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Results: 26-50/62
Authors:
AUCIELLO O
RAMESH R
Citation: O. Auciello et R. Ramesh, ELECTROCERAMIC THIN-FILMS .2. DEVICE APPLICATIONS, MRS bulletin, 21(7), 1996, pp. 29-29
Authors:
AUCIELLO O
RAMESH R
Citation: O. Auciello et R. Ramesh, ELECTROCERAMIC THIN-FILMS .1. PROCESSING, MRS bulletin, 21(6), 1996, pp. 21-21
Authors:
AUCIELLO O
KINGON AI
KRUPANIDHI SB
Citation: O. Auciello et al., SPUTTER SYNTHESIS OF FERROELECTRIC-FILMS AND HETEROSTRUCTURES, MRS bulletin, 21(6), 1996, pp. 25-30
Authors:
AUCIELLO O
RAMESH R
Citation: O. Auciello et R. Ramesh, LASER-ABLATION DEPOSITION AND CHARACTERIZATION OF FERROELECTRIC CAPACITORS FOR NONVOLATILE MEMORIES, MRS bulletin, 21(6), 1996, pp. 31-36
Authors:
LEE JK
JUNG HJ
AUCIELLO O
KINGON AI
Citation: Jk. Lee et al., ELECTRICAL CHARACTERIZATION OF PT SRBI2TA2O9/PT CAPACITORS FABRICATEDBY THE PULSED-LASER ABLATED DEPOSITION TECHNIQUE/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 900-904
Authors:
DAT R
AUCIELLO O
KINGON AI
Citation: R. Dat et al., SURFACE-ROUGHNESS OF PBZRXTI1-XO3 THIN-FILMS PRODUCED BY PULSED-LASERABLATION-DEPOSITION, Thin solid films, 283(1-2), 1996, pp. 45-48
Authors:
GRUVERMAN A
AUCIELLO O
TOKUMOTO H
Citation: A. Gruverman et al., NANOSCALE INVESTIGATION OF FATIGUE EFFECTS IN PB(ZR,TI)O-3 FILMS, Applied physics letters, 69(21), 1996, pp. 3191-3193
Authors:
AUCIELLO O
KRAUSS AR
IM J
GRUEN DM
IRENE EA
CHANG RPH
MCGUIRE GE
Citation: O. Auciello et al., STUDIES OF FILM GROWTH-PROCESSES AND SURFACE STRUCTURAL CHARACTERIZATION OF FERROELECTRIC MEMORY-COMPATIBLE SRBI2TA2O9 LAYERED PEROVSKITES VIA IN-SITU, REAL-TIME ION-BEAM ANALYSIS, Applied physics letters, 69(18), 1996, pp. 2671-2673
LEAD-ZIRCONATE-TITANATE FERROELECTRIC CAPACITORS PRODUCED ON SAPPHIREAND GALLIUM-ARSENIDE SUBSTRATES
Authors:
DAT R
LICHTENWALNER DJ
AUCIELLO O
KINGON AI
Citation: R. Dat et al., LEAD-ZIRCONATE-TITANATE FERROELECTRIC CAPACITORS PRODUCED ON SAPPHIREAND GALLIUM-ARSENIDE SUBSTRATES, Integrated ferroelectrics, 9(4), 1995, pp. 309-316
Authors:
DAT R
AUCIELLO O
KINGON AI
Citation: R. Dat et al., EFFECTS OF TEMPERATURE ON THE FERROELECTRIC PROPERTIES OF PBZR0.53TI0.47O3 BASED CAPACITORS PREPARED BY PULSED LASER-ABLATION DEPOSITION, Integrated ferroelectrics, 9(4), 1995, pp. 333-338
Authors:
LEE J
RAMESH R
KERAMIDAS VG
AUCIELLO O
Citation: J. Lee et al., FERROELECTRIC PROPERTIES AND RELIABILITY OF LA-SR-CO-O PB-LA-ZR-TI-O/LA-SR-CO-O HETEROSTRUCTURES ON SI FOR NONVOLATILE MEMORY APPLICATIONS/, Integrated ferroelectrics, 8(3-4), 1995, pp. 317-333
Authors:
KRAUSS AR
AUCIELLO O
LIN Y
CHANG RPH
GRUEN DM
Citation: Ar. Krauss et al., TIME-OF-FLIGHT PULSED ION-BEAM SURFACE-ANALYSIS AS A MEANS OF IN-SITU, REAL-TIME CHARACTERIZATION OF THE GROWTH OF FERROELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES, Integrated ferroelectrics, 8(1-2), 1995, pp. 129-142
Authors:
ALSHAREEF HN
BELLUR KR
AUCIELLO O
KINGON AI
Citation: Hn. Alshareef et al., ELECTRICAL-PROPERTIES OF PB(ZR0.53TI0.47)O-3 THIN-FILM CAPACITORS WITH MODIFIED RUO2 BOTTOM ELECTRODES, Integrated ferroelectrics, 8(1-2), 1995, pp. 151-163
Authors:
GIFFORD KD
AUCIELLO O
KINGON AI
Citation: Kd. Gifford et al., CONTROL OF ELECTRICAL-PROPERTIES OF ION-BEAM SPUTTER-DEPOSITED PZT-BASED HETEROSTRUCTURE CAPACITORS, Integrated ferroelectrics, 7(1-4), 1995, pp. 195-206
Authors:
CHEN X
KINGON AI
ALSHAREEF HN
BELLUR KR
GIFFORD K
AUCIELLO O
Citation: X. Chen et al., LEAKAGE AND INTERFACE ENGINEERING IN TITANATE THIN-FILMS FOR NONVOLATILE FERROELECTRIC MEMORY AND ULSI DRAMS, Integrated ferroelectrics, 7(1-4), 1995, pp. 291-306
Authors:
AUCIELLO O
GIFFORD KD
LICHTENWALNER DJ
DAT R
ALSHAREEF HN
BELLUR KR
KINGON AI
Citation: O. Auciello et al., A REVIEW OF COMPOSITION-STRUCTURE-PROPERTY RELATIONSHIPS FOR PZT-BASED HETEROSTRUCTURE CAPACITORS, Integrated ferroelectrics, 6(1-4), 1995, pp. 173-187
Authors:
GRAETTINGER TM
LICHTENWALNER DJ
CHOW AF
AUCIELLO O
KINGON AI
MORRIS PA
Citation: Tm. Graettinger et al., PROCESSING THIN-FILMS OF KNBO3 FOR OPTICAL WAVE-GUIDES, Integrated ferroelectrics, 6(1-4), 1995, pp. 363-373
Authors:
CHOW AF
AUCIELLO O
POKER DB
KINGON AI
Citation: Af. Chow et al., INVESTIGATION OF OPTICAL LOSS MECHANISMS IN OXIDE THIN-FILMS, Integrated ferroelectrics, 11(1-4), 1995, pp. 35-45
Authors:
BARNES NR
DAT R
LICHTENWALNER DJ
SCHREINER AF
AUCIELLO O
HANKINS OE
Citation: Nr. Barnes et al., MULTIBAND ANALYSIS OF PHOTOLUMINESCENCE SPECTRA FROM ELECTRONICALLY EXCITED GAS-PHASE SPECIES PRODUCED DURING LASER-ABLATION OF LEAD-OXIDE,ZIRCONIUM-OXIDE, TITANIUM-OXIDE, AND LEAD-ZIRCONATE-TITANATE TARGETS, Chemistry of materials, 7(3), 1995, pp. 477-485
Authors:
AUCIELLO O
KRAUSS AR
Citation: O. Auciello et Ar. Krauss, WHY IN-SITU, REAL-TIME CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES, MRS bulletin, 20(5), 1995, pp. 14-15
TIME-OF-FLIGHT, ION-BEAM SURFACE-ANALYSIS FOR IN-SITU CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES
Authors:
KRAUSS AR
AUCIELLO O
SCHULTZ JA
Citation: Ar. Krauss et al., TIME-OF-FLIGHT, ION-BEAM SURFACE-ANALYSIS FOR IN-SITU CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES, MRS bulletin, 20(5), 1995, pp. 18-23
Authors:
ALSHAREEF HN
BELLUR KR
AUCIELLO O
KINGON AI
Citation: Hn. Alshareef et al., PHASE EVOLUTION AND ANNEALING EFFECTS ON THE ELECTRICAL-PROPERTIES OFPB(ZR0.53TI0.47)O-3 THIN-FILMS WITH RUO2 ELECTRODES, Thin solid films, 256(1-2), 1995, pp. 73-79
Authors:
CHOW AF
LICHTENWALNER DJ
AUCIELLO O
KINGON AI
BUSCH JR
WOOD VE
Citation: Af. Chow et al., 2ND-HARMONIC GENERATION IN POTASSIUM NIOBATE THIN-FILMS, Journal of applied physics, 78(1), 1995, pp. 435-438
Authors:
ALSHAREEF HN
AUCIELLO O
KINGON AI
Citation: Hn. Alshareef et al., ELECTRICAL-PROPERTIES OF FERROELECTRIC THIN-FILM CAPACITORS WITH HYBRID (PT,RUO2) ELECTRODES FOR NONVOLATILE MEMORY APPLICATIONS, Journal of applied physics, 77(5), 1995, pp. 2146-2154
Authors:
DAT R
LEE JK
AUCIELLO O
KINGON AI
Citation: R. Dat et al., PULSED-LASER ABLATION SYNTHESIS AND CHARACTERIZATION OF LAYERED PT SRBI2TA2O9/PT FERROELECTRIC CAPACITORS WITH PRACTICALLY NO POLARIZATION FATIGUE/, Applied physics letters, 67(4), 1995, pp. 572-574