AAAAAA

   
Results: 1-25 | 26-33
Results: 1-25/33
SYNTHESIS OF SUBSURFACE OXIDE LAYERS BY HYBRID METAL-GAS COIMPLANTATION INTO METALS
Authors: BROWN IG LIU F MONTEIRO OR YU KM EVANS PJ DYTLEWSKI N OZTARHAN A CORCORAN SG CROWSON D
Citation: Ig. Brown et al., SYNTHESIS OF SUBSURFACE OXIDE LAYERS BY HYBRID METAL-GAS COIMPLANTATION INTO METALS, Surface & coatings technology, 104, 1998, pp. 293-298
TIME-OF-FLIGHT ERDA OF DUAL IMPLANTED METALS
Authors: DYTLEWSKI N EVANS PJ BROWN IG LIU F OKS EM YUSHKOV GY
Citation: N. Dytlewski et al., TIME-OF-FLIGHT ERDA OF DUAL IMPLANTED METALS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 644-648
COMPLEMENTARY SCATTERED AND RECOILED ION DATA FROM TOF-E HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS
Authors: JOHNSTON PN ELBOUANANI M STANNARD WB BUBB IF COHEN DD DYTLEWSKI N SIEGELE R
Citation: Pn. Johnston et al., COMPLEMENTARY SCATTERED AND RECOILED ION DATA FROM TOF-E HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 669-673
MASS AND ENERGY-DISPERSIVE ELASTIC RECOIL DETECTION STUDIES OF LOW-TEMPERATURE SI PD/GAAS AND SI/PD/ALXGA(1-X)AS INTERFACIAL REACTIONS/
Authors: ZHANG YW HULT M PERSSON L WHITLOW HJ ANDERSSON M BUBB IF ELBOUANANI M JOHNSTON PN WALKER SR COHEN DD DYTLEWSKI N OSTLING M ZARING C
Citation: Yw. Zhang et al., MASS AND ENERGY-DISPERSIVE ELASTIC RECOIL DETECTION STUDIES OF LOW-TEMPERATURE SI PD/GAAS AND SI/PD/ALXGA(1-X)AS INTERFACIAL REACTIONS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 719-723
INTERDIFFUSION PHENOMENA IN SRBI2TA2O9 FILMS
Authors: STANNARD WB JOHNSTON PN WALKER SR ELBOUANANI M BUBB IF SCOTT JF COHEN DD DYTLEWSKI N MARTIN JW
Citation: Wb. Stannard et al., INTERDIFFUSION PHENOMENA IN SRBI2TA2O9 FILMS, Integrated ferroelectrics, 16(1-4), 1997, pp. 159-164
ION-BEAM-INDUCED DAMAGE IN INP DURING HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS
Authors: WALKER SR JOHNSTON PN BUBB IF STANNARD WB JIN Z JAMIESON DN DOOLEY SP COHEN DD DYTLEWSKI N
Citation: Sr. Walker et al., ION-BEAM-INDUCED DAMAGE IN INP DURING HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 166-170
SI DETECTOR PULSE-HEIGHT SHIFT AND MULTIPLE-SCATTERING PROBLEMS IN HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS
Authors: JOHNSTON PN ELBOUANANI M STANNARD WB BUBB IF COHEN DD DYTLEWSKI N SIEGELE R
Citation: Pn. Johnston et al., SI DETECTOR PULSE-HEIGHT SHIFT AND MULTIPLE-SCATTERING PROBLEMS IN HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS, Vacuum, 48(12), 1997, pp. 1017-1021
LARGE-GRAIN POLYCRYSTALLINE SILICON THIN-FILMS OBTAINED BY LOW-TEMPERATURE STEPWISE ANNEALING OF HYDROGENATED AMORPHOUS-SILICON
Authors: RUTHER R LIVINGSTONE J DYTLEWSKI N
Citation: R. Ruther et al., LARGE-GRAIN POLYCRYSTALLINE SILICON THIN-FILMS OBTAINED BY LOW-TEMPERATURE STEPWISE ANNEALING OF HYDROGENATED AMORPHOUS-SILICON, Thin solid films, 310(1-2), 1997, pp. 67-74
RECOIL SPECTROMETRY AND RBS STUDIES OF STRONTIUM BISMUTH TANTALATE FILMS ON PT TI ELECTRODES/
Authors: STANNARD WB JOHNSTON PN ELBOUANANI M WALKER SR BUBB IF SCOTT JF COHEN DD DYTLEWSKI N
Citation: Wb. Stannard et al., RECOIL SPECTROMETRY AND RBS STUDIES OF STRONTIUM BISMUTH TANTALATE FILMS ON PT TI ELECTRODES/, Integrated ferroelectrics, 12(2-4), 1996, pp. 177-184
RECOIL SPECTROMETRY OF THIN-FILM REACTIONS IN THE PD INP SYSTEM/
Authors: PERSSON L ELBOUANANI M HULT M JONSSON P WHITLOW HJ ANDERSSON M GEORGSSON K BUBB IF JOHNSTON PN WALKER SR COHEN DD DYTLEWSKI N ZARING C OSTLING M
Citation: L. Persson et al., RECOIL SPECTROMETRY OF THIN-FILM REACTIONS IN THE PD INP SYSTEM/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(4), 1996, pp. 2405-2413
HEAVY-ION TIME-OF-FLIGHT ERDA OF HIGH-DOSE METAL IMPLANTED GERMANIUM
Authors: DYTLEWSKI N EVANS PJ NOORMAN JT WIELUNSKI LS BUNDER J
Citation: N. Dytlewski et al., HEAVY-ION TIME-OF-FLIGHT ERDA OF HIGH-DOSE METAL IMPLANTED GERMANIUM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 278-282
DAMAGE IN SEMICONDUCTOR-MATERIALS DURING HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS
Authors: WALKER SR JOHNSTON PN BUBB IF STANNARD WB JAMIESON DN DOOLEY SP COHEN DD DYTLEWSKI N MARTIN JW
Citation: Sr. Walker et al., DAMAGE IN SEMICONDUCTOR-MATERIALS DURING HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 312-316
ENERGY-RECOIL ANALYSIS OF DEUTERIUM INCORPORATED IN SYNROC BY REACTION WITH D2O AT 120 AND 190-DEGREES-C [COMMENTS ON THE PAPER BY MATZKE,HET-AL, NUCL INSTRUM METH B45 (1990) 194]
Authors: DYTLEWSKI N VANCE ER BEGG BD
Citation: N. Dytlewski et al., ENERGY-RECOIL ANALYSIS OF DEUTERIUM INCORPORATED IN SYNROC BY REACTION WITH D2O AT 120 AND 190-DEGREES-C [COMMENTS ON THE PAPER BY MATZKE,HET-AL, NUCL INSTRUM METH B45 (1990) 194], Journal of nuclear materials, 231(3), 1996, pp. 257-259
INTERFACIAL REACTION STUDIES OF CR, NI, TI, AND PT METALLIZATION ON INP
Authors: PERSSON L ELBOUANANI M HULT M WHITLOW HJ ANDERSSON M BUBB IF JOHNSTON PN WALKER SR COHEN DD DYTLEWSKI N ZARING C OSTLING M
Citation: L. Persson et al., INTERFACIAL REACTION STUDIES OF CR, NI, TI, AND PT METALLIZATION ON INP, Journal of applied physics, 80(6), 1996, pp. 3346-3354
IMPROVED HYDROGEN DEPTH PROFILES WITH IN-CHAMBER ANNEALING OF HYDROGENATED AMORPHOUS-SILICON THIN-FILMS
Authors: RUTHER R LIVINGSTONE J DYTLEWSKI N COHEN D
Citation: R. Ruther et al., IMPROVED HYDROGEN DEPTH PROFILES WITH IN-CHAMBER ANNEALING OF HYDROGENATED AMORPHOUS-SILICON THIN-FILMS, Journal of applied physics, 79(1), 1996, pp. 175-178
STOICHIOMETRIC ANALYSIS OF A BARIUM STRONTIUM-TITANATE FILM BY HEAVY-ION RECOIL SPECTROMETRY
Authors: STANNARD WB JOHNSTON PN WALKER SR BUBB IF COHEN DD DYTLEWSKI N MARTIN JW
Citation: Wb. Stannard et al., STOICHIOMETRIC ANALYSIS OF A BARIUM STRONTIUM-TITANATE FILM BY HEAVY-ION RECOIL SPECTROMETRY, Integrated ferroelectrics, 9(1-3), 1995, pp. 243-250
HEAVY-ION RECOIL SPECTROMETRY OF BARIUM STRONTIUM-TITANATE FILMS
Authors: STANNARD WB JOHNSTON PN WALKER SR BUBB IF SCOTT JF COHEN DD DYTLEWSKI N MARTIN JW
Citation: Wb. Stannard et al., HEAVY-ION RECOIL SPECTROMETRY OF BARIUM STRONTIUM-TITANATE FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 99(1-4), 1995, pp. 447-449
MEVVA ION-IMPLANTATION OF HIGH T-C SUPERCONDUCTORS
Authors: MARTIN JW COHEN DD RUSSELL GJ DYTLEWSKI N EVANS PJ
Citation: Jw. Martin et al., MEVVA ION-IMPLANTATION OF HIGH T-C SUPERCONDUCTORS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 106(1-4), 1995, pp. 624-629
EMPIRICAL CHARACTERIZATION OF MASS-DISTRIBUTION BROADENING IN TOF-E RECOIL SPECTROMETRY
Authors: HULT M BOUANANI ME PERSSON L WHITLOW HJ ANDERSSON M ZARING C OSTLING M COHEN DD DYTLEWSKI N BUBB IF JOHNSTON PN WALKER SR
Citation: M. Hult et al., EMPIRICAL CHARACTERIZATION OF MASS-DISTRIBUTION BROADENING IN TOF-E RECOIL SPECTROMETRY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 101(3), 1995, pp. 263-266
MEASUREMENT OF CARBON CONTAMINATION IN BARIUM STRONTIUM-TITANATE FILMS
Authors: STANNARD WB JOHNSTON PN SCOTT JF BUBB IF WALKER SR COHEN DD DYTLEWSKI N MARTIN JW
Citation: Wb. Stannard et al., MEASUREMENT OF CARBON CONTAMINATION IN BARIUM STRONTIUM-TITANATE FILMS, Microelectronic engineering, 29(1-4), 1995, pp. 193-196
METAL INP THIN-FILM REACTIONS - STUDIES USING MASS AND ENERGY-DISPERSIVE RECOIL SPECTROMETRY/
Authors: WHITLOW HJ ANDERSSON M HULT M PERSSON L ELBOUANANI M OSTLING M ZARING C LUNDBERG N COHEN DD DYTLEWSKI N JOHNSTON PN BUBB IF WALKER SR
Citation: Hj. Whitlow et al., METAL INP THIN-FILM REACTIONS - STUDIES USING MASS AND ENERGY-DISPERSIVE RECOIL SPECTROMETRY/, Vacuum, 46(7), 1995, pp. 737-738
BOND SWITCHING, SI-H CLUSTER FORMATION AND HYDROGEN EFFUSION UPON THERMAL ANNEALING IN HYDROGENATED AMORPHOUS-SILICON THIN-FILMS
Authors: RUTHER R LIVINGSTONE J DYTLEWSKI N COHEN D
Citation: R. Ruther et al., BOND SWITCHING, SI-H CLUSTER FORMATION AND HYDROGEN EFFUSION UPON THERMAL ANNEALING IN HYDROGENATED AMORPHOUS-SILICON THIN-FILMS, Thin solid films, 271(1-2), 1995, pp. 151-156
RECOIL SPECTROMETRY - ION ACCELERATOR BASED ELEMENTAL CHARACTERIZATION OF SURFACE-LAYERS
Authors: WHITLOW HJ ANDERSSON M HULT M PERSSON L ELBOUANANI M OSTLING M ZARING C LUNDBERG N COHEN DD DYTLEWSKI N JOHNSTON PN BUBB IF WALKER SR JOHANSON E HOGMARK S INGEMARSSON PA
Citation: Hj. Whitlow et al., RECOIL SPECTROMETRY - ION ACCELERATOR BASED ELEMENTAL CHARACTERIZATION OF SURFACE-LAYERS, Mikrochimica acta, 120(1-4), 1995, pp. 171-181
COMPARISON OF NEUTRON AND ELECTRON-IRRADIATION ON THE EL2 DEFECT IN GAAS
Authors: LAI ST NENER BD ALEXIEV D FARAONE L KU TC DYTLEWSKI N
Citation: St. Lai et al., COMPARISON OF NEUTRON AND ELECTRON-IRRADIATION ON THE EL2 DEFECT IN GAAS, Journal of applied physics, 77(7), 1995, pp. 2985-2988
FORMATION OF THIN-FILMS OF COSI2 ON GAAS
Authors: HULT M PERSSON L ELBOUANANI M ANDERSSON M OSTLING M LUNDBERG N ZARING C GEORGSSON K COHEN DD DYTLEWSKI N JOHNSTON PN WALKER SR
Citation: M. Hult et al., FORMATION OF THIN-FILMS OF COSI2 ON GAAS, Journal of applied physics, 77(6), 1995, pp. 2435-2443
Risultati: 1-25 | 26-33