Authors:
Monat, C
Seassal, C
Letartre, X
Viktorovitch, P
Regreny, P
Gendry, M
Rojo-Romeo, P
Hollinger, G
Jalaguier, E
Pocas, S
Aspar, B
Citation: C. Monat et al., InP 2D photonic crystal microlasers on silicon wafer: room temperature operation at 1.55 mu m, ELECTR LETT, 37(12), 2001, pp. 764-766
Authors:
Damlencourt, JF
Leclercq, JL
Gendry, M
Garrigues, M
Aberkane, N
Hollinger, G
Citation: Jf. Damlencourt et al., Paramorphic growth: A new approach in mismatched heteroepitaxy to prepare fully relaxed materials, JPN J A P 2, 38(9AB), 1999, pp. L996-L999
Authors:
Lapeyrade, M
Besland, MP
Meva'a, C
Sibai, A
Hollinger, G
Citation: M. Lapeyrade et al., Silicon nitride thin films deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition, J VAC SCI A, 17(2), 1999, pp. 433-444
Authors:
Jourba, S
Gendry, I
Regreny, P
Hollinger, G
Citation: S. Jourba et al., Highly strained InxGa1-xGaAs/InP quantum wells grown by solid source MBE for applications in the 2-2.3 mu m spectral range, J CRYST GR, 202, 1999, pp. 1101-1104
Authors:
Damlencourt, JF
Leclercq, JL
Gendry, M
Regreny, P
Hollinger, G
Citation: Jf. Damlencourt et al., High-quality fully relaxed In0.65Ga0.35As layers grown on InP using the paramorphic approach, APPL PHYS L, 75(23), 1999, pp. 3638-3640