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Results:
1-20
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Results: 20
Authors:
DECRESCENZI M
GUNNELLA R
CASTRUCCI P
DAVOLI I
Citation: M. Decrescenzi et al., LOCAL STRUCTURAL INVESTIGATION OF SILICON SURFACES BY ELECTRON-SCATTERING, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 20(7-8), 1998, pp. 991-998
Authors:
GUNNELLA R
CASTRUCCI P
PINTO N
CUCCULELLI P
DAVOLI I
SEBILLEAU D
DECRESCENZI M
Citation: R. Gunnella et al., SURFACTANT-MEDIATED GROWTH OF GE SI(001) INTERFACE STUDIED BY XPD/, Surface review and letters, 5(1), 1998, pp. 157-161
Authors:
DAVOLI I
GUNNELLA R
BERNARDINI R
DECRESCENZI M
Citation: I. Davoli et al., EVIDENCE FOR THE SUPPRESSION OF INCIDENT BEAM EFFECTS IN AUGER-ELECTRON DIFFRACTION, Surface science, 396(1-3), 1998, pp. 221-226
Authors:
DAVOLI I
GUNNELLA R
BERNARDINI R
DECRESCENZI M
Citation: I. Davoli et al., LOW KINETIC-ENERGY AED - A TOOL FOR THE STUDY OF GE EPITAXIAL LAYERS GROWN ON SB-TERMINATED SI(111) SURFACE, Journal of electron spectroscopy and related phenomena, 83(2-3), 1997, pp. 137-142
Authors:
DAVOLI I
GUNNELLA R
CASTRUCCI P
PINTO N
BERNARDINI R
DECRESCENZI M
Citation: I. Davoli et al., XPD STUDY OF ATOMIC INTERMIXING AT THE GE SI(001) INTERFACE/, Applied surface science, 102, 1996, pp. 102-106
Authors:
GUNNELLA R
CASTRUCCI P
PINTO N
DAVOLI I
SEBILLEAU D
DECRESCENZI M
Citation: R. Gunnella et al., X-RAY PHOTOELECTRON-DIFFRACTION STUDY OF INTERMIXING AND MORPHOLOGY AT THE GE SI(001) AND GE/SB/SI(001) INTERFACE/, Physical review. B, Condensed matter, 54(12), 1996, pp. 8882-8891
Authors:
CASALBONI M
PINTO N
IZZI B
DAVOLI I
DECRESCENZI M
DEMATTEIS F
PROSPOSITO P
PIZZOFERRATO R
Citation: M. Casalboni et al., INTERFACE ORDERING IN SI-M GE-N MONOLAYER SUPERLATTICES - A PHOTOLUMINESCENCE STUDY/, Physical review. B, Condensed matter, 53(3), 1996, pp. 1030-1033
Authors:
TOMELLINI M
DAVOLI I
GOZZI D
Citation: M. Tomellini et al., HIGH-TEMPERATURE OXIDATION OF ONE-COMPONENT AND 2-COMPONENT METALLIC SYSTEMS STUDIED BY IN-SITU X-RAY-ABSORPTION SPECTROSCOPY, Journal of alloys and compounds, 218(2), 1995, pp. 237-243
Authors:
DECRESCENZI M
GUNNELLA R
DAVOLI I
Citation: M. Decrescenzi et al., STRUCTURAL SURFACE INVESTIGATION WITH LOW-ENERGY BACKSCATTERED ELECTRONS, Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 29-36
Authors:
DAVOLI I
GUNNELLA R
CASTRUCCI P
BERNARDINI R
DECRESCENZI M
Citation: I. Davoli et al., INCIDENT BEAM EFFECTS IN AED (AUGER-ELECTRON DIFFRACTION) - THE CASE OF CU(001), Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 493-497
Authors:
DECRESCENZI M
GUNNELLA R
BERNARDINI R
DEMARCO M
DAVOLI I
Citation: M. Decrescenzi et al., AUGER-ELECTRON DIFFRACTION IN THE LOW KINETIC-ENERGY RANGE - THE SI(111)7X7 SURFACE RECONSTRUCTION AND GE SI INTERFACE FORMATION/, Physical review. B, Condensed matter, 52(3), 1995, pp. 1806-1815
Authors:
GUNNELLA R
DAVOLI I
BERNARDINI R
DECRESCENZI M
Citation: R. Gunnella et al., INELASTIC PROCESSES VERSUS DIFFRACTION EFFECTS - POLAR-ANGLE ENERGY-LOSS SPECTRA OF THE GRAPHITE K-EDGE, Physical review. B, Condensed matter, 52(24), 1995, pp. 17091-17098
Authors:
CHABOY J
BENFATTO M
DAVOLI I
Citation: J. Chaboy et al., THEORETICAL-ANALYSIS OF X-RAY-ABSORPTION SPECTRA AT THE SILICON K ANDL(2,3) EDGES OF CRYSTALLINE AND AMORPHOUS SIO2, Physical review. B, Condensed matter, 52(14), 1995, pp. 10014-10020
Authors:
DAI DX
DAVOLI I
Citation: Dx. Dai et I. Davoli, AN EXPERIMENTAL-STUDY OF AN INTERFACE REACTION AT THE PRACTICAL PD SIINTERFACE BY XPS/, Vacuum, 46(2), 1995, pp. 139-142
Authors:
TERRANOVA ML
SESSA V
BERNARDINI R
DAVOLI I
DECRESCENZI M
Citation: Ml. Terranova et al., LOCAL-STRUCTURE OF DIAMOND FILMS - AUGER AND EELFS INVESTIGATION, Surface science, 333, 1995, pp. 1050-1055
Authors:
DAI DX
ZHU FR
LUO YS
DAVOLI I
STIZZA S
Citation: Dx. Dai et al., THE INITIAL ADSORPTION OF OXYGEN ON THE SI(111)7X7 SURFACE AT 150-K, Applied surface science, 78(3), 1994, pp. 293-297
Authors:
VARMA S
CHEN X
ZHANG J
DAVOLI I
SALDIN DK
TONNER BP
Citation: S. Varma et al., THE STUDY OF MGO(001) SURFACES BY PHOTOELECTRON DIFFRACTION, Surface science, 314(2), 1994, pp. 145-156
Authors:
DAVOLI I
BERNARDINI R
BATTISTONI C
CASTRUCCI P
GUNNELLA R
DECRESCENZI M
Citation: I. Davoli et al., ANGULAR-DEPENDENCE OF THE EXFAS (EXTENDED FINE AUGER STRUCTURE) IN MGO(100) SURFACES - SHORT-RANGE ORDER VERSUS DIFFRACTION EFFECTS, Surface science, 306(1-2), 1994, pp. 144-154
Authors:
DAI DX
DAVOLI I
Citation: Dx. Dai et I. Davoli, AN EXPERIMENTAL-STUDY OF INTERFACE REACTION AT THE PRACTICAL PT-SI INTERFACE BY XPS, Vacuum, 44(11-12), 1993, pp. 1189-1192
Authors:
CHUDINOV SM
KULBACHINSKII VA
SVISTUNOV IV
MANCINI G
DAVOLI I
Citation: Sm. Chudinov et al., MAGNETIC-PROPERTIES OF DILUTED (ZN1-XMNX)3AS2 SOLUTIONS (VOL 84, PG 531, 1992), Solid state communications, 86(6), 1993, pp. 407-407
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