Mj. Yim et Kw. Paik, DESIGN AND UNDERSTANDING OF ANISOTROPIC CONDUCTIVE FILMS (ACF) FOR LCD PACKAGING, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 226-234

Authors: OGUIBE CN MANNAN SH WHALLEY DC WILLIAMS DJ
Citation: Cn. Oguibe et al., CONDUCTION MECHANISMS IN ANISOTROPIC CONDUCTING ADHESIVE ASSEMBLY, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 235-242

Authors: BEHNER U HAUG R SCHUTZ R HARTNAGEL HL
Citation: U. Behner et al., CHARACTERIZATION OF ANISOTROPICALLY CONDUCTIVE ADHESIVE INTERCONNECTIONS BY 1 F NOISE MEASUREMENTS/, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 243-247

Authors: WANG XT WANG YL CHEN GL LIU J LAI ZH
Citation: Xt. Wang et al., QUANTITATIVE ESTIMATE OF THE CHARACTERISTICS OF CONDUCTIVE PARTICLES IN ACA BY USING NANO INDENTER, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 248-251

Authors: SUZUKI K SUZUKI O KOMAGATA M
Citation: K. Suzuki et al., CONDUCTIVE ADHESIVE MATERIALS FOR LEAD SOLDER REPLACEMENT, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(2), 1998, pp. 252-258
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