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Results: 1-11 |
Results: 11

Authors: Rao, KS Madhuri, KV Uthanna, S Naidu, BS Hussain, OM
Citation: Ks. Rao et al., Electrical properties of MoO3 films, I J ENG M S, 8(3), 2001, pp. 177-181

Authors: Rao, GV Chandra, GH Hussain, OM Uthanna, S Naidu, BS
Citation: Gv. Rao et al., Photoconductive response of polycrystalline Cu0.5Ag0.5InSe2 thin films, J MAT S-M E, 12(9), 2001, pp. 511-514

Authors: Rao, GV Chandra, GH Hussain, OM Uthanna, S Naidu, BS
Citation: Gv. Rao et al., Characterization of Cu0.5Ag0.5InSe2 thin films, J ALLOY COM, 325(1-2), 2001, pp. 12-17

Authors: Madhuri, KV Naidu, BS Hussain, OM Eddrief, M Julien, C
Citation: Kv. Madhuri et al., Physical investigations on electron beam evaporated V2O5-MoO3 thin films, MAT SCI E B, 86(2), 2001, pp. 165-171

Authors: Chandra, GH Hussain, OM Uthanna, S Naidu, BS
Citation: Gh. Chandra et al., Characterization of p-AgGa0.25In0.75Se2/n-Zn0.35Cd0.65S polycrystalline thin film heterojunctions, MAT SCI E B, 86(1), 2001, pp. 60-63

Authors: Chandra, GH Hussain, OM Uthanna, S Naidu, BS
Citation: Gh. Chandra et al., Characteristics of Al/p-AgGa0.25In0.75Se2 polycrystalline thin film Schottky barrier diodes, PHYS SCR, 63(5), 2001, pp. 422-424

Authors: Chandra, GH Hussain, OM Uthanna, S Naidu, BS
Citation: Gh. Chandra et al., Optical absorption studies on AgGa0.25In0.75Se2 polycrystalline films, J MAT SCI L, 20(1), 2001, pp. 63-65

Authors: Rao, GV Chandra, GH Hussain, OM Uthanna, S Naidu, BS
Citation: Gv. Rao et al., Characteristics of Al/p-Cu0.5Ag0.5InSe2 polycrystalline thin film Schottkybarrier diodes, CRYST RES T, 36(6), 2001, pp. 571-576

Authors: Chandra, GH Hussain, OM Uthanna, S Naidu, BS
Citation: Gh. Chandra et al., Characterization of AgGa0.25In0.75Se2 thin films, VACUUM, 62(1), 2001, pp. 39-45

Authors: Ramana, CV Naidu, BS Hussain, OM Pinto, R
Citation: Cv. Ramana et al., Low-temperature growth of vanadium pentoxide thin films produced by pulsedlaser ablation, J PHYS D, 34(7), 2001, pp. L35-L38

Authors: Ramana, CV Hussain, OM Naidu, BS Julien, C
Citation: Cv. Ramana et al., Dielectric properties of Al vertical bar V2O5 vertical bar Al thin film sandwich structures, MAT SCI E B, 60(3), 1999, pp. 173-178
Risultati: 1-11 |