Authors:
Sigg, H
Dehlinger, G
Diehl, L
Gennser, U
Stutz, S
Faist, J
Grutzmacher, D
Ensslin, K
Muller, E
Citation: H. Sigg et al., Valence band intersubband electro luminescence from Si/SiGe quantum cascade structures, PHYSICA E, 11(2-3), 2001, pp. 240-244
Authors:
Muller, B
Riedel, M
Michel, R
De Paul, SM
Hofer, R
Heger, D
Grutzmacher, D
Citation: B. Muller et al., Impact of nanometer-scale roughness on contact-angle hysteresis and globulin adsorption, J VAC SCI B, 19(5), 2001, pp. 1715-1720
Authors:
Leifeld, O
Beyer, A
Muller, E
Kern, K
Grutzmacher, D
Citation: O. Leifeld et al., Formation and ordering effects of C-induced Ge dots grown on Si (001) by molecular beam epitaxy, MAT SCI E B, 74(1-3), 2000, pp. 222-228
Authors:
Dehlinger, G
Gennser, U
Grutzmacher, D
Ihn, T
Muller, E
Ensslin, K
Citation: G. Dehlinger et al., Investigation of the emitter structure in SiGe/Si resonant tunneling structures, THIN SOL FI, 369(1-2), 2000, pp. 390-393
Authors:
Senz, V
Ihn, T
Heinzel, T
Ensslin, K
Dehlinger, G
Grutzmacher, D
Gennser, U
Citation: V. Senz et al., Analysis of the metallic phase of two-dimensional holes in SiGe in terms of temperature dependent screening, PHYS REV L, 85(20), 2000, pp. 4357-4360
Authors:
Leifeld, O
Hartmann, R
Muller, E
Kaxiras, E
Kern, K
Grutzmacher, D
Citation: O. Leifeld et al., Self-organized growth of Ge quantum dots on Si(001) substrates induced by sub-monolayer C coverages, NANOTECHNOL, 10(2), 1999, pp. 122-126
Authors:
Leifeld, O
Muller, E
Grutzmacher, D
Muller, B
Kern, K
Citation: O. Leifeld et al., In situ scanning tunneling microscopy study of C-induced Ge quantum dot formation on Si(100), APPL PHYS L, 74(7), 1999, pp. 994-996
Authors:
Muller, E
Hartmann, R
David, C
Grutzmacher, D
Citation: E. Muller et al., Structural characterization of SiGe step graded buffer layers grown on prestructured Si[001] substrates by molecular beam epitaxy, THIN SOL FI, 336(1-2), 1998, pp. 92-95
Authors:
Hartmann, R
Gennser, U
Sigg, H
Grutzmacher, D
Ensslin, K
Citation: R. Hartmann et al., Band gap and band alignment of strain reduced Si/Si1-x-yGexCy multiple quantum well structures obtained by photoluminescence measurements, APPL PHYS L, 73(9), 1998, pp. 1257-1259