AAAAAA

   
Results: 1-14 |
Results: 14
COLOR-CENTERS IN LIBAF3 CRYSTALS
Authors: TALE I SPRINGIS M KULIS P ROGULIS U TROKSS J VEISPALS A FITTING HJ
Citation: I. Tale et al., COLOR-CENTERS IN LIBAF3 CRYSTALS, Radiation measurements, 29(3-4), 1998, pp. 279-282
CATHODOLUMINESCENCE DEPTH ANALYSIS IN SIO2-SI-SYSTEMS
Authors: GOLDBERG M BARFELS T FITTING HJ
Citation: M. Goldberg et al., CATHODOLUMINESCENCE DEPTH ANALYSIS IN SIO2-SI-SYSTEMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 560-561
EDX DEPTH PROFILING BY MEANS OF EFFECTIVE LAYERS
Authors: MYINT K BARFELS T KUHR JC FITTING HJ
Citation: K. Myint et al., EDX DEPTH PROFILING BY MEANS OF EFFECTIVE LAYERS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 637-639
SILICON DIOXIDE THIN-FILM LUMINESCENCE IN COMPARISON WITH BULK SILICA
Authors: TRUKHIN AN GOLDBERG M JANSONS J FITTING HJ TALE IA
Citation: An. Trukhin et al., SILICON DIOXIDE THIN-FILM LUMINESCENCE IN COMPARISON WITH BULK SILICA, Journal of non-crystalline solids, 223(1-2), 1998, pp. 114-122
EDX DEPTHS ANALYSIS OF MIS-STRUCTURES
Authors: FITTING HJ KUHR JC GOLDBERG M BECHER B BARFELS T
Citation: Hj. Fitting et al., EDX DEPTHS ANALYSIS OF MIS-STRUCTURES, Mikrochimica acta, 125(1-4), 1997, pp. 235-238
CATHODOLUMINESCENCE AND CATHODOELECTROLUMINESCENCE OF AMORPHOUS SIO2-FILMS
Authors: GOLDBERG M FITTING HJ TRUKHIN A
Citation: M. Goldberg et al., CATHODOLUMINESCENCE AND CATHODOELECTROLUMINESCENCE OF AMORPHOUS SIO2-FILMS, Journal of non-crystalline solids, 220(1), 1997, pp. 69-77
COLOR-CENTERS IN LIBAF3
Authors: TALE I KULIS P ROGULIS U TALE V TROKSS J VEISPALS A BARBOZAFLORES M FITTING HJ
Citation: I. Tale et al., COLOR-CENTERS IN LIBAF3, Journal of luminescence, 72-4, 1997, pp. 722-723
VACUUM EMISSION OF HOT AND BALLISTIC ELECTRONS FROM GAAS
Authors: FITTING HJ HINGST T SCHREIBER E GEIB E
Citation: Hj. Fitting et al., VACUUM EMISSION OF HOT AND BALLISTIC ELECTRONS FROM GAAS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2087-2089
DOSE EFFECTS OF CATHODOLUMINESCENCE IN SIO2 LAYERS ON SI
Authors: GOLDBERG M TRUKHIN A FITTING HJ
Citation: M. Goldberg et al., DOSE EFFECTS OF CATHODOLUMINESCENCE IN SIO2 LAYERS ON SI, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 293-296
COLLISIONAL BROADENING EFFECT IN VACUUM EMISSION OF HOT-ELECTRONS FROM SIO2 - THE ROLE OF NONPOLAR OPTICAL PHONON-SCATTERING
Authors: REGGIANI L FITTING HJ HINGST T KOHN J BEAUVIVRE S VARANI L
Citation: L. Reggiani et al., COLLISIONAL BROADENING EFFECT IN VACUUM EMISSION OF HOT-ELECTRONS FROM SIO2 - THE ROLE OF NONPOLAR OPTICAL PHONON-SCATTERING, Physica status solidi. b, Basic research, 194(2), 1996, pp. 667-671
DEGRADATION FEATURES OF BAF2 SCINTILLATORS UNDER RADIATION AND MAGNETIC-FIELDS
Authors: ROGULIS U TROKSH J VEISPALS A KULIS P SPRINGIS M TALE I FITTING HJ
Citation: U. Rogulis et al., DEGRADATION FEATURES OF BAF2 SCINTILLATORS UNDER RADIATION AND MAGNETIC-FIELDS, Physica status solidi. a, Applied research, 156(2), 1996, pp. 515-522
ELECTRONIC TRAP MICROSCOPY - A NEW MODE FOR SCANNING ELECTRON-MICROSCOPY (SEM)
Authors: FITTING HJ HINGST T FRANZ R SCHREIBER E
Citation: Hj. Fitting et al., ELECTRONIC TRAP MICROSCOPY - A NEW MODE FOR SCANNING ELECTRON-MICROSCOPY (SEM), Scanning microscopy, 8(2), 1994, pp. 165-174
HIGH-FIELD EBIC BY COMPUTER CONTROLLING
Authors: HINGST T HUBNER M FRANZ R KUHR JC FITTING HJ
Citation: T. Hingst et al., HIGH-FIELD EBIC BY COMPUTER CONTROLLING, Microelectronic engineering, 24(1-4), 1994, pp. 181-188
VACUUM EMISSION OF HOT-ELECTRONS FROM INSULATING AND SEMICONDUCTING-FILMS
Authors: FITTING HJ
Citation: Hj. Fitting, VACUUM EMISSION OF HOT-ELECTRONS FROM INSULATING AND SEMICONDUCTING-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 433-436
Risultati: 1-14 |