Authors:
LANDRON C
HENNET L
COUTURES JP
GAILHANOU M
GRAMOND M
BERAR JF
Citation: C. Landron et al., CONTACTLESS INVESTIGATION ON LASER-HEATED OXIDES BY SYNCHROTRON-RADIATION, Europhysics letters (Print), 44(4), 1998, pp. 429-435
Authors:
DECHELETTEBARBARA A
TONNERRE JM
SAINTLAGER MC
BARTOLOME F
BERAR JF
RAOUX D
FISCHER HM
PIECUCH M
CHAKARIAN V
KAO CC
GAILHANOU M
LEFEVRE S
BESSIERE M
Citation: A. Dechelettebarbara et al., X-RAY ANOMALOUS DIFFRACTION AND RESONANT MAGNETIC SCATTERING-X-RAY STUDY OF FEXMN1-X IR(001) SUPERLATTICES/, Journal of magnetism and magnetic materials, 165(1-3), 1997, pp. 87-91
Authors:
LANDRON C
LAUNAY X
RIFFLET JC
ECHEGUT P
AUGER Y
RUFFIER D
COUTURES JP
LEMONIER M
GAILHANOU M
BESSIERE M
BAZIN D
DEXPERT H
Citation: C. Landron et al., DEVELOPMENT OF A LEVITATION CELL FOR SYNCHROTRON-RADIATION EXPERIMENTS AT VERY HIGH-TEMPERATURE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 124(4), 1997, pp. 627-632
Authors:
LEPRINCE L
BAUMBACH GT
TALNEAU A
GAILHANOU M
SCHNECK J
Citation: L. Leprince et al., OBSERVATION OF STRAIN RELAXATION PHENOMENA IN BURIED AND NONBURIED III-V SURFACE GRATINGS THROUGH HIGH-RESOLUTION X-RAY-DIFFRACTION, Applied physics letters, 71(22), 1997, pp. 3227-3229
Authors:
SALLESE JM
CARLIN JF
GAILHANOU M
ILEGEMS M
Citation: Jm. Sallese et al., EVIDENCE OF A BLUE-SHIFT IN NEAR-SURFACE ULTRA-THIN INAS INP ISLAND LIKE QUANTUM-WELLS/, Applied physics letters, 71(16), 1997, pp. 2331-2333
Authors:
MI J
WARREN P
GAILHANOU M
GANIERE JD
DUTOIT M
JOUNEAU PH
HOURIET R
Citation: J. Mi et al., EPITAXIAL-GROWTH OF SI1-X-YGEXCY ALLOY LAYERS ON (100)SI BY RAPID THERMAL CHEMICAL-VAPOR-DEPOSITION USING METHYLSILANE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1660-1669
Citation: Gt. Baumbach et M. Gailhanou, X-RAY-DIFFRACTION FROM EPITAXIAL MULTILAYERED SURFACE GRATINGS, Journal of physics. D, Applied physics, 28(11), 1995, pp. 2321-2327
Authors:
MI J
WARREN P
LETOURNEAU P
JUDELEWICZ M
GAILHANOU M
DUTOIT M
Citation: J. Mi et al., EFFECT OF RTCVD GROWTH-CONDITIONS ON THE CRYSTAL QUALITY OF PSEUDOMORPHIC SI1-X-YGEXCY FILMS, Journal of crystal growth, 157(1-4), 1995, pp. 190-194
Authors:
OESTERLE U
STANLEY RP
HOUDRE R
GAILHANOU M
ILEGEMS M
Citation: U. Oesterle et al., MOLECULAR-BEAM EPITAXY GROWTH OF AN ULTRAHIGH FINESSE MICROCAVITY, Journal of crystal growth, 150(1-4), 1995, pp. 1313-1317
Authors:
MI J
WARREN P
LETOUMEAU P
JUDELEWICZ M
GAILHANOU M
DUTOIT M
DUBOIS C
DUPUY JC
Citation: J. Mi et al., HIGH-QUALITY SI1-X-YGEXCY EPITAXIAL LAYERS GROWN ON (100) SI BY RAPIDTHERMAL CHEMICAL-VAPOR-DEPOSITION USING METHYLSILANE, Applied physics letters, 67(2), 1995, pp. 259-261
Authors:
SALLESE JM
CARLIN JF
GAILHANOU M
GRUNBERG P
Citation: Jm. Sallese et al., INTERDIFFUSION INDUCED ENHANCEMENT OF ONE-DIMENSIONAL LEVEL SEPARATION IN QUANTUM WIRES, Applied physics letters, 67(18), 1995, pp. 2633-2635
Citation: Gt. Baumbach et al., THE INFLUENCE OF SPECULAR INTERFACE REFLECTION ON GRAZING-INCIDENCE X-RAY-DIFFRACTION AND DIFFUSE-SCATTERING FROM SUPERLATTICES, Physica. B, Condensed matter, 198(1-3), 1994, pp. 249-252
Citation: M. Gailhanou et al., X-RAY-DIFFRACTION ANALYSIS OF LOW MISMATCH EPITAXIAL LAYERS GROWN ON MISORIENTED SUBSTRATES, Journal of crystal growth, 140(1-2), 1994, pp. 205-212
Authors:
MI J
LETOURNEAU P
GANIERE JD
GAILHANOU M
DUTOIT M
DUBOIS C
DUPUY JC
BREMOND G
Citation: J. Mi et al., IMPROVEMENT OF CRYSTAL QUALITY OF EPITAXIAL SILICON-GERMANIUM ALLOY LAYERS BY CARBON ADDITIONS, Helvetica Physica Acta, 67(2), 1994, pp. 219-220
Authors:
KY NH
GANIERE JD
GAILHANOU M
BLANCHARD B
PAVESI L
BURRI G
ARAUJO D
REINHART FK
Citation: Nh. Ky et al., SELF-INTERSTITIAL MECHANISM FOR ZN DIFFUSION-INDUCED DISORDERING OF GAAS ALXGA1-XAS (X=0.1-1) MULTIPLE-QUANTUM-WELL STRUCTURES/, Journal of applied physics, 73(8), 1993, pp. 3769-3781
Citation: M. Gailhanou, ACCURATE MONOCRYSTAL MISCUT ANGLE DETERMINATION BY X-RAY-DIFFRACTION ON A WEDGE, Applied physics letters, 63(4), 1993, pp. 458-460