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Results:
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Results: 14
ACOUSTIC PHASE-VELOCITY MEASUREMENTS WITH NANOMETER RESOLUTION BY SCANNING ACOUSTIC FORCE MICROSCOPY
Authors:
CHILLA E
HESJEDAL T
FROHLICH HJ
Citation: E. Chilla et al., ACOUSTIC PHASE-VELOCITY MEASUREMENTS WITH NANOMETER RESOLUTION BY SCANNING ACOUSTIC FORCE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 223-226
Authors:
HESJEDAL T
FROHLICH HJ
CHILLA E
Citation: T. Hesjedal et al., FORCE MICROSCOPY FOR THE INVESTIGATION OF HIGH-FREQUENCY SURFACE-ACOUSTIC-WAVE DEVICES, Applied physics A: Materials science & processing, 66, 1998, pp. 325-328
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., IMAGING OF SURFACE ATOMS REVOLVING ON ELLIPTIC TRAJECTORIES, Applied physics A: Materials science & processing, 66, 1998, pp. 353-355
Authors:
WEDLER G
WALT J
HESJEDAL T
CHILLA E
KOCH R
Citation: G. Wedler et al., INTRINSIC STRESS UPON STRANSKI-KRASTANOV GROWTH OF GE ON SI(001), Surface science, 404(1-3), 1998, pp. 290-294
Authors:
WEDLER G
WALZ J
HESJEDAL T
CHILLA E
KOCH R
Citation: G. Wedler et al., STRESS AND RELIEF OF MISFIT STRAIN OF GE SI(001)/, Physical review letters, 80(11), 1998, pp. 2382-2385
Authors:
BEHME G
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: G. Behme et al., TRANSVERSE SURFACE-ACOUSTIC-WAVE DETECTION BY SCANNING ACOUSTIC FORCEMICROSCOPY, Applied physics letters, 73(7), 1998, pp. 882-884
Authors:
WALZ J
GREUER A
WEDLER G
HESJEDAL T
CHILLA E
KOCH R
Citation: J. Walz et al., STRESS AND RELIEF OF MISFIT STRAIN OF GE SI(111)/, Applied physics letters, 73(18), 1998, pp. 2579-2581
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., SCANNING ACOUSTIC TUNNELING MICROSCOPY AND SPECTROSCOPY - A PROBING TOOL FOR ACOUSTIC SURFACE OSCILLATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1569-1572
Authors:
CHILLA E
HESJEDAL T
FROHLICH HJ
Citation: E. Chilla et al., NANOSCALE DETERMINATION OF PHASE-VELOCITY BY SCANNING ACOUSTIC FORCE MICROSCOPY, Physical review. B, Condensed matter, 55(23), 1997, pp. 15852-15855
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., SCANNING ACOUSTIC FORCE MICROSCOPE INVESTIGATIONS OF SURFACE ACOUSTIC-WAVES, Surface and interface analysis, 25(7-8), 1997, pp. 569
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., HIGH-RESOLUTION VISUALIZATION OF ACOUSTIC-WAVE FIELDS WITHIN SURFACE-ACOUSTIC-WAVE DEVICES, Applied physics letters, 70(11), 1997, pp. 1372-1374
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., DIRECT VISUALIZATION OF THE OSCILLATION OF AU(111) SURFACE ATOMS, Applied physics letters, 69(3), 1996, pp. 354-356
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., SCANNING ACOUSTIC FORCE MICROSCOPE MEASUREMENTS ON GRATING-LIKE ELECTRODES, Applied physics A: Materials science & processing, 61(3), 1995, pp. 237-242
Authors:
HESJEDAL T
CHILLA E
FROHLICH HJ
Citation: T. Hesjedal et al., PROBING OF OSCILLATING SURFACES BY A SCANNING ACOUSTIC TUNNELING MICROSCOPE, Thin solid films, 264(2), 1995, pp. 226-229
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