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Results: 1-19 |
Results: 19

Authors: Bechstedt, F Fissel, A Furthmuller, J Grossner, U Zywietz, A
Citation: F. Bechstedt et al., Native defects and complexes in SiC, J PHYS-COND, 13(40), 2001, pp. 9027-9037

Authors: Fissel, A Akhtariev, R Kaiser, U Richter, W
Citation: A. Fissel et al., MBE growth of Si on SiC(0001): from superstructures to islands, J CRYST GR, 227, 2001, pp. 777-781

Authors: Fissel, A
Citation: A. Fissel, High-quality SIC epitaxial layers and low-dimensional heteropolytypic SIC structures grown by solid-source MBE, J CRYST GR, 227, 2001, pp. 805-810

Authors: Fissel, A Richter, W Furthmuller, J Bechstedt, F
Citation: A. Fissel et al., On the nature of the D-1-defect center in SiC: A photoluminescence study of layers grown by solid-source molecular-beam epitaxy, APPL PHYS L, 78(17), 2001, pp. 2512-2514

Authors: Fissel, A Richter, W
Citation: A. Fissel et W. Richter, MBE growth kinetics of Si on heavily-doped Si(111): P: a self-surfactant, MAT SCI E B, 73(1-3), 2000, pp. 163-167

Authors: Fissel, A Akhtariev, R Richter, W
Citation: A. Fissel et al., Stranski-Krastanov growth of Si on SiC(0001), THIN SOL FI, 380(1-2), 2000, pp. 42-45

Authors: Hess, G Bauer, A Krausslich, J Fissel, A Schroter, B Richter, W Schell, N Matz, W Goetz, K
Citation: G. Hess et al., Si/Ge-nanocrystals on SiC(0001), THIN SOL FI, 380(1-2), 2000, pp. 86-88

Authors: Fissel, A Kaiser, U Schroter, B Krausslich, J Richter, W
Citation: A. Fissel et al., MBE-growth of heteropolytypic low-dimensional structures of SiC, THIN SOL FI, 380(1-2), 2000, pp. 89-91

Authors: Fissel, A
Citation: A. Fissel, Thermodynamic considerations of the epitaxial growth of SiC polytypes, J CRYST GR, 212(3-4), 2000, pp. 438-450

Authors: Fissel, A Schroter, B Kaiser, U Richter, W
Citation: A. Fissel et al., Advances in the molecular-beam epitaxial growth of artificially layered heteropolytypic structures of SiC, APPL PHYS L, 77(15), 2000, pp. 2418-2420

Authors: Kipshidze, DG Schenk, HP Fissel, A Kaiser, U Schulze, J Richter, W Weihnacht, M Kunze, R Krausslich, J
Citation: Dg. Kipshidze et al., Molecular-beam epitaxy of a strongly lattice-mismatched heterosystem AlN/Si(111) for application in SAW devices, SEMICONDUCT, 33(11), 1999, pp. 1241-1246

Authors: Fissel, A Kaiser, U Krausslich, J Pfennighaus, K Schroter, B Schulz, J Richter, W
Citation: A. Fissel et al., Epitaxial growth of SiC-heterostructures on alpha-SiC(0001) by solid-source MBE, MAT SCI E B, 61-2, 1999, pp. 139-142

Authors: Bauer, A Krausslich, J Kocher, B Goetz, K Fissel, A Richter, W
Citation: A. Bauer et al., X-ray investigations of MBE-grown heteroepitaxial SiC layers on 6H-SiC substrates, MAT SCI E B, 61-2, 1999, pp. 179-182

Authors: Schenk, HPD Kaiser, U Kipshidze, GD Fissel, A Krausslich, J Hobert, H Schulze, J Richter, W
Citation: Hpd. Schenk et al., Growth of atomically smooth AlN films with a 5 : 4 coincidence interface on Si(111) by MBE, MAT SCI E B, 59(1-3), 1999, pp. 84-87

Authors: Kaiser, U Khodos, I Brown, PD Chuvilin, A Albrecht, M Humphreys, CJ Fissel, A Richter, W
Citation: U. Kaiser et al., A transmission electron microscopy investigation of SiC films grown on SiCsubstrates by solid-source molecular beam epitaxy, J MATER RES, 14(8), 1999, pp. 3226-3236

Authors: Fissel, A Pfennighaus, K Kaiser, U Schroter, B Richter, W
Citation: A. Fissel et al., Mechanisms of homo- and heteroepitaxial growth of SiC on alpha-SiC(0001) by solid-source molecular beam epitaxy, J ELEC MAT, 28(3), 1999, pp. 206-213

Authors: Schenk, HPD Kipshidze, GD Lebedev, VB Shokhovets, S Goldhahn, R Krausslich, J Fissel, A Richter, W
Citation: Hpd. Schenk et al., Epitaxial growth of AlN and GaN on Si(111) by plasma-assisted molecular beam epitaxy, J CRYST GR, 202, 1999, pp. 359-364

Authors: Schenk, HPD Kipshidze, GD Kaiser, U Fissel, A Krausslich, J Schulze, J Richter, W
Citation: Hpd. Schenk et al., Investigation of two-dimensional growth of AlN(0 0 0 1) on Si(1 1 1) by plasma-assisted molecular beam epitaxy, J CRYST GR, 200(1-2), 1999, pp. 45-54

Authors: Kaiser, U Newcomb, SB Stobbs, WM Adamik, M Fissel, A Richter, W
Citation: U. Kaiser et al., A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy, J MATER RES, 13(12), 1998, pp. 3571-3579
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