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Authors: Alexe, M Harnagea, C Visinoiu, A Pignolet, A Hesse, D Gosele, U
Citation: M. Alexe et al., Patterning and switching of nano-size ferroelectric memory cells, SCR MATER, 44(8-9), 2001, pp. 1175-1179

Authors: Schilling, J Birner, A Muller, F Wehrspohn, RB Hillebrand, R Gosele, U Busch, K John, S Leonard, SW van Driel, HM
Citation: J. Schilling et al., Optical characterisation of 2D macroporous silicon photonic crystals with bandgaps around 3.5 and 1.3 mu m, OPT MATER, 17(1-2), 2001, pp. 7-10

Authors: Zakharov, ND Werner, P Gosele, U Gerth, G Cirlin, G Egorov, VA Volovik, BV
Citation: Nd. Zakharov et al., Structure and optical properties of Ge/Si superlattice grown at Si substrate by MBE at different temperatures, MAT SCI E B, 87(1), 2001, pp. 92-95

Authors: Cirlin, GE Polyakov, NK Petrov, VN Egorov, VA Denisov, DV Volovik, BV Ustinov, VM Alferov, ZI Ledentsov, NN Heitz, R Bimberg, D Zakharov, ND Werner, P Gosele, U
Citation: Ge. Cirlin et al., Incorporation of InAs nanostructures in a silicon matrix: growth, structure and optical properties, MAT SCI E B, 80(1-3), 2001, pp. 108-111

Authors: Kogler, R Peeva, A Werner, P Skorupa, W Gosele, U
Citation: R. Kogler et al., Gettering centres in high-energy ion-implanted silicon investigated by point defect recombination, NUCL INST B, 175, 2001, pp. 340-344

Authors: Genereux, F Leonard, SW van Driel, HM Birner, A Gosele, U
Citation: F. Genereux et al., Large birefringence in two-dimensional silicon photonic crystals - art. no. 161101, PHYS REV B, 6316(16), 2001, pp. 1101

Authors: Wakayama, Y Gerth, G Werner, P Gosele, U Sokolov, LV
Citation: Y. Wakayama et al., Control of structure, size and density of Ge dot on Si (100) through multistep procedure, J CRYST GR, 231(4), 2001, pp. 474-487

Authors: Akatsu, T Plossl, A Scholz, R Stenzel, H Gosele, U
Citation: T. Akatsu et al., Wafer bonding of different III-V compound semiconductors by atomic hydrogen surface cleaning, J APPL PHYS, 90(8), 2001, pp. 3856-3862

Authors: Chaldyshev, VV Bert, NA Musikhin, YG Suvorova, AA Preobrazhenskii, VV Putyato, MA Semyagin, BR Werner, P Gosele, U
Citation: Vv. Chaldyshev et al., Enhanced As-Sb intermixing of GaSb monolayer superlattices in low-temperature grown GaAs, APPL PHYS L, 79(9), 2001, pp. 1294-1296

Authors: Nielsch, K Wehrspohn, RB Barthel, J Kirschner, J Gosele, U Fischer, SF Kronmuller, H
Citation: K. Nielsch et al., Hexagonally ordered 100 nm period nickel nanowire arrays, APPL PHYS L, 79(9), 2001, pp. 1360-1362

Authors: Alexe, M Harnagea, C Hesse, D Gosele, U
Citation: M. Alexe et al., Polarization imprint and size effects in mesoscopic ferroelectric structures, APPL PHYS L, 79(2), 2001, pp. 242-244

Authors: Schilling, J Muller, F Matthias, S Wehrspohn, RB Gosele, U Busch, K
Citation: J. Schilling et al., Three-dimensional photonic crystals based on macroporous silicon with modulated pore diameter, APPL PHYS L, 78(9), 2001, pp. 1180-1182

Authors: Muller, F Birner, A Gosele, U Lehmann, V Ottow, S Foll, H
Citation: F. Muller et al., Structuring of macroporous silicon for applications as photonic crystals, J POROUS MA, 7(1-3), 2000, pp. 201-204

Authors: Birner, A Li, AP Muller, F Gosele, U Kramper, P Sandoghdar, V Mlynek, J Busch, K Lehmann, V
Citation: A. Birner et al., Transmission of a microcavity structure in a two-dimensional photonic crystal based on macroporous silicon, MAT SC S PR, 3(5-6), 2000, pp. 487-491

Authors: Chen, C Tu, KN Tung, CH Sheng, TT Ploessl, A Scholz, R Gosele, U
Citation: C. Chen et al., Twist-type silicon bicrystals and compliant substrates prepared from silicon-on-insulator wafers, PHIL MAG A, 80(4), 2000, pp. 881-891

Authors: Li, AP Muller, F Gosele, U
Citation: Ap. Li et al., Polycrystalline and monocrystalline pore arrays with large interpore distance in anodic alumina, EL SOLID ST, 3(3), 2000, pp. 131-134

Authors: Leonard, SW Mondia, JP van Driel, HM Toader, O John, S Busch, K Birner, A Gosele, U Lehmann, V
Citation: Sw. Leonard et al., Tunable two-dimensional photonic crystals using liquid-crystal infiltration, PHYS REV B, 61(4), 2000, pp. R2389-R2392

Authors: Lee, HN Senz, S Visinoiu, A Pignolet, A Hesse, D Gosele, U
Citation: Hn. Lee et al., Epitaxial growth of non-c-oriented ferroelectric SrBi2Ta2O9 thin films on Si(100) substrates, APPL PHYS A, 71(1), 2000, pp. 101-104

Authors: Alexe, M Harnagea, C Erfurth, W Hesse, D Gosele, U
Citation: M. Alexe et al., 100-nm lateral size ferroelectric memory cells fabricated by electron-beamdirect writing, APPL PHYS A, 70(3), 2000, pp. 247-251

Authors: Harnagea, C Pignolet, A Alexe, M Hesse, D Gosele, U
Citation: C. Harnagea et al., Quantitative ferroelectric characterization of single submicron grains in Bi-layered perovskite thin films, APPL PHYS A, 70(3), 2000, pp. 261-267

Authors: Pignolet, A Schafer, C Satyalakshmi, KM Harnagea, C Hesse, D Gosele, U
Citation: A. Pignolet et al., Orientation dependence of ferroelectricity in pulsed-laser-deposited epitaxial bismuth-layered perovskite thin films, APPL PHYS A, 70(3), 2000, pp. 283-291

Authors: Kastner, G Akatsu, T Senz, S Plossl, A Gosele, U
Citation: G. Kastner et al., Large-area wafer bonding of GaAs using hydrogen and ultrahigh vacuum atmospheres, APPL PHYS A, 70(1), 2000, pp. 13-19

Authors: Nielsch, K Muller, F Li, AP Gosele, U
Citation: K. Nielsch et al., Uniform nickel deposition into ordered alumina pores by pulsed electrodeposition, ADVAN MATER, 12(8), 2000, pp. 582-586

Authors: Wiegand, M Reiche, M Gosele, U Gutjahr, K Stolze, D Longwitz, R
Citation: M. Wiegand et al., Wafer bonding of silicon wafers covered with various surface layers, SENS ACTU-A, 86(1-2), 2000, pp. 91-95

Authors: Hillebrand, R Kirschner, H Werner, P Gosele, U
Citation: R. Hillebrand et al., HREM image analysis of III-V heterostructures based on neural networks, PHYS ST S-B, 222(1), 2000, pp. 185-198
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