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Results: 1-16 |
Results: 16

Authors: Bournel, A Delmouly, V Dollfus, P Tremblay, G Hesto, P
Citation: A. Bournel et al., Theoretical and experimental considerations on the spin field effect transistor, PHYSICA E, 10(1-3), 2001, pp. 86-90

Authors: Dollfus, P Galdin, S Hesto, P Osten, HJ
Citation: P. Dollfus et al., Band offsets and electron transport calculation for strained Si1-x-yGexCy/Si heterostructures, J MAT S-M E, 12(4-6), 2001, pp. 245-248

Authors: Cassan, E Dollfus, P Galdin, S
Citation: E. Cassan et al., Wave-mechanical study of gate tunneling leakage reduction in ultra-thin (<2 nm) dielectric MOS and H-MOS devices, J NON-CRYST, 280(1-3), 2001, pp. 63-68

Authors: Cassan, E Dollfus, P Galdin, S Hesto, P
Citation: E. Cassan et al., Semiclassical and wave-mechanical modeling of charge control and direct tunneling leakage in MOS and H-MOS devices with ultrathin oxides, IEEE DEVICE, 48(4), 2001, pp. 715-721

Authors: Cassan, E Galdin, S Dollfus, P Hesto, P
Citation: E. Cassan et al., Comparison between device simulators for gate current calculation in ultra-thin gate oxide n-MOSFETs, IEICE TR EL, E83C(8), 2000, pp. 1194-1202

Authors: Galdin, S Dollfus, P Aubry-Fortuna, V Hesto, P Osten, HJ
Citation: S. Galdin et al., Band offset predictions for strained group IV alloys: Si1-x-yGexCy on Si(001) and Si1-xGex on Si1-zGez(001), SEMIC SCI T, 15(6), 2000, pp. 565-572

Authors: Cassan, E Dollfus, P Galdin, S Hesto, P
Citation: E. Cassan et al., Calculation of direct tunneling gate current through ultra-thin oxide and oxide/nitride stacks in MOSFETs and H-MOSFETs, MICROEL REL, 40(4-5), 2000, pp. 585-588

Authors: Dollfus, P Galdin, S Hesto, P Velazquez, JE
Citation: P. Dollfus et al., Monte Carlo study of sub-0.1 mu m Si0.97C0.03/Si MODFET: Electron transport and device performance, IEEE DEVICE, 47(6), 2000, pp. 1247-1250

Authors: Bournel, A Dollfus, P Cassan, E Hesto, P
Citation: A. Bournel et al., Monte Carlo study of spin relaxation in AlGaAs/GaAs quantum wells, APPL PHYS L, 77(15), 2000, pp. 2346-2348

Authors: Kovindha, A Dollfus, P
Citation: A. Kovindha et P. Dollfus, Workshop on Spinal Cord Injuries (SCI) Management: the Chiang Mai Experience, SPINAL CORD, 37(3), 1999, pp. 218-220

Authors: Dollfus, P Galdin, S Hesto, P
Citation: P. Dollfus et al., Monte-Carlo investigation of in-plane electron transport in tensile strained Si and Si1-yCy (y <= 0.03), EPJ-APPL PH, 7(1), 1999, pp. 73-77

Authors: Bournel, A Dollfus, P Bruno, P Hesto, P
Citation: A. Bournel et al., Spin-dependent transport phenomena in a HEMT, PHYSICA B, 272(1-4), 1999, pp. 331-334

Authors: Cassan, E Galdin, S Dollfus, P Hesto, P
Citation: E. Cassan et al., Analysis of electron energy distribution function in ultra-thin gate oxiden-MOSFETs using Monte Carlo simulation for direct tunneling gate current calculation, PHYSICA B, 272(1-4), 1999, pp. 550-553

Authors: Galdin, S Arbey, ME Dollfus, P Hesto, P
Citation: S. Galdin et al., Accurate analytical delay expression for short channel CMOS SOI inverter using Monte Carlo simulation, SOL ST ELEC, 43(10), 1999, pp. 1869-1877

Authors: Cassan, E Galdin, S Dollfus, P Hesto, P
Citation: E. Cassan et al., Study of direct tunneling through ultrathin gate oxide of field effect transistors using Monte Carlo simulation, J APPL PHYS, 86(7), 1999, pp. 3804-3811

Authors: Bournel, A Dollfus, P Bruno, P Hesto, P
Citation: A. Bournel et al., Gate-induced spin precession in an In0.53Ga0.47As two dimensional electrongas, EPJ-APPL PH, 4(1), 1998, pp. 1-4
Risultati: 1-16 |