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Results: 1-18 |
Results: 18
WHAT CAN ELECTRON-PARAMAGNETIC-RESONANCE TELL US ABOUT THE SI SIO2 SYSTEM/
Authors: LENAHAN PM CONLEY JF
Citation: Pm. Lenahan et Jf. Conley, WHAT CAN ELECTRON-PARAMAGNETIC-RESONANCE TELL US ABOUT THE SI SIO2 SYSTEM/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2134-2153
RESPONSE TO COMMENT ON A MODEL OF HOLE TRAPPING IN SIO2-FILMS ON SILICON [J. APPL. PHYS. 83, 5591 (1998)]
Authors: LENAHAN PM CONLEY JF
Citation: Pm. Lenahan et Jf. Conley, RESPONSE TO COMMENT ON A MODEL OF HOLE TRAPPING IN SIO2-FILMS ON SILICON [J. APPL. PHYS. 83, 5591 (1998)], Journal of applied physics, 83(10), 1998, pp. 5593-5594
PRELIMINARY INVESTIGATION OF THE KINETICS OF POSTOXIDATION RAPID THERMAL ANNEAL INDUCED HOLE-TRAP-PRECURSOR FORMATION IN MICROELECTRONIC SIO2-FILMS
Authors: CONLEY JF LENAHAN PM MCARTHUR WF
Citation: Jf. Conley et al., PRELIMINARY INVESTIGATION OF THE KINETICS OF POSTOXIDATION RAPID THERMAL ANNEAL INDUCED HOLE-TRAP-PRECURSOR FORMATION IN MICROELECTRONIC SIO2-FILMS, Applied physics letters, 73(15), 1998, pp. 2188-2190
USE OF PRINCIPAL COMPONENTS-ANALYSIS IN PETROLOGY - AN EXAMPLE FROM THE MARTINSVILLE IGNEOUS COMPLEX, VIRGINIA, USA
Authors: RAGLAND PC CONLEY JF PARKER WC VANORMAN JA
Citation: Pc. Ragland et al., USE OF PRINCIPAL COMPONENTS-ANALYSIS IN PETROLOGY - AN EXAMPLE FROM THE MARTINSVILLE IGNEOUS COMPLEX, VIRGINIA, USA, Mineralogy and petrology, 60(3-4), 1997, pp. 165-184
A MODEL OF HOLE TRAPPING IN SIO2-FILMS ON SILICON
Authors: LENAHAN PM CONLEY JF WALLACE BD
Citation: Pm. Lenahan et al., A MODEL OF HOLE TRAPPING IN SIO2-FILMS ON SILICON, Journal of applied physics, 81(10), 1997, pp. 6822-6824
QUANTITATIVE MODEL OF RADIATION-INDUCED CHARGE TRAPPING IN SIO2
Authors: CONLEY JF LENAHAN PM WALLACE BD COLE P
Citation: Jf. Conley et al., QUANTITATIVE MODEL OF RADIATION-INDUCED CHARGE TRAPPING IN SIO2, IEEE transactions on nuclear science, 44(6), 1997, pp. 1804-1809
A MULTIVARIATE METHOD FOR DETERMINING THE PROVENANCE AND PROTOLITH OFMETASEDIMENTARY ROCKS - AN EXAMPLE FROM THE FORK MOUNTAIN FORMATION, SOUTHWESTERN VIRGINIA PIEDMONT, USA
Authors: RAGLAND PC PARKER WC CONLEY JF
Citation: Pc. Ragland et al., A MULTIVARIATE METHOD FOR DETERMINING THE PROVENANCE AND PROTOLITH OFMETASEDIMENTARY ROCKS - AN EXAMPLE FROM THE FORK MOUNTAIN FORMATION, SOUTHWESTERN VIRGINIA PIEDMONT, USA, Geochemical Journal, 31(5), 1997, pp. 275-288
A PHYSICALLY-BASED PREDICTIVE MODEL OF SI SIO2 INTERFACE-TRAP GENERATION RESULTING FROM THE PRESENCE OF HOLES IN THE SIO2/
Authors: LENAHAN PM CONLEY JF
Citation: Pm. Lenahan et Jf. Conley, A PHYSICALLY-BASED PREDICTIVE MODEL OF SI SIO2 INTERFACE-TRAP GENERATION RESULTING FROM THE PRESENCE OF HOLES IN THE SIO2/, Applied physics letters, 71(21), 1997, pp. 3126-3128
ELECTRON-SPIN-RESONANCE CHARACTERIZATION OF TRAPPING CENTERS IN UNIBOND(R) BURIED OXIDES
Authors: CONLEY JF LENAHAN PM WALLACE BD
Citation: Jf. Conley et al., ELECTRON-SPIN-RESONANCE CHARACTERIZATION OF TRAPPING CENTERS IN UNIBOND(R) BURIED OXIDES, IEEE transactions on nuclear science, 43(6), 1996, pp. 2635-2638
HYDROGEN COMPLEXED EP (E'DELTA) CENTERS AND EP H-2 INTERACTIONS - IMPLICATIONS FOR EP STRUCTURE/
Authors: CONLEY JF LENAHAN PM
Citation: Jf. Conley et Pm. Lenahan, HYDROGEN COMPLEXED EP (E'DELTA) CENTERS AND EP H-2 INTERACTIONS - IMPLICATIONS FOR EP STRUCTURE/, Microelectronic engineering, 28(1-4), 1995, pp. 35-38
ELECTRON-SPIN-RESONANCE ANALYSIS OF EP CENTER INTERACTIONS WITH H-2 -EVIDENCE FOR A LOCALIZED EP CENTER STRUCTURE
Authors: CONLEY JF LENAHAN PM
Citation: Jf. Conley et Pm. Lenahan, ELECTRON-SPIN-RESONANCE ANALYSIS OF EP CENTER INTERACTIONS WITH H-2 -EVIDENCE FOR A LOCALIZED EP CENTER STRUCTURE, IEEE transactions on nuclear science, 42(6), 1995, pp. 1740-1743
ELECTRON-SPIN-RESONANCE EVIDENCE THAT E'(GAMMA) CENTERS CAN BEHAVE ASSWITCHING OXIDE TRAPS
Authors: CONLEY JF LENAHAN PM LELIS AJ OLDHAM TR
Citation: Jf. Conley et al., ELECTRON-SPIN-RESONANCE EVIDENCE THAT E'(GAMMA) CENTERS CAN BEHAVE ASSWITCHING OXIDE TRAPS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1744-1749
ELECTRON-SPIN-RESONANCE EVIDENCE FOR THE STRUCTURE OF A SWITCHING OXIDE TRAP - LONG-TERM STRUCTURAL-CHANGE AT SILICON DANGLING BOND SITES IN SIO2
Authors: CONLEY JF LENAHAN PM LELIS AJ OLDHAM TR
Citation: Jf. Conley et al., ELECTRON-SPIN-RESONANCE EVIDENCE FOR THE STRUCTURE OF A SWITCHING OXIDE TRAP - LONG-TERM STRUCTURAL-CHANGE AT SILICON DANGLING BOND SITES IN SIO2, Applied physics letters, 67(15), 1995, pp. 2179-2181
OBSERVATION AND ELECTRONIC CHARACTERIZATION OF NEW E' CENTER DEFECTS IN TECHNOLOGICALLY RELEVANT THERMAL SIO(2) ON SI - AN ADDITIONAL COMPLEXITY IN OXIDE CHARGE TRAPPING
Authors: CONLEY JF LENAHAN PM EVANS HL LOWRY RK MORTHORST TJ
Citation: Jf. Conley et al., OBSERVATION AND ELECTRONIC CHARACTERIZATION OF NEW E' CENTER DEFECTS IN TECHNOLOGICALLY RELEVANT THERMAL SIO(2) ON SI - AN ADDITIONAL COMPLEXITY IN OXIDE CHARGE TRAPPING, Journal of applied physics, 76(5), 1994, pp. 2872-2880
ELECTRON-SPIN-RESONANCE EVIDENCE FOR AN IMPURITY-RELATED E'-LIKE HOLETRAPPING DEFECT IN THERMALLY GROWN SIO2 ON SI
Authors: CONLEY JF LENAHAN PM EVANS HL LOWRY RK MORTHORST TJ
Citation: Jf. Conley et al., ELECTRON-SPIN-RESONANCE EVIDENCE FOR AN IMPURITY-RELATED E'-LIKE HOLETRAPPING DEFECT IN THERMALLY GROWN SIO2 ON SI, Journal of applied physics, 76(12), 1994, pp. 8186-8188
OBSERVATION AND ELECTRONIC CHARACTERIZATION OF 2 E' CENTER CHARGE TRAPS IN CONVENTIONALLY PROCESSED THERMAL SIO2 ON SI
Authors: CONLEY JF LENAHAN PM EVANS HL LOWRY RK MORTHORST TJ
Citation: Jf. Conley et al., OBSERVATION AND ELECTRONIC CHARACTERIZATION OF 2 E' CENTER CHARGE TRAPS IN CONVENTIONALLY PROCESSED THERMAL SIO2 ON SI, Applied physics letters, 65(18), 1994, pp. 2281-2283
RADIATION-INDUCED INTERFACE STATES AND ESR EVIDENCE FOR ROOM-TEMPERATURE INTERACTIONS BETWEEN MOLECULAR-HYDROGEN AND SILICON DANGLING BONDSIN AMORPHOUS SIO2-FILMS ON SI
Authors: CONLEY JF LENAHAN PM
Citation: Jf. Conley et Pm. Lenahan, RADIATION-INDUCED INTERFACE STATES AND ESR EVIDENCE FOR ROOM-TEMPERATURE INTERACTIONS BETWEEN MOLECULAR-HYDROGEN AND SILICON DANGLING BONDSIN AMORPHOUS SIO2-FILMS ON SI, Microelectronic engineering, 22(1-4), 1993, pp. 215-218
MOLECULAR-HYDROGEN, E' CENTER HOLE TRAPS, AND RADIATION-INDUCED INTERFACE TRAPS IN MOS DEVICES
Authors: CONLEY JF LENAHAN PM
Citation: Jf. Conley et Pm. Lenahan, MOLECULAR-HYDROGEN, E' CENTER HOLE TRAPS, AND RADIATION-INDUCED INTERFACE TRAPS IN MOS DEVICES, IEEE transactions on nuclear science, 40(6), 1993, pp. 1335-1340
Risultati: 1-18 |