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Results: 1-25 | 26-36
Results: 1-25/36
Diffusion of TiN into aluminum films measured by soft x-ray spectroscopy and Rutherford backscattering spectroscopy
Authors: Schuler, TM Ederer, DL Ruzycki, N Glass, G Hollerman, WA Moewes, A Kuhn, M Callcott, TA
Citation: Tm. Schuler et al., Diffusion of TiN into aluminum films measured by soft x-ray spectroscopy and Rutherford backscattering spectroscopy, J VAC SCI A, 19(5), 2001, pp. 2259-2266
X-ray absorption analysis of KDP optics
Authors: Nelson, AJ van Buuren, T Miller, E Land, TA Bostedt, C Franco, N Whitman, PK Baisden, PA Terminello, LJ Callcott, TA
Citation: Aj. Nelson et al., X-ray absorption analysis of KDP optics, J ELEC SPEC, 114, 2001, pp. 873-878
Modeling final-state interaction effects in inelastic X-ray scattering from solids: resonant and non-resonant
Authors: Shirley, EL Soininen, JA Zhang, GP Carlisle, JA Callcott, TA Ederer, DL Terminello, LJ Perera, RCC
Citation: El. Shirley et al., Modeling final-state interaction effects in inelastic X-ray scattering from solids: resonant and non-resonant, J ELEC SPEC, 114, 2001, pp. 939-946
Soft x-ray spectroscopy experiments on the near K-edge of B in MB2 (M = Mg, Al, Ta, and Nb) - art. no. 174504
Authors: Nakamura, J Yamada, N Kuroki, K Callcott, TA Ederer, DL Denlinger, JD Perera, RCC
Citation: J. Nakamura et al., Soft x-ray spectroscopy experiments on the near K-edge of B in MB2 (M = Mg, Al, Ta, and Nb) - art. no. 174504, PHYS REV B, 6417(17), 2001, pp. 4504
Soft-x-ray spectroscopy measurements of the p-like density of states of B in MgB2 and evidence for surface boron oxides on exposed surfaces - art. no. 132504
Authors: Callcott, TA Lin, L Woods, GT Zhang, GP Thompson, JR Paranthaman, M Ederer, DL
Citation: Ta. Callcott et al., Soft-x-ray spectroscopy measurements of the p-like density of states of B in MgB2 and evidence for surface boron oxides on exposed surfaces - art. no. 132504, PHYS REV B, 6413(13), 2001, pp. 2504
Soft-x-ray fluorescence spectra of III-V phosphides BP, GaP, and InP - art. no. 235107
Authors: Lin, L Woods, GT Callcott, TA
Citation: L. Lin et al., Soft-x-ray fluorescence spectra of III-V phosphides BP, GaP, and InP - art. no. 235107, PHYS REV B, 6323(23), 2001, pp. 5107
Electronic structure of chemically-prepared LixMn2O4 determined by Mn X-ray absorption and emission spectroscopies
Authors: Horne, CR Bergmann, U Grush, MM Perera, RCC Ederer, DL Callcott, TA Cairns, EJ Cramer, SP
Citation: Cr. Horne et al., Electronic structure of chemically-prepared LixMn2O4 determined by Mn X-ray absorption and emission spectroscopies, J PHYS CH B, 104(41), 2000, pp. 9587-9596
Multiatom resonant photoemission observed via secondary processes: Auger decay and x-ray fluorescence
Authors: Arenholz, E Kay, AW Fadley, CS Grush, MM Callcott, TA Ederer, DL Heske, C Hussain, Z
Citation: E. Arenholz et al., Multiatom resonant photoemission observed via secondary processes: Auger decay and x-ray fluorescence, PHYS REV B, 61(11), 2000, pp. 7183-7186
Correlating electronic structure with cycling performance of substituted LiMn2O4 electrode materials: A study using the techniques of soft X-ray absorption and emission
Authors: Grush, MM Horne, CR Perera, RCC Ederer, DL Cramer, SP Cairns, EJ Callcott, TA
Citation: Mm. Grush et al., Correlating electronic structure with cycling performance of substituted LiMn2O4 electrode materials: A study using the techniques of soft X-ray absorption and emission, CHEM MATER, 12(3), 2000, pp. 659-664
The effects of boron impurities on the atomic bonding and electronic structure of Ni3Al
Authors: Winarski, RP Eskildsen, T Stadler, S van Ek, J Ederer, DL Kurmaev, EZ Grush, MM Callcott, TA Moewes, A Lee, M
Citation: Rp. Winarski et al., The effects of boron impurities on the atomic bonding and electronic structure of Ni3Al, J ELEC SPEC, 110(1-3), 2000, pp. 69-74
Electronic structures of the tungsten borides WB, W2B and W2B5
Authors: Stadler, S Winarski, RP MacLaren, JM Ederer, DL vanEk, J Moewes, A Grush, MM Callcott, TA Perera, RCC
Citation: S. Stadler et al., Electronic structures of the tungsten borides WB, W2B and W2B5, J ELEC SPEC, 110(1-3), 2000, pp. 75-86
Soft X-ray scattering dominates emission near the giant resonance of the rare earth compounds
Authors: Moewes, A Stadler, S Winarski, RP Ederer, DL Callcott, TA
Citation: A. Moewes et al., Soft X-ray scattering dominates emission near the giant resonance of the rare earth compounds, J ELEC SPEC, 110(1-3), 2000, pp. 189-196
Crystal-momentum-resolved electronic structure of solids using resonant soft-X-ray fluorescence spectroscopy
Authors: Carlisle, JA Blankenship, SR Terminello, LJ Jia, JJ Callcott, TA Ederer, DL Perera, RCC Himpsel, FJ
Citation: Ja. Carlisle et al., Crystal-momentum-resolved electronic structure of solids using resonant soft-X-ray fluorescence spectroscopy, J ELEC SPEC, 110(1-3), 2000, pp. 323-334
No multiatom resonances observed in x-ray fluorescence
Authors: Moewes, A Kurmaev, EZ Ederer, DL Callcott, TA
Citation: A. Moewes et al., No multiatom resonances observed in x-ray fluorescence, PHYS REV B, 62(23), 2000, pp. 15427-15430
Semi-quantitative and non-destructive analysis of impurities at a buried interface: Na and the CdS/Cu(In,Ga)Se-2 heterojunction
Authors: Heske, C Eich, D Fink, R Umbach, E van Buuren, T Bostedt, C Kakar, S Terminello, LJ Grush, MM Callcott, TA Himpsel, FJ Ederer, DL Perera, RCC Riedl, W Karg, F
Citation: C. Heske et al., Semi-quantitative and non-destructive analysis of impurities at a buried interface: Na and the CdS/Cu(In,Ga)Se-2 heterojunction, SURF INT AN, 30(1), 2000, pp. 459-463
Self-limitation of Na content at the CdS/Cu(In,Ga)Se-2 solar cell heterojunction
Authors: Heske, C Eich, D Groh, U Fink, R Umbach, E van Buuren, T Bostedt, C Franco, N Terminello, LJ Grush, MM Callcott, TA Himpsel, FJ Ederer, DL Perera, RCC Riedl, W Karg, F
Citation: C. Heske et al., Self-limitation of Na content at the CdS/Cu(In,Ga)Se-2 solar cell heterojunction, THIN SOL FI, 361, 2000, pp. 360-363
Resonant Raman scattering in Nd2O3 and the electronic structure of Sr2RuO4Studied by synchrotron radiation excitation
Authors: Ederer, DL Moewes, A Kurmaev, EZ Callcott, TA Grush, MM Stadler, S Winarski, R Perera, RCC Terminello, LJ
Citation: Dl. Ederer et al., Resonant Raman scattering in Nd2O3 and the electronic structure of Sr2RuO4Studied by synchrotron radiation excitation, J PHYS CH S, 61(3), 2000, pp. 435-444
High-resolution soft X-ray emission spectra of crystalline carbon nitride films deposited by electron cyclotron resonance sputtering
Authors: Muramatsu, Y Tani, Y Aoi, Y Kamijo, E Kaneyoshi, T Motoyama, M Delaunay, JJ Hayashi, T Grush, MM Callcott, TA Ederer, DL Heske, C Underwood, JH Perera, RCC
Citation: Y. Muramatsu et al., High-resolution soft X-ray emission spectra of crystalline carbon nitride films deposited by electron cyclotron resonance sputtering, JPN J A P 1, 38(9A), 1999, pp. 5143-5147
Electronic structure and crystalline coherence in Fe/Si multilayers
Authors: Carlisle, JA Blankenship, SR Smith, RN Chaiken, A Michel, RP van Buuren, T Terminello, LJ Jia, JJ Callcott, TA Ederer, DL
Citation: Ja. Carlisle et al., Electronic structure and crystalline coherence in Fe/Si multilayers, J CLUST SCI, 10(4), 1999, pp. 591-599
Examples of soft X-ray emission and inelastic scattering excited by synchrotron radiation
Authors: Ederer, DL Kurmaev, E Shin, S Moewes, A Grush, M Callcott, TA Perera, RCC van Ek, J Stadler, S Winarski, R Terminello, LJ Zhou, L
Citation: Dl. Ederer et al., Examples of soft X-ray emission and inelastic scattering excited by synchrotron radiation, J ALLOY COM, 286(1-2), 1999, pp. 47-55
Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films
Authors: Kurmaev, EZ Winarski, RP Ederer, DL Pivin, JC Shamin, SN Moewes, A Callcott, TA Chang, GS Whang, CN
Citation: Ez. Kurmaev et al., Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films, J ELEC SPEC, 103, 1999, pp. 565-571
Photoemission, X-ray absorption and X-ray emission study of boron carbides
Authors: Jimenez, I Terminello, LJ Himpsel, FJ Grush, M Callcott, TA
Citation: I. Jimenez et al., Photoemission, X-ray absorption and X-ray emission study of boron carbides, J ELEC SPEC, 103, 1999, pp. 611-615
Study of 4f inner shell excitations in Gd and Tb using resonant inelastic soft X-ray scattering
Authors: Moewes, A Winarski, RP Ederer, DL Grush, MM Callcott, TA
Citation: A. Moewes et al., Study of 4f inner shell excitations in Gd and Tb using resonant inelastic soft X-ray scattering, J ELEC SPEC, 103, 1999, pp. 617-622
Soft-X-ray fluorescence studies of solids
Authors: Carlisle, JA Blankenship, SR Smith, RN Shirley, EL Terminello, LJ Jia, JJ Callcott, TA Ederer, DL
Citation: Ja. Carlisle et al., Soft-X-ray fluorescence studies of solids, J ELEC SPEC, 103, 1999, pp. 839-845
The contribution of the ligands around Cr to the resonant inelastic L X-ray emission spectra
Authors: Ito, Y Tochio, T Vlaicu, AM Ohsawa, D Mukoyama, T Muramatsu, Y Perera, RCC Grush, MM Callcott, TA Sherman, E
Citation: Y. Ito et al., The contribution of the ligands around Cr to the resonant inelastic L X-ray emission spectra, J ELEC SPEC, 103, 1999, pp. 851-858
Risultati: 1-25 | 26-36