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Results:
1-23
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Results: 23
Authors:
DIFONZO S
JARK W
SOULLIE G
CEDOLA A
LAGOMARSINO S
CLOETENS P
RIEKEL C
Citation: S. Difonzo et al., SUBMICROMETER RESOLUTION PHASE-CONTRAST RADIOGRAPHY WITH THE BEAM FROM AN X-RAY WAVE-GUIDE, Journal of synchrotron radiation, 5, 1998, pp. 376-378
Authors:
CEDOLA A
LAGOMARSINO S
DIFONZO S
JARK W
RIEKEL C
DESCHAMPS P
Citation: A. Cedola et al., SUBMICROMETER BEAMS FROM A HARD X-RAY WAVE-GUIDE AT A 3RD-GENERATION SYNCHROTRON-RADIATION SOURCE, Journal of synchrotron radiation, 5, 1998, pp. 17-22
Authors:
PELKA JB
LAGOMARSINO S
CEDOLA A
DIFONZO S
JARK W
Citation: Jb. Pelka et al., STUDY OF PHOTOELECTRON EMISSION YIELD FROM LAYERED STRUCTURES IN PRESENCE OF RESONANCE-ENHANCED X-RAY PROPAGATION EFFECT, Acta Physica Polonica. A, 91(5), 1997, pp. 851-857
Authors:
MARGARITONDO G
SAVOIA A
BERNSTOFF S
BERTOLO M
COMELLI G
DEBONA F
JARK W
KISKINOVA M
PAOLUCCI G
PRINCE K
SANTANIELLO A
TROMBA G
WALKER R
ROSEI R
Citation: G. Margaritondo et al., ULTRABRIGHT SYNCHROTRON SOURCE ELETTRA - FIRST PERIOD OF OPERATION, Acta Physica Polonica. A, 91(4), 1997, pp. 631-640
Authors:
LAGOMARSINO S
CEDOLA A
CLOETENS P
DIFONZO S
JARK W
SOULLIE G
RIEKEL C
Citation: S. Lagomarsino et al., PHASE-CONTRAST HARD X-RAY MICROSCOPY WITH SUBMICRON RESOLUTION, Applied physics letters, 71(18), 1997, pp. 2557-2559
Authors:
FRIEDRICH J
DIEL I
KUNZ C
DIFONZO S
MULLER BR
JARK W
Citation: J. Friedrich et al., CHARACTERIZATION OF SPUTTERED NICKEL CARBON MULTILAYERS WITH SOFT-X-RAY REFLECTIVITY MEASUREMENTS/, Applied optics, 36(25), 1997, pp. 6329-6334
Authors:
DIEL I
FRIEDRICH J
KUNZ C
DIFONZO S
MULLER BR
JARK W
Citation: I. Diel et al., OPTICAL-CONSTANTS OF FLOAT GLASS, NICKEL, AND CARBON FROM SOFT-X-RAY REFLECTIVITY MEASUREMENTS, Applied optics, 36(25), 1997, pp. 6376-6382
Authors:
QIAN SN
JARK W
SOSTERO G
GAMBITTA A
MAZZOLINI F
SAVOIA A
Citation: Sn. Qian et al., PRECISE MEASURING METHOD FOR DETECTING THE IN-SITU DISTORTION PROFILEOF A HIGH-HEAT-LOAD MIRROR FOR SYNCHROTRON-RADIATION BY USE OF A PENTAPRISM LONG TRACE PROFILER, Applied optics, 36(16), 1997, pp. 3769-3775
Authors:
PELKA JB
LAGOMARSINO S
DIFONZO S
JARK W
DOMAGALA J
Citation: Jb. Pelka et al., OSCILLATIONS IN REFLECTIVITY OF SAMPLES WITH X-RAY WAVE-GUIDE LAYERS, Acta Physica Polonica. A, 89(3), 1996, pp. 323-328
Authors:
DIFONZO S
JARK W
LAGOMARSINO S
CEDOLA A
MULLER BR
PELKA JB
Citation: S. Difonzo et al., ELECTROMAGNETIC-FIELD RESONANCE IN THIN AMORPHOUS FILMS - A TOOL FOR NONDESTRUCTIVE LOCALIZATION OF THIN MARKER LAYERS BY USE OF A STANDARDX-RAY TUBE, Thin solid films, 287(1-2), 1996, pp. 288-292
Authors:
JARK W
DIFONZO S
LAGOMARSINO S
CEDOLA A
DIFABRIZIO E
BRAM A
RIEKEL C
Citation: W. Jark et al., PROPERTIES OF A SUBMICROMETER X-RAY-BEAM AT THE EXIT OF A WAVE-GUIDE, Journal of applied physics, 80(9), 1996, pp. 4831-4836
Authors:
LAGOMARSINO S
JARK W
DIFONZO S
CEDOLA A
MUELLER B
ENGSTROM P
RIEKEL C
Citation: S. Lagomarsino et al., SUBMICROMETER X-RAY-BEAM PRODUCTION BY A THIN-FILM WAVE-GUIDE, Journal of applied physics, 79(8), 1996, pp. 4471-4473
Authors:
QIAN S
JARK W
TAKACS PZ
RANDALL KJ
YUN WB
Citation: S. Qian et al., IN-SITU SURFACE PROFILER FOR HIGH HEAT LOAD MIRROR MEASUREMENT, Optical engineering, 34(2), 1995, pp. 396-402
Authors:
QIAN SN
JARK W
TAKACS PZ
Citation: Sn. Qian et al., THE PENTA-PRISM LTP - A LONG-TRACE-PROFILER WITH STATIONARY OPTICAL HEAD AND MOVING PENTA PRISM, Review of scientific instruments, 66(3), 1995, pp. 2562-2569
Authors:
DIFONZO S
MULLER BR
JARK W
GAUPP A
SCHAFERS F
UNDERWOOD JH
Citation: S. Difonzo et al., MULTILAYER TRANSMISSION PHASE SHIFTERS FOR THE CARBON K EDGE AND THE WATER WINDOW, Review of scientific instruments, 66(2), 1995, pp. 1513-1516
Authors:
ABRAMI A
BARNABA M
BATTISTELLO L
BIANCO A
BRENA B
CAUTERO G
CHEN QH
COCCO D
COMELLI G
CONTRINO S
DEBONA F
DIFONZO S
FAVA C
FINETTI P
FURLAN P
GALIMBERTI A
GAMBITTA A
GIURESSI D
GODNIG R
JARK W
LIZZIT S
MAZZOLINI F
MELPIGNANO P
OLIVI L
PAOLUCCI G
PUGLIESE R
QIAN SN
ROSEI R
SANDRIN G
SAVOIA A
SERGO R
SOSTERO G
TOMMASINI R
TUDOR M
VIVODA D
WEI FQ
ZANINI F
Citation: A. Abrami et al., SUPER ESCA - FIRST BEAMLINE OPERATING AT ELETTRA, Review of scientific instruments, 66(2), 1995, pp. 1618-1620
Authors:
MELPIGNANO P
DIFONZO S
BIANCO A
JARK W
Citation: P. Melpignano et al., OPTIMIZATION OF SPHERICAL GRATING MONOCHROMATORS OPERATING WITH VARIABLE INCLUDED ANGLE FOR DIFFERENT APPLICATIONS, Review of scientific instruments, 66(2), 1995, pp. 2125-2128
Authors:
WELNAK J
DONG Z
SOLAK H
WALLACE J
CERRINA F
BERTOLO M
BIANCO A
DIFONZO S
FONTANA S
JARK W
MAZZOLINI F
ROSEI R
SAVOIA A
UNDERWOOD JH
MARGARITONDO G
Citation: J. Welnak et al., SUPERMAXIMUM - A SCHWARZSCHILD-BASED, SPECTROMICROSCOPE FOR ELETTRA, Review of scientific instruments, 66(2), 1995, pp. 2273-2276
Authors:
CASALIS L
JARK W
KISKINOVA M
LONZA D
MELPIGNANO P
MORRIS D
ROSEL R
SAVOIA A
ABRAMI A
FAVA C
FURLAN P
PUGLIESE R
VIVODA D
SANDRIN G
WEI FQ
CONTARINI S
DEANGELIS L
GARIAZZO C
NATALETTI P
MORRISON GR
Citation: L. Casalis et al., ESCA MICROSCOPY BEAMLINE AT ELETTRA, Review of scientific instruments, 66(10), 1995, pp. 4870-4875
Authors:
ABRAMI A
ALFE D
ANTONINI S
BERNARDINI M
BERTOLO M
BOCCHETTA CJ
BULFONE D
CARGNELLO F
DARCLON F
DIFONZO S
FONTANA S
GALIMBERTI A
GIANNINI M
JARK W
MASSAROTTI A
MAZZOLINI F
PUGLISI M
RICHTER R
RINDI A
ROSEI R
RUBBIA C
TOMMASINI D
SAVOIA A
VIANI G
WALKER RP
WRULICH A
COLUZZA C
DELLORTO T
GOZZO F
MARGARITONDO G
DESTASIO G
PERFETTI P
GENTILI M
CIOTTI MT
MERCANTI D
FONDA L
Citation: A. Abrami et al., 1ST EXPERIMENTAL TESTS AT THE NEW SYNCHROTRON-RADIATION FACILITY ELETTRA IN TRIESTE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 349(2-3), 1994, pp. 609-613
Authors:
JARK W
MELPIGNANO P
Citation: W. Jark et P. Melpignano, OPTIMIZATION OF A SPHERICAL GRATING MONOCHROMATOR FOR SOFT-X-RAY MICROSCOPY APPLICATIONS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 349(1), 1994, pp. 263-268
Authors:
LU LJ
COCCO D
JARK W
Citation: Lj. Lu et al., SIMPLE PLANE GRATING MONOCHROMATOR FOR SYNCHROTRON-RADIATION, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 339(3), 1994, pp. 604-609
Authors:
DIFONZO S
JARK W
SCHAFERS F
PETERSEN H
GAUPP A
UNDERWOOD JH
Citation: S. Difonzo et al., PHASE-RETARDATION AND FULL-POLARIZATION ANALYSIS OF SOFT-X-RAY SYNCHROTRON-RADIATION CLOSE TO THE CARBON-K EDGE BY USE OF A MULTILAYER TRANSMISSION FILTER, Applied optics, 33(13), 1994, pp. 2624-2632
Risultati:
1-23
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