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Results:
1-16
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Results: 16
Authors:
MEDINA AN
GANDRA FG
AZANHA WR
CARDOSO LP
Citation: An. Medina et al., TRANSITION FROM KONDO TO INTERMEDIATE VALENCE REGIME IN (LA1-X,CE-X)NI - AN ESR STUDY, Journal of physics. Condensed matter (Print), 10(43), 1998, pp. 9763-9768
Authors:
MEDINA AN
HAYASHI MA
CARDOSO LP
GAMA S
GANDRA FG
Citation: An. Medina et al., EFFECT OF VOLUME VARIATION ON THE PROPERTIES OF THE KONDO SYSTEM (LA1-XCEX)(3)AL, Physical review. B, Condensed matter, 57(10), 1998, pp. 5900-5905
Authors:
AVANCI LH
HAYASHI MA
CARDOSO LP
MORELHAO SL
RIESZ F
RAKENNUS K
HAKKARAINEN T
Citation: Lh. Avanci et al., MAPPING OF BRAGG-SURFACE DIFFRACTION OF INP GAAS(100) STRUCTURE/, Journal of crystal growth, 188(1-4), 1998, pp. 220-224
Authors:
MORELHAO SL
AVANCI LH
HAYASHI MA
CARDOSO LP
COLLINS SP
Citation: Sl. Morelhao et al., OBSERVATION OF COHERENT HYBRID REFLECTION WITH SYNCHROTRON-RADIATION, Applied physics letters, 73(15), 1998, pp. 2194-2196
Authors:
SASAKI JM
CARDOSO LP
CAMPOS C
ROBERTS KJ
CLARK GF
PANTOS E
SACILOTTI MA
Citation: Jm. Sasaki et al., SYNCHROTRON-RADIATION MULTIPLE DIFFRACTION STUDY OF AL0.304GA0.172IN0.524AS MOVPE GROWN ONTO INP(001), Journal of crystal growth, 172(3-4), 1997, pp. 284-290
Authors:
HAYASHI MA
MORELHAO SL
AVANCI LH
CARDOSO LP
SASAKI JM
KRETLY LC
CHANG SL
Citation: Ma. Hayashi et al., SENSITIVITY OF BRAGG SURFACE DIFFRACTION TO ANALYZE ION-IMPLANTED SEMICONDUCTORS, Applied physics letters, 71(18), 1997, pp. 2614-2616
Authors:
MITTELSTADT FG
FRANCO CV
MUZART J
DESOUZA AR
CARDOSO LP
Citation: Fg. Mittelstadt et al., PLASMA SURFACE-TREATMENT OF AISI-4140 STEEL FOR IMPROVED CORROSION-RESISTANCE, Journal of Materials Science, 31(2), 1996, pp. 431-435
Authors:
SASAKI JM
CARDOSO LP
CAMPOS C
ROBERTS KJ
CLARK GF
PANTOS E
SACILOTTI MA
Citation: Jm. Sasaki et al., USING SYNCHROTRON-RADIATION X-RAY MULTIPLE DIFFRACTION TO EXAMINE THELATTICE COHERENCY OF SEMICONDUCTOR SURFACES AND EPITAXIAL LAYERS, Journal of applied physics, 79(7), 1996, pp. 3492-3498
Authors:
SASAKI JM
CARDOSO LP
CAMPOS C
ROBERTS KJ
CLARK GF
PANTOS E
SACILOTTI MA
Citation: Jm. Sasaki et al., X-RAY MULTIPLE DIFFRACTION IN RENNINGER SCANNING-MODE - SIMULATION OFDATA RECORDED USING SYNCHROTRON-RADIATION, Journal of applied crystallography, 29, 1996, pp. 325-330
Authors:
MORELHAO SL
CARDOSO LP
Citation: Sl. Morelhao et Lp. Cardoso, X-RAY MULTIPLE DIFFRACTION PHENOMENON IN THE EVALUATION OF SEMICONDUCTOR CRYSTALLINE PERFECTION, Journal of applied crystallography, 29, 1996, pp. 446-456
Authors:
MORELHAO SL
AVANCI LH
CARDOSO LP
RIESZ F
RAKENNUS K
HAKKARAINEN T
Citation: Sl. Morelhao et al., STRUCTURAL STUDIES ON INP GAAS HETEROSTRUCTURES USING MULTIPLE X-RAY-DIFFRACTION/, Vacuum, 46(8-10), 1995, pp. 1013-1015
Authors:
COLUCCI CC
GAMA S
RIBEIRO CA
CARDOSO LP
Citation: Cc. Colucci et al., A DETAILED STUDY OF NITRIDE PRECIPITATES IN ND2FE17, Journal of applied physics, 75(10), 1994, pp. 6003-6005
Authors:
GALZERANI JC
OYAMA AM
PIZANI PS
LANDERS R
MORELHAO SL
CARDOSO LP
Citation: Jc. Galzerani et al., AU AND AU-ZN CONTACTS ON P-GASB AND THE CHARACTERISTICS OF THE INTERFACES, Materials science & engineering. B, Solid-state materials for advanced technology, 20(3), 1993, pp. 328-331
Authors:
MORELHAO SL
CARDOSO LP
Citation: Sl. Morelhao et Lp. Cardoso, ANALYSIS OF INTERFACIAL MISFIT DISLOCATION BY X-RAY MULTIPLE DIFFRACTION, Solid state communications, 88(6), 1993, pp. 465-469
Authors:
MORELHAO SL
CARDOSO LP
Citation: Sl. Morelhao et Lp. Cardoso, STRUCTURAL-PROPERTIES OF HETEROEPITAXIAL SYSTEMS USING HYBRID MULTIPLE DIFFRACTION IN RENNINGER SCANS, Journal of applied physics, 73(9), 1993, pp. 4218-4226
Authors:
GAMA S
SINNECKER EHCP
RIBEIRO CA
CARDOSO LP
Citation: S. Gama et al., PHASE-RELATIONS AND MAGNETIC-PROPERTIES OF CO-RICH ALLOYS OF THE U-COSYSTEM, IEEE transactions on magnetics, 29(6), 1993, pp. 2884-2886
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